Cohu, Inc.

Product

High-Throughput Film Frame Handler

MCT FH-1200

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Cohu, Inc.

MCT FH-1200 - Cohu, Inc.

FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).

Product

Coaxial Test Contactor

ICON

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Cohu, Inc.

ICON - Cohu, Inc.

The ICON™ test contactor designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).The metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise). Featuring exceptional DC and RF performance and excellent thermal management.

Product

Kelvin Test Contactor

cCompact

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Cohu, Inc.

cCompact - Cohu, Inc.

cCompact™ test contactor offers a reduced site-to-site pitch concept enables high parallel test for power applications on strip test and pick and place handler platforms.Featuring compact Kelvin footprint with outstanding CRES stability by Denmark pin material. Automotive temperature range -60°C to +175°C. Integrated Socket Air-distribution.

Product

Semiconductor Test Platform

PAx

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Cohu, Inc.

PAx - Cohu, Inc.

PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.

Product

Test Contactor/Probe Head

cBoa

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Cohu, Inc.

cBoa - Cohu, Inc.

cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.

Product

High Performance Strip Handler

Rasco Jaguar

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Cohu, Inc.

Rasco Jaguar - Cohu, Inc.

Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.

Product

MEMS Microphone Test

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Cohu, Inc.

Cohu, Inc.

The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.

Product

Inspection & Metrology Platform

Neon

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Cohu, Inc.

Neon - Cohu, Inc.

Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.

Product

Highest Demanding Finishing Processes

Ismeca NY32

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Cohu, Inc.

Ismeca NY32 - Cohu, Inc.

32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features enables extended autonomous operation and productivity.

Product

Scalable Multi-Channel Active Thermal Control (ATC)

T-Core Thermal Control System

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Cohu, Inc.

T-Core Thermal Control System - Cohu, Inc.

Cohu’s proprietary T-Core thermal system’s controller provides precise, multi-site temperature management of power dissipation ICs, such as graphic chips and CPUs, optimizing test yield.The T-Core thermal control system optimizes test yield at cold, ambient, and hot temperatures and offers better than +/- 1°C accuracy with response speeds of >125°C/sec. The system’s flexibility to control air, liquid, and refrigerant based thermal heads gives semiconductor manufacturers excellent temperature control capability for high volume manufacturing.

Product

Probe Head

cViper

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Cohu, Inc.

cViper - Cohu, Inc.

cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.

Product

Pick And Place Test Handlers

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Cohu, Inc.

Cohu, Inc.

Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.

Product

MEMS Optical Sensor Test

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Cohu, Inc.

Cohu, Inc.

For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.

Product

Turret Test And Scan Handlers

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Cohu, Inc.

Cohu, Inc.

Turret platforms for semiconductor test, inspection and packaging.

Product

Test Contactor

cDragon

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Cohu, Inc.

cDragon - Cohu, Inc.

cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.