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Product
Ethernet To Parallel Digital Interfaces
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ICS's 8063 Ethernet Digital Interface provides a fully enclosed parallel interface that is suitable for benchtop or rack mount applications.
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Product
Parallel Differential Battery Tester With Integrated Chamber
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Accelerate your battery parallel test using our PDBT. Featuring an integrated chamber, it precisely conducts battery comparison test and fast measures battery's self-discharge current. Its portable, powerful design is perfect for innovative research applications.
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Product
Parallel Simulation Engine
RocketSim
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Complementing compiled-code simulators, Cadence® RocketSim™ parallel simulation engine eliminates functional verification bottlenecks by speeding up simulation using commonly available multi-core servers.
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Product
Parallel NTDS Isolation Tap Box
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IXI’S NTDS parallel isolation tap box is the ideal solution for relibility tapping NTDS parallel type A, B, C, and H interfaces. It connects easily to existing cables forming a tee connection that can be used for data monitoring and acquisition over long distances without interference with your system.
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Product
GPIB Parallel Interface
Model 4823B
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* Provides 56 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Available with DIN connector on circuit side for piggyback mounting.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
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The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Portable Parallel Analyzer
SL1000
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Perform up to four colorimetric and two probe-based measurements in parallel, and complete the entire test suite in 25% of the time. Complete more tests on site, get the results you need faster, and visit more sites in each shift.
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Product
Parallel Electrode SMD Test Fixture
16192A
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The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
Dual Parallel Strain Gauges
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Dual Parallel Strain Gauges strain gauges have two measuring grids arranged parallel to each other. Typical applications include measurements on bending beams
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
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Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Ethernet Parallel Interface
Model 8013
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* Provides 128 high-power TTL I/O lines.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* Standard board has a horizontal Ethernet connector and 150-pin Digital IO connector on the component side. * Mates to Relay Driver Boards with 64 or 128 Relay Drivers.* Mates to 115650 Connector Board with 4 flat ribbon headers.
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Product
Ethernet Parallel Interface
Model 8003
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* Provides 40 high-power TTL I/O lines.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* Standard board has vertical Ethernet and Digital IO connector on the component side. * Optional Relay Driver board adds 4, 32 or 40 Relay Drivers. • Apply regulated 5 Vdc power through the Digital IO connector.
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Product
Parallel Plate Dielectric Test Cell
LT-4203A
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The LT-4203A Parallel Plate Dielectric Test Cell is designed for measuring the AC loss characteristics and permittivity of solid laminates and panels per ASTM Standard D150‑98, and implements the guarded electrode (three terminal) measurement preferred as the referee method.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
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The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
IP Parallel IO
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IndustryPack compatible IP-Parallel-IO with counter and timer design adds up to 48 digital parallel IO lines to one IP slot of your carrier board.
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Product
I-8000 Parallel Data Acquisition Modules
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ICP DAS I-8000 Parallel Series I/O are high speed cartridge based and come in a multitude of digital and analog configurations. They are communicable via an RS-485 backplane in all of ICP DAS USA's I-8000 & I-87K series rack mount controllers. There are two types of I/O communication bus, parallel bus and serial bus. The parallel bus type I/O modules (high profile I-8K series) are high speed, used only in the PACs including XPAC, WinPAC, iPAC, ViewPAC, etc. And the serial bus type I/O modules (high profile I-87K series) are low speed, used in both PACs including XPAC, WinPAC, iPAC, ViewPAC, etc.
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Product
Serial And Parallel Port For PCIe
DTA-2142
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Serial and parallel interfaces for ASI and SD-SDI, supporting multiple electrical standards including M-LVDS and LVTTL. Clock rates up to 108MHz are supported.
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Product
Parallel Robots
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The Omron Quattro robot excels at high-speed applications in packaging, manufacturing, assembly, and material handling.
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Product
Serial to Parallel Analysis Package
B4601C
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Your system uses serial buses to communicate between ICs and transfer data to and from peripheral devices. Sifting through thousands of serial bits by looking at long vertical columns of captured 1's and 0's can be very tedious, time-consuming, and error prone. The Keysight Technologies B4601C serial to parallel analysis package is general-purpose software that allows easy viewing and analysis of serial data.
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Product
Cell Testing
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PEC offers a wide range of cell testers, starting from the 5A desktop test system (ACT0505), to our range of 50A cell testers for more standardized cycling (CT0550) and our advanced cell testers with capabilities up to 4000A (ACT0550). All systems support parallel switching for achieving higher currents.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Power Supply, 40 V, 85 A, 3400 W
N8736A
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Keysight basic DC power supplies offer essential features for a tight budget. The Keysight N8736A is a 40V, 85A, 3300W single output power supply in a small 2U package. It offers flexible AC input options, analog / resistance control of output voltage and current as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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Product
Regenerative Battery Pack Test System
17040
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Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
Serial to Parallel Controller
E84 SPC
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300mm equipment manufacturers utilize this off-the-shelf E84 communications controller to provide SEMI E84 compliant communications for their products. With its built-in Load and Unload algorithms it is the perfect E84 communications solution for process tools, stockers, load ports, FOUP buffers, smart storage shelves and simulation load ports. The E84 SPC easily integrates with equipment controllers through a standard serial communications connection.
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Product
Wide Band Filters (multi-octave)
MINI-ERF® Series
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The MINI-POLE® Extended Range Series of tunable filters was developed to address applications needing a small, surface mount package with wide tunability. This tunability is accomplished by the use of multiple internal tunable filters along with high performance PIN diode RF band select switches all contained in one housing. The tunable filters are designed to minimize size and power consumption while maintaining high RF power handling and linearity characteristics. Parallel or serial digital interface can be selected by a mode pin for ease of integration into your design.
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Product
Confocal FLIM for Macroscopic Objects
DCS-120 Macro
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*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Product
PATA SSD
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Solid State Drive that uses the legacy Parallel Advanced Technology Attachment (PATA/IDE) interface, designed to replace older mechanical hard drives in legacy systems.
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Product
Active Switching Power Supply Using Mosfet, 125 KW, P/N 5940C2
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- Active Switching Power Supply Using MOSFET, 125 KW, P/N 5940C2- Input: 480 VAC, 150 Amps, 3 PH, 60 Hz- Output: 0 to 50 VDC, 2500 Amps max- Ten modules in parallel, each module is rated for 0 to 50 VDC, 300 Amps- PLC Control provides Positive Polarity, Negative Polarity and Shuts OFF- Start / Stop capability and EPO- Output voltage and current are displayed on the voltmeter and ammeter- PLC supplied by the customer. We provide a PLC interface only- Indoor enclosure dimensions: 65″W x 50″H x 36″D or (TBD)- Estimated weight: 2000 lbs. or (TBD)
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Product
Parallel Test Systems
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Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Product
Validation Testers
M Series
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The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
