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Product
Laser Diode Characterization System
58620
System
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Product
Materials Characterization
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The techniques within Material Characterization have some sample challenges. Our highly talented staff of Engineers have overcome these with unique solutions. From moving highly viscous samples to mixing and sampling in a small well plate.
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Product
Pulse Characterization Sensors
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Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Product
Characterization System
System 7700
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
CMP Process and Material Characterization System
CP-4
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he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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Product
Portable Cryogen-Free Cryocooler-Based Material Characterization Platform
PPMS® VersaLab™
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Quantum Design’s PPMS VersaLab is a portable, cryogen-free cryocooler-based material characterization platform. With a temperature range of 50 – 400 K, this 3 tesla platform is perfect for accomplishing many types of materials characterization in a limited space.
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Product
Antenna Characterization
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Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Product
Device Characterization
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Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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Product
Amplifier Characterization With Wideband Modulated Signal
N5245BV
Amplifier
The N5245BV provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for amplifier measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements.
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Product
Laser Diode Characterization Systems
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Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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Product
Embedded DisplayPort Electrical Performance and Characterization Toolset Software
D9040EDPV
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Characterization testing of eDP designs now supporting AUX channel automation.
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Product
Display Test & Characterization Solutions
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The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
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Product
DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
Receiver
DDR5 Receiver Conformance and Characterization Test Application.
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Product
Material Characterization Products
MeasureReady®
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Unique real-time sampling architecture for synchronous sourcing and measuring.
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Product
Bench & Characterization Boards
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Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Product
Beam Characterization
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Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Product
Image Sensor Characterization Systems
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Image Sensor QE and Spectral Responsivity Characterization
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Product
Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
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Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
Source Measure Unit
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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Product
High Speed Photodetectors
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Macom Technology Solutions Holdings Inc.
MACOM offers photodetectors from 20 – 70 GHz for ultra-clean, high-speed performance that enable precise characterization of ultrafast optical signals. These products are available in with different bandwidths and packages to provide solutions many applications.
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Product
Compact Range Reflectors
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The company advances every aspect of reflector system development—from design and fabrication to surface characterization, transportation, installation, and electromagnetic evaluation.
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Product
Nanoindenter
Hysitron TI 980
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Bruker’s Hysitron TI 980 TriboIndenter operates at the intersection of maximum performance, flexibility, reliability, usability, and speed. This industry-leading system builds upon decades of Hysitron technological innovation to deliver new levels of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization.
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Product
ADQ Development Kit for Custom Firmware in the FPGA of an ADQ-Series Digitizer
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The ADQ Development Kit is a tool for developing custom firmware in the FPGA of an ADQ-series digitizer. SP Devices’ digitizers are characterized by a combination of high speed and high resolution.The amount of data from the digitizer is thus very high. The most efficient way of processing the data is through a real-time implementation inside the FPGA on the digitizer. The ADQ Development Kit opens the FPGA for the implementation of real-time signal processing algorithms.The ADQ Development Kit is available for all digitizer models.
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Product
Real Time Spectrum Analyzers
RSA600 Series
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Visualize and characterize your device or component with the precise and accurate RSA603A and RSA607A USB Spectrum Analyzers, packed with features to aid in wireless integration, EMI, and IoT projects.
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Product
Temperature Calibration Software v5.1
MET/TEMP II
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MET/TEMP II software allows you to easily automate the calibration of a wide range of temperature sensors. It provides a comprehensive temperature calibration solution that allows you to test large quantities of sensors, calculate characterization coefficients, and print calibration reports. You can standardize comparison or fixed point calibrations and use multiple temperature sources or references in one test.
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Product
ATCA 5U 6 Slot replicated Mesh 40G - with bused IPMB
109ATCA506-3003R
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The 5U 6 slot ATCA backplane is a 6 slot replicated Mesh with bused IPMB, designed to meet 40Gbps ( 4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
Compact Imaging Modules
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The Opto compact M imaging modules are characterized by the only 40mm wide 90° angled all-aluminum housing.
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Product
Vector Tester
PVT360A
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The R&S®PVT360A is a VSG/VSA single-box vector tester optimized for FR1 base station, small cell and RFcomponent testing in production and characterization environments. Two independent signal generatorsand analyzers enable fast parallelized measurements. A frequency range of up to 8 GHz, flexible bandwidth configuration and an optional second TRX channel provide the necessary performance and enable flexible adaptation in a small form factor.
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Product
Nanomechanical Test System
Hysitron TI Premier
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Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Product
IP GAM
SFT 3316
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Hangzhou Softel Optic Co., Ltd.
SFT 3316 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by Softel. It has 1 6 multiplexing channels, 16 scrambling channels and 16 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 16 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
