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1 KN Eccentric Roller Grips
These eccentric roller grips are specifically designed for tensile testing flexible materials, such as rubber and soft and semi-hard plastics. Named after the non-symmetric roller design, these grips employ a simple and quick clamping mechanism. They also have a self-tightening action, which maintains clamping of the specimen during testing regardless of any thickness reduction. In addition, the upper and lower grip faces are parallel grooved to help hold these soft materials.
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Double Function Tester with Shielded HF Test Chambers
End-of-line Tester UTP 9010 RF
The UTP Series 9010 is a scalable test series available in a variety of feature-rich variants and many designs. The UTP 9010 RF function tester shown here as an example is suitable for tests with a medium number of channels and complexity. It is designed for parallel testing of two or more test items. The measuring instruments used are used alternately for several test items. Due to its compact design and construction as a modular system, this powerful tester can easily be expanded to larger numbers of channels.The integrated HF test chamber UTP 5070 developed by NOFFZ allows an independent shielded test. It can be operated manually or fully automatically by a robot .The basic version of the UTP 9010 series is an ideal system for functional and end-of-line tests and is already preconfigured for this purpose. The RF tester presented in the example is used in particular to test infotainment and eCall modules in the vehicle as well as IoT products with wireless technologies.
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Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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PCI Three-Axis High Performance Laser Board with External Sampling
N1231B
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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Multi-Parallel Bioreactors
Small-scale, multi-parallel bioreactors provide more process information for culture comparison in less time. Multiple experiments can assess different clones or cell lines, as well as the effects of pH, temperature, feeding, media, gassing rates and inoculation densities.
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Ball Pressure Test Apparatus
CX-Q03
Shenzhen Chuangxin Instruments Co., Ltd.
The Ball Pressure Apparatus is used to check the integrity of dielectric materials by exerting 20N force. The BPA10 is called out in IEC 60335, 60950, 61010, UL, CSA and European Norms. It is used to check the integrity of dielectric materials by exerting 20N force. The Ball Pressure Apparatus is made of stainless steel for long life. Since accelerated life procedures are used for this oven test, more than one apparatus may be useful for parallel testing.
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256 Channel Power Supply
IDPS750
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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Parallel 8-channel Hipot Tester
TH9010
Changzhou Tonghui Electronic Co., Ltd.
8-channel parallel output of withstand voltage, and each channel is non-interfering ■ Output: AC: 5kV/10mA; DC: 6kV/5mA ■ Insulation resistance test voltage: 0.10kV -1.00kV
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Load Cell & Microvolt Meter
A high-sensitivity 5-digit meter for use with load cells, strain gauges and microvolt input signals where high accuracy and stability are required. Load cell operation allows 4- or 6-wire hookup and display in engineering units, such as lbs, kg or psi. Built-in excitation for up to four 350-ohm load cells in parallel.
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Ethernet Parallel Interface
Model 8013
* Provides 128 high-power TTL I/O lines.* Fully VXI-11 Compliant plus Raw Socket for easy programming with Visual Basic or C, Agilent VEE and LabVIEW.* Standard board has a horizontal Ethernet connector and 150-pin Digital IO connector on the component side. * Mates to Relay Driver Boards with 64 or 128 Relay Drivers.* Mates to 115650 Connector Board with 4 flat ribbon headers.
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GPIB to Parallel Printer Interface
Model 4892B
* Adds a GPIB Interface to Printers with Centronics or IEEE-1284 parallel interfaces. See the compatible printer list. * Replaces obsolete printers and plotters with a current HPGL/PCL5 printer.* Prints and Plots from most Analyzers. * Large 256 kbyte buffer and high speed GPIB interface off-loads the instrument and reduces printing time.* No program changes required.* Rack mountable in 1 U high rack mount kit.* Includes universal VAC Power Adapter and printer cable.
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Semiconductor
Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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100 MHz 32-CH High-Speed Digital I/O Card
PCIe-7360
ADLINK's PCIe-7360 is a high-speed digital I/O board with 32-CH bi-directional parallel I/O lines. Data rate up to 400 MB/s is available through the x4 PCI Express® interface. Clock rate can support up to 100 MHz internal clock or 200 MHz external clock, ideally suiting applications of high-speed and large-scale digital data acquisition or exchange, such as digital image capture, video playback and IC testing.
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LED Driver Aging Rack
LEDRACK-100W192P
• Application range: LED driver and multi channel driver power aging. It has equipped with computer operation and monitor system. The working condition can be set by the computer, and the computer will record real time data to do statistical analysis. • The parameters of load can be set freely on the software, to monitor the real time voltage, current, and power etc • Load mode: CC, CV, CR, CP, and LED • Aging Control System includes: ON/OFF control signal output; Signal of relay switch control; K type thermocouple temperature acquisition • The channels are parallel connected under arbitrary load mode, which can allow product power expansion • The LED Driver Aging rack will design according to customer’s LED driver power and aging quantity per time • Automatic current switching function (optional) • AC power meter to measure modules, and test power input characteristics (optional) • Temperature monitoring function at product zone (optional) • PWM dimming and two sets of logic control signal function (optional)
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HIGH FREQUENCY DC BIAS
6565 SERIES
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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Three Axis Interferometer
10735A
The Keysight 10735A Three Axis Interferometer is used in multiple axis applications where linear and angular control of the stage is required. It combines in a single package the functionality of an optical bench with multiple beam benders, beam splitters, and three interferometers. The interferometers split an incoming laser beam into three beams to measure linear distance, pitch and yaw, or linear distance, roll and yaw. Three linear measurements provide the basis for calculating two angular measurements. The inherent beam parallelism ensures that there is essentially no cosine error between the three measurements and also ensures angle accuracy for pitch and yaw measurements. Other characteristics include:
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Buffered Analog Crosspoint Switches
Analog Devices buffered video crosspoint switches offer multiple configurations from 8x8 up to 32x32 channels with gain of 1 or 2 and are offered in LQFP, LFCSP, and BGA packages. These crosspoint switches can be programmed either in serial or parallel modes and are used primarily for routing high speed signals, including composite video (NTSC, PAL, SECAM) and component video (YUV, RGB) in applications such as studios, video on demand, in-flight entertainment, surveillance, and video teleconferencing.
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Standard Capacitor
1409 Series
The elements used in 1409 Standard Capacitors are selected for low dissipation factor and are stabilized by heat cycling. They are housed in cast aluminum cases, along with silica gel which provides continuous desiccation. These cases are sealed with high-temperature wax. A well is provided in the wall of the case for insertion of a dial-type thermometer. Three jack-top binding posts are provided on the top of the case, and removable banana plugs on the bottom, for convenient parallel connection without error
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High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
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Self/Fast Boot use on SKY Boards
Each of these loads occur internally to each SKYbolt board at the speed of the internal SKYbolt busses; we are not limited to the speed of the VME bus, the host VME interface or the disk. These program loads also occur in parallel so the startup time is independent of the number of SKY boards in the system.
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Digital Step Attenuators
Ranatec’s digital step attenuators covers all mobile frequency bands and gives a calibrated attenuation range of more than 90 dB in steps of 0.25 dB. All Ranatec digital attenuators are built as modules and offers both serial and parallel control logic.
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Simultaneous Multi-Surface Test Interferometer
VeriFire MST
Simplify the complex – multiple surfaces create complex fringe patterns, the Verifire™ MST uses patented wavelength-shifting technology to acquire phase data from multiple surfaces simultaneously. Report key metrics from individual surfaces of parallel windows, transmitted wavefront, as well as precise surface-to-surface information like total thickness variation (TTV), wedge and even material inhomogeneity.
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0 Hz/DC to 14 GHz, Single-Pole, Four-Throw MEMS Switch With Integrated Driver
ADGM1304
The ADGM1304 is a wideband, single-pole, four-throw (SP4T) switch, fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small, wide bandwidth, highly linear, low insertion loss switch that is operational down to 0 Hz/dc, making it an ideal switching solution for a wide range of RF applications. An integrated control chip generates the high voltage necessary to electrostatically actuate the switch via a complementary metal-oxide semiconductor (CMOS)-/low voltage transistor-transistor logic (LVTTL)-compatible parallel interface. All four switches are independently controllable. The ADGM1304 is packaged in a 24-lead, 5 mm × 4 mm × 0.95 mm lead frame chip-scale package (LFCSP).
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6U VPX double-GPU Image & Video Processing Board
VP69701
LinkedHope Intelligent Technologies Co.,Ltd.
Based on AMD Radeon™ E8860, VP69701 is a VPX double-GPU image & video processing board mainly designed for applications of embedded image & video processing and GPGPU.On VP69701, there are 4 independent display outputs routed to front and 2 GPU. Each GPU of VP69701 is equipped with 2GB GDDR5 video memory, 768/48 GFLOPS single/double precision peak processing ability and 640 shader processing units. VP69701 is highly suitable for HD output (1920x1080), 4K output (3840x2160), high-performance parallel computing and other applications and fields.
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Calipers - Dial
A precision measuring device with parallel jaws or legs, with a shape similar to a clock face.
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Load Cell Junction Box
SY-JUNCTION-IP67
The SY-JUNCTION-IP67 load cell junction box is useful to parallel connection of load cells and take just one cable out to almost any indicator, either batch controller or a PLC.
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Straightness Accessory Kit
10776A
The Keysight 10776A Straightness Accessory Kit simplifies installation and alignment of the 10774A Short Range and 10775A Long Range straightness optics. The kit includes a large retroreflector (Keysight P/N 10776-67001) and mounting accessories. The kit facilitates vertical straightness, parallelism and squareness measurements in the 5530 Laser Calibration System applications.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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High-power Programmable DC Laboratory Power Supply (5kW~180kW)
FTP9000 Series
Shenzhen FaithTech Technology Co., Ltd.
FTP9000 series DC power supplies provide wider voltage and current output range at full power, this means both low voltage/high current and high voltage/low current devices can be tested using a single power supply. The FTP9000 series offer a high power density, with 15 kW in a 3U chassis. The standalone power ranges from 5 kW to 180 kW, voltage ranges from 80 V to 2250 V, and current up to 6120 A. For ultra-high-power applications, FTP9000 series allow for master-slave parallel up to 10 identical units, maximum output 1.8 MW, with current automatically shared.
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
