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Modular Power Supplies
CoolX1800 Series
Access incredible power via a compact supply. The modular Excelsys CoolX®1800 offers 1800 W in a 267 x 127 x 41 mm package (approximately 50% more power than the industry standard). Outputs can be parallel connected for higher currents and series connected for higher voltages (up to 348 VDC).
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Earth Ground Clamp
1630-2
The 1630-2 FC clamp measures earth ground loop resistances for multi-grounded systems using the dual-clamp jaw. This test technique eliminates the dangerous and time-consuming activity of disconnecting parallel grounds, as well as the process of finding suitable locations for auxiliary test stakes.
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Testing Multi-Radio Mobile Devices
IQxstream
With LitePoint's IQxstreamTM mobile test system you will have all the capability you need to fully test many 3G and even 4G cellular radios and standards. Moreover, the system is designed to reduce per-device test time and cost because of its unique parallelism architecture. A 100 MHz capture capability means that it can test adjacent channel leakage ratios (ACLR) in one, five-channel capture.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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Software Solutions
ZAP MULTIRUN
The ZAP MULTIRUN allows parallel or sequential execution of the same script on multiple work stations and mobile devices. Using ZAP MULTIRUN test automation teams expedite time to execution multiplied by number of devices per given test runs.
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Multi-site Module Testing System
TCIII-3200ST
TurboCATS introduces a new line of redesigned TCIII-3200ST DDR4 and DDR3 multi-site module testing system - compact, high-performance, and equiped with enhanced productivity features. The TurboCATS TCIII-3200ST module test system features an optional 8, 16 or 64 module testing, in parallel, for high throughput on your production floor.
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RZ Family of 64-Bit & 32-Bit Arm-Based High-End MPUs
RZ/A
The high-performance RZ/A Series MPUs retain the ease-of-use of Renesas microcontrollers (MCUs), while combining Renesas' proprietary technologies and the Arm® ecosystem. RZ/A devices offer up to 10 MB of on-chip SRAM, which can buffer up-to WXGA resolution graphics without the need for external SDRAM. This capability is married with the device’s ability to execute code in-place (XIP) from QSPI flash, which greatly simplifies board design. Coupled with its high-bandwidth 128-bit wide parallel data bus, the RZ/A supports faster graphics, digital audio signal processing, device control, and more.
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Battery Capacity Testers|Discharge Testers
DV Power offers a wide range of battery capacity testers to meet specific customer needs. All of them are portable, powerful and most of all universal. Any battery string, such as lead-acid, lithium-ion, nickel-cadmium based and others, with voltages in the range of 0,9 – 800 V DC can be tested in an accurate, user-friendly way.The capacity test is carried out following the battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.BLU battery testers enable setting the discharge current up to 350 A, with 0,1 A resolution. If higher currents are required, several units can be connected in parallel, or BXL additional load units can be used. Discharge parameters can be monitored in real-time during the capacity test. Overall battery voltage, current, elapsed test time and capacity will be presented during the entire test on a touch screen display.
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Programmable DC Power Supply
SPD3303C
The SPD3303C is a LED display screen programmable linear DC power supply that is both lightweight and feature-packed. It has three independent outputs: two sets of adjustable voltage and a fixed set of selectable voltages; 2.5V, 3.3V, and 5V. In addition, the ‘3303C has outputs that are short-circuit and overload protected. Total power is 220W. It has three available operation modes; independent, series and parallel modes. The SPD3300C has a high performance-to-price ratio and can be used in various types of production, education and research environments.
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Stand-Alone Test Fixture
MA 2011/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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15W to 30W - Single Output
CC-P-E Series
*Compact Footprint / Low Profile*18-36 Vdc, 36-76 Vdc Inputs*3.3, 5, 12, 15 Vdc Outputs*Isolation: 1 kVdc (Case); 1.5 kVdc (Uncased)*-40 to 85 °C Operating Temperature*Parallel Operation
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PXI Source Measure Unit
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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FLIM Upgrades for Nikon
A1 / C1 / C2
*bh FLIM Embedded in Nikon NIS-Elements Software*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Excellent Timing Stability*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Detection Wavelength Range from 360 nm to 700 nm
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5.0 MP Custom Lens Camera Module (Monochrome)
e-CAM50_CU9P031_MOD
e-CAM50_CU9P031_MOD is a 5 MP custom lens monochrome camera module based on Aptina's MT9P031 CMOS image sensor with S-mount lens holder attached to it. The MT9P031 is a 1/2.5" Optical Form factor, Electronic Rolling Shutter CMOS sensor. The e-CAM50_CU9P031_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM50_CU9P031_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Becker Transponder Test Fixture
TA-3400
This transponder test fixture is specific to the requirements for testing Becker Avionics Transponders and provides interface connectors for both the panel mount and remote systems. The panel also provides switches to implement Gillham code altitude as well as separate interfaces for an external parallel or serial encoder. The panel will interface with the RMU 5000 or standard control head. This fixture also comes with voltage and current meters along with an internal dimming source. This panel comes in the standard 19 inch rack width and measures 12 inches in depth.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Fineliner
The parallel tester Fineliner enables two-sided contact with fne structures. Withvisual detection of both substrate sides and corresponding adapter position correction≥ 300μm test points can be contacted. The rigid needle adapter with a pitch of ≥ 400μmalso allows a high contact density. This results in a large test depth on the substrate.The integrated DMC reader ensures a correct test result assignment. Multiple PCB canbe tested step by step through in the X-direction of the Fineliner, further eliminatingsubstrate tolerances in the X-direction, and enabling more cost-effective adapters andmeasurement techniques. A quick-release system with identifable replacement kitsensures safe and quick retooling.The measuring technology can be defned customer-specifcally. There are 2040 pyloninterface points per side.
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MEMS Optical Sensor Test
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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Content Uniformity >
PrepEngine
The PrepEngine was developed through collaborations with leaders in the biotech and pharmaceutical industry to speed up the sample preparation process. The result - a process that is ultra-fast with multiple drives so up to 10 samples can be prepared in parallel.
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Stand Alone Test Device
The ENGMATEC Smart Contact Cell works with goods carriers that move above and below each other. This enables the test objects to be fed in and removed in parallel, which significantly reduces handling times.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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4-Port In-System Programmer For Silicon Labs
MPQ-C2
Supports Silcon Labs C8051F series devices with C2 Programming Interface Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Power Supply, 20V, 250A, 5000W
N8754A
The Keysight N8754A is a 20V, 250A, 5000W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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Power Supply, 80 V, 42 A, 3360 W
N8738A
Keysight's basic DC power supplies offer essential features for a tight budget. The Keysight N8738A is a 80 V, 42 A, 3360 W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage.
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PMC Module Carrier
SK1-CHORD
SK1-CHORD is equipped with a PCI Express® to PCI® bridge for conversion of data from the CompactPCI® Serial backplane, to the on-board PCI® parallel bus.
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Parallel 8-channel Hipot Tester
TH9010
Changzhou Tonghui Electronic Co., Ltd.
8-channel parallel output of withstand voltage, and each channel is non-interfering ■ Output: AC: 5kV/10mA; DC: 6kV/5mA ■ Insulation resistance test voltage: 0.10kV -1.00kV
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Current Logger Sensor
NUL-202
This sensor can be used to measure the current in parallel or series branches of low voltage AC and DC circuits and also to investigate the dependence of the current flow through components on the voltage across them.
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Industrial Computer
Renice 6U VPX Computer complies with OpenVPX Vita65 specification. It adapt GPGPU architecture, on board ARM processor and compatible with industrial and rugged design on the structure. It applied in the high-performance computing center, high-performance display, parallel computing, and computing cluster application, eg Ground Radar, Airborne Radar and Shipborne Radar.
