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PXI 16 Bank 5 Channel 1 Pole Multiplexer
40-616-021-16/5/1
The 40-616 16-Bank, 5-Channel, 1-Pole Multiplexer Module forms part of the System 40 PXI Programmable Switching system. The Module consists of 16 electrically isolated banks of multiplexers controlled by a PXI/ PCI interface. Each bank is a 1 to 5 multiplexer and operates with break-before-make action when a new channel is selected. Any Individual multiplexer bank can have a channel set by itself, alternatively, multiple banks can have channels selected simultaneously. The module is suitable for cascading in applications that require large multiplexer systems, it is also suitable for test systems that require the switching of a large number of signals in parallel.
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FaithTech FTL 3000 Series Bench Linear Triple Channel DC Power Supply
FTL 3000 Series
Shenzhen FaithTech Technology Co., Ltd.
FTL 3000 series multichannel programmable Bench linear DC power supply provides high resolution, high accuracy and high stability. It also provides over voltage and over heat protection. It provides series and parallel operation modes with resolution up to 1mV/1mA.
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DC Power Supply
62000H
Chroma Systems Solutions, Inc.
Chroma’s new 62000H Series of programmable DC Power Supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include a high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals, as well as the ability to create complex DC transients waveforms to test device behavior to spikes, drops, and other voltage deviations. For high power applications, parallel up to 10 units for up to 150kW.
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Microwave Power Amplifier 1/4 Watt, 10 MHz to 40 GHz
GT-1040A
The Spanawave/Giga-tronics GT-1040A Microwave Power Amplifier incorporates broadband MMIC-based architecture. These state-of-the-art amplifiers are based on solid-state parallel MMIC design with exceptionally wide bandwidth and high power. The unique circuit topology is highly reliable, with performance that excels where extremes of bandwidth and power are demanded.
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Ultrasonic Thickness Gauge
UTG-1500
The new PHASE II UTG-1500 is a hand held microprocessor controlled ultrasonic thickness gauge specifically designed for measuring the thickness of metallic and non-metallic materials such as aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave-conductor as long as it has parallel top and bottom surfaces.
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MEMS And Sensor Test Solutions
Modular design based on standard handlers, high parallelism, ambient to automotive tri-temp handling.
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USHIO Blue Violet Laser Diodes (375nm - 405nm)
The Optoelectronics Company Ltd
The USHIO HL40071MG is a single transverse mode 405nm laser diode which offers 300mW optical output power in a 5.6mm package with typical optical and electrical characteristics, (Tc=25 degrees C, cw), of 50mA threshold current, operating current of 280mA, operating voltage 6.0V, 6 degrees beam divergence parallel to the junction, 15 degrees beam divergence perpendicular to the junction, laser diode reverse voltage of 2V and operating temperature of 0 to +70 degrees C.
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PXI Resistor Module Dual 16 Bit With 16XSPDT Relays
40-290-121
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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FPGA-Based Ultra-Fast Flash Programmer
XJFlash
XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Programmable Linear DC Power Supply
MPS-S Series
Triple channel programmable DC power supply is with high resolution, high precision and high stability, over-voltage and over-heat protection are available. Series and parallel operation are also provided. The resolution is 10 mV/1 mA.
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Data Acquisition (DAQ) And Real-time Control Systems
Our data acquisition devices are capable of storing hundreds of analog and digital channels at full speed while allowing in parallel data to be sent out in real-time to any 3rd party EtherCAT master controller. We have brought the worlds of data acquisition and real-time control closer together which will save you time and money in a big way.
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HiFIX High Fidelity Tester Access Fixture
The HiFIX lineup delivers clean waveform transmission, precision docking, and multi-DUT parallel test, with high reliability.
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VITA 57.4 FMC+ HSPC Loopback Card
Samtec's VITA 57.4 FMC+ HSPC Loopback Card provides FPGA designers an easy to use loopback option for testing low-speed and high-speed multi-gigabit transceivers on any FPGA development board or FPGA carrier card. It can run system data or BER testing on all channels in parallel. This makes evaluation and development with an FPGA much easier and is an ideal substitute for 28 Gbps test equipment.
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GPGPU Cards
Curtiss-Wright Defense Solutions
For applications requiring massive parallel compute capability, such as deep learning frameworks for AI applications, our highly engineered GPGPU co-processing engines provide a field-proven hardware foundation. Curtiss-Wright GPGPU co-processing engines leverage the latest NVIDIA Tensor Cores (for machine learning) technology and are a critical component of the high-performance embedded computing (HPEC) ecosystem that delivers data center capability at the tactical edge.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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6/12/24/36V Conductance Battery Tester
MBT300
Tests 6/12/24V lead acid batteries individually or in parallel and series battery packs. Displays battery or battery pack condition as % available capacity, rated capacity (CCAs), state of charge voltage, and good or replace status. Tests 6/12/24/36V starter and charging systems including starter draw, alternator and regulator output (loaded/unloaded), and diode ripple.
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SAFETY TESTERS ( CURRENT LEAKAGE TESTERS )
ST-05
Safety Tester Model ST-05 is a test set for testing small equipment powered by 120V 60 Hz, from an approved U-ground source. Test also can be run on double-insulated tools an on appliances with two-pin parallel plugs.
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Module Testing
This product range offers 45V, 100V and 150V systems, with a 60A per channel capability. All systems support parallel switching for achieving higher currents. Each channel has an onboard CAN-bus connection for BMS interfacing and can be extended with auxiliary IO’s for single cell voltage and temperature measurements.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Serial And Parallel Port For PCIe
DTA-2142
Serial and parallel interfaces for ASI and SD-SDI, supporting multiple electrical standards including M-LVDS and LVTTL. Clock rates up to 108MHz are supported.
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CompactPCI Serial 9 Slot 4U
The CompactPCI® Serial 9-slot chassis is based on the novel standard that relies on serial point-to-point interconnections. It overcomes the bandwidth limitation of the parallel CompactPCI bus and allows for PCI-E, SATA, USB, and Ethernet links among the cards. The chassis is a light-weight unit with powerful cooling and redundant power supplies. It perfectly suits a wide range of applications from lab usage to multi-system arrangement in a rack.
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PCI-6528, 48-Channel, 24 Sink/Source Inputs, 24 Sink/Source Outputs, Channel-Channel Isolated, Digital I/O Device
778833-01
The PCI-6528 is an industrial, parallel digital I/O interface.With programmable power-up states, you can configure the initial output states in software, to ensure safe … operation when connected to industrial actuators. If a computer or application fault occurs, the PCI-6528 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions. Programmable input filters eliminate glitches/spikes and provide debouncing for digital switches/relays through a software-selectable digital filter.
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Frequency and Phase Agile 120 MHz Signal Generator.
DDS8p
The DDS8p generates cosine, sine and ACMOS/TTL output signals. The frequency is programmable in 1µHz steps from 100Hz to 120MHz. The phase is 14-bit programmable. The DDS8p is controlled by a binary parallel interface that allows frequency and phase changes as fast as 600 nanoseconds. It is accurate to 1ppm and requires 5 VDC power.
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Linear Slide
M-011
Physik Instrumente GmbH & Co. KG
M-011 ultra-high-precision magnetically-coupled stages use the force of integrated magnets to preload the bearing. This magnetic preload results in extremely uniform and smooth motion with minimum friction. Unlike conventional stages, where two bearings with limited parallelism guide the carriage (inducing runout and rotational errors) in M-011 stages, only one of the two linear bearings has a guiding function (V-groove) while the second bearing is for support only (U-groove).
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Holographic Concave Gratings - Type I
HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type I holographic concave gratings are recorded on spherical substrates, with equidistant and parallel grooves.Their geometric optical properties are the same as classically ruled gratings and are interchangeable with them.When used in a spectrograph, Type I holographic concave gratings are traditionally arranged on the Rowland circle (i.e., the circle defined by the grating center and the tangential radius of curvature of the grating).
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Test & Measurement Platform
Konrad System Manager
The Konrad System Manager is the central tool for the Konrad test and measurement platform. It combines execution, interactive supervision and documentation of the installed Konrad test modules.- Displays the live status of the module functions in parallel to running test executions- Easy debugging of the switch routes- Control the modules functions- Configure device Alias name for modules- Display alias naming for switching channels- Execute selftest functionality of the modules- Display device information and documentation of the installed modules- Simulate modules
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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AMR Angle Sensors
MultiDimension Technology Co.,Ltd.
Iis proportional to the sine or cosine functions of two times of the angle – sin(2α) and cos(2α) – of a magnetic field applied parallel to the surface of the sensor, which can be provided by a small magnet positioned above the device.
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Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
