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96/48-CH Opto-22 Compatible PCI Express Digital I/O Cards
PCIe-7248/7296
ADLINK"s PCIe-7248/7296 are high-density parallel digital I/O boards with 96/48 I/O channels. The header connectors are fully compatible with industry Opto-22 standard. Thus, PCIe-7248/7296 can utilize the Opto-22 external devices. The PCIe-7248/7296 devices emulate mode 0 of the industry standard 8255 programmable peripheral interface (PPI) chips. The PCIe-7248/7296 provides 4/2 PPI chips respectively. Each PPI offers three 8-bit ports: Port A, Port B and Port C. The Port C is divided into 2 nibble-wide (4-bit) ports. The PCIe-7248/7296 devices have programmable timer/counters. One 16-bit counter is available for event counting, while the other 32-bit timer is available for timed interrupt generation. The PCIe-7248/7296 devices provide multiple programmable interrupt sources from DIO channels, as well as the output of the timer.
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24 and 48 Digital Input/Output Cards
PCI-DIO Series
The PCI-DIO-48/48S, PCI-DIO-48JP/JPS, PCI-DIO-48JPL/JPLS, PCI-DIO-48H/HS and PCI-DIO-24S are 24- and 48-bit parallel digital input/output cards designed for use in PCI-Bus computers.
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Portable Circuit Breaker Tester
PI-1600
The PI-1600 Circuit Breaker Tester incorporates modular design and flexibility to provide unequaled capability in a portable package. The PI-1600 test set is two testers in one, incorporating the PI-800 and PI-AUX. The PI-800 section can be used alone, on 120 or 240 VAC supplies, generating continuous current of 400, 800, amps at 4.2 kVA, with peak output to over 10x. When configured for the PI-1600, the PI-AUX output unit is connected in series or parallel to the PI-800. The PI-AUX boosts total power to 9.8KVA, and allows testing of draw-out breakers and MCB’s to 1600 Amps. The units are housed in rugged interlocking suitcase-size enclosures. Each piece weighs no more than 125 pounds, allowing one-person hand truck mobility. Basic operation is very simple, and the proven MAC-21 control instrumentation provides optimal output control and measurement. The MAC-21 instrumentation is supplied in a separate rugged portable case, interlocks on top of the PI-800, and connects to a cable in the rear of the test set.
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Virtual Platform Simulation Acceleration
QuantumLeap
QuantumLeap is a parallel simulation performance accelerator that leverages a new synchronization algorithm to provide the fastest virtual platform software execution speed available. The execution performance of this new technology has been measured on average at 15 times faster than the nearest commercial solution using standard benchmarks.
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Bench Power Supply, Single, Adjustable, 2 Output, 0 V, 32 V, 0 A, 5 A
72-8700A
This Bench Power Supply 35V @ 5A max output has a master-slave tracking, constant voltage, constant current function. The main outputs can be connected in parallel or in series. Auto switching between voltage and current operation.
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902s Six Phase 30A
Weshine Electric Manufacturing Co., Ltd
Single-phase current output (RMS)0--30A/phase, accuracy: 0.2% ±5mASix-phase parallel output (RMS)0--180A/six-phase parallel outputPhase current allowable working value for a long time (effective value)10AMaximum output power per phase320VASix-phase parallel current maximum output power
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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High Voltage Capacitor Batteries
Lifasa - International Capacitors, SA
There are a series of elements and materials, just like in the BT equipment, for their operation in AT and that must accompany our AT capacitors for the proper functioning of these and for our installation / network, as well as the rest of equipment that compose it and that are in operation in parallel to the capacitor / s that we want to put into service for the correction of the power factor (compensation of the consumption of reactive energy).
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3U VPX GPU Image & Video Processing Board
VP39701
LinkedHope Intelligent Technologies Co.,Ltd.
Based on NVIDIA GeForce GTX 1060 embedded GPU architecture, VP39701 is a high-performance 3U VPX GPU image & video processing board designed for applications of embedded image processing and GPGPU.VP39701 has 2x DisplayPort and 1x VGA on front with the resolution up to 3840*2160. Besides, GPU of VP39701 is equipped with 6GB GDDR5 video memory, 3.59 TFLOPS single/double precision peak processing ability and 1280 CUDA cores. Therefore, VP39701 is highly suitable for HD output (1920x1080), 4K output (3840x2160), high-performance parallel computing and other applications and fields.
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3U VPX FPGA Cards
Curtiss-Wright Defense Solutions
FPGAs have revolutionized the way digital signal processing (DSP) subsystems are configured. With a large number of gates, hardware multipliers, and high-speed serial interfaces, FPGAs enable sophisticated applications, including radar, signal intelligence, and image processing, which rely on repetitive processing that can be expressed in highly parallel form.
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8 Channel 250 MHz 12-bit ADC/Digitizer
SIS3320-250
8 channel 6U VME digitizer/transient recorder with a sampling rate of up to 250 MHz (for the individual channel) and 12-bit resolution. The board has a width of one VME slot (4TE). The boards multi event and readout in parallel to acquisition functionality make the card the choice for many demanding digitizer applications.
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TestStation Multi-Site Offline
TestStation Multi-Site Offline provides true parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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Battery Capacity Tester
BLU-C Series
BLU-C is the latest solution from DV Power for conducting a comprehensive battery capacity test. This universal instrument is applicable to any battery string, such as lead-acid, Li-Ion, Ni-Cd, and others, with voltages up to 800 V DC.BLU-C tester simplifies battery testing in multiple ways. The instrument provides monitoring of discharge parameters (graphically and numerically) in real-time on a 7-inch touch screen display. The instrument also enables measurement and monitoring of cell parameters (voltage/intercell voltage/temperature), which makes it a complete stand-alone discharge test system.The capacity tester is compatible with DV-B Win software. Because of that, the user can view detailed numerical and graphical presentations of key parameters, and create reports in various formats.The capacity test is performed in a user-friendly way according to battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22 and other.The battery tester enables setting the discharge current up to 300 A, with 0,1 A resolution. If higher currents are required, BLU-C units can be connected in parallel, or BXL additional load units can be used.The user can select one of three discharge modes: Constant current, Constant power, Constant resistance. Additionally, different battery duty cycles can be simulated using user-selectable discharge profiles.Testing can be carried out without disconnecting the battery from the equipment it supplies.
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Thermally Protected Ballast Heating Test Chamber
TPB-UL935
Working room dimension: 610×610×610mm• Temperature range: RT+10℃~+100℃• Materials of inner and outside chamber: Senior stainless steel• Insulation Material: Ultra-fine glass wool insulation material• Heater: Dedicated strip heater (heating surface area of 300 × 40 mm), each group three hundred watts, a total of four groups, with the power supply in parallel.• Special wooden test sample holder• Third gear temperature measurement points (at any time monitoring and conversion)
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GPIB Parallel Interface
Model 4823B
* Provides 56 high-power TTL I/O lines that can sink 48 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Available with DIN connector on circuit side for piggyback mounting.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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96-CH High-Driving DIO Card
PCIe-7396
The PCIe-7396 is a 96-bit parallel digital input/output (DIO) card esigned for industrial applications. The plug and play feature of PCI Express Bus architecture makes it easy for users to install the PCIe-7396 on their systems quickly.
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In-System Programmer for AVR32
MPQ-AVR32
Supports Atmel AVR32 devices Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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PXI-2576, 64‐Channel, 2-Wire, Multibank PXI Multiplexer Switch Module
778572-76
64‐Channel, 2-Wire, Multibank PXI Multiplexer Switch Module —The PXI‑2576 is a multibank PXI multiplexer switch module with 16 banks of 4x1 2‑wire multiplexers. With the flexible architecture of the PXI‐2576, you can configure it in a variety of topologies that make it suitable for parallel measurement operations requiring low‐channel counts, or you can combine all multiplexer banks to form a single high‐channel‐count multiplexer featuring 64 2‑wire channels. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Spring Clip Fixture
16092A
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
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Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Pulse Modulator IM-20
*Wide Frequency Range: 10 MHz...20 GHz*High Pause Power Mitigation: ≥ 70 dB*Signal Radio Impulse < 10 ns*Parallel Data Input*Input/Output Modulator Ports
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Universal Programmers
Xeltek engineers work around the clock to maintain the largest device library in the industry, so new devices are being added on a daily basis for EPROM, Paged EPROM, Parallel and Serial EEPROM, FPGA Configuration PROM, FLASH memory (NOR), BPROM, NVRAM, SPLD, CPLD, EPLD, Firmware HUB, Microcontroller, and MCUs. The majority of SuperPro universal programmers come equipped with a ZIF socket supporting up to 144 pins for programming a wide range of DIP devices; other chip package supported includes SDIP, PLCC, JLCC, SOIC, QFP, TQFP, PQFP, VQFP, TSOP, SOP, TSOPII, PSOP, TSSOP, SON, EBGA, FBGA, VFBGA, uBGA, CSP, and SCSP.
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Solution For Test-in-Strip
InCarrier
The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.
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Wi-Fi / Bluetooth / IoT Tester
MP5000
High speed, high throughput tester for mass production, Turn key automation test software, 4 sites in parallel.
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Modular UPS
PM SERIES 10 - 2080 kVA
PM Series is a scalable, redundant Modular UPS system designed to cost effectively provide high level availability for high density data centers and critical applications. True Online Double Conversion and advanced DSP control technology. Modular Architecture can scale power and runtime as demand grows or as higher levels of availability required. Combines the modular design with the N+X parallel redundancy technology.The maximum capacity of a single cabinet is 520kVA. Cabinets can operate in parallel configuration to build a system of up to 2080kVA.





























