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Product
Device Characterization
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Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Laser Diode Characterization Testing
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The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Product
Characterization System
System 7700
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Product
Microwave Cavity Characterization
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Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
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Product
Process & Material Characterization System
TriboLab CMP
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Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Product
Keithley Automated Characterization Suite Software
ACS
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Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
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Product
Portable Cryogen-Free Cryocooler-Based Material Characterization Platform
PPMS® VersaLab™
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Quantum Design’s PPMS VersaLab is a portable, cryogen-free cryocooler-based material characterization platform. With a temperature range of 50 – 400 K, this 3 tesla platform is perfect for accomplishing many types of materials characterization in a limited space.
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Product
Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
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Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Product
Bench & Characterization Boards
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Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Product
Beam Characterization
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Thorlabs offers a wide range of products that can be used for beam characterization. Properties such as intensity, degree of collimation, power, wavefront shape, and spectral properties can be measured.
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Product
Active Device Characterization Solution Up To 50 GHz For 5G
N5245BM
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The N5245BM provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 50 GHz for 5G applications.
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Product
Pulse Characterization Sensors
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Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Product
Antenna Characterization
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Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Product
Solar Cell I-V Characterization System
VS6821
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Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Product
Fan Characterization Module
FCM-100
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Advanced Thermal Solutions, Inc.
The FCM-100 Fan Characterization Module is a specialized unit designed to test and characterize fans of various sizes and performance outputs. Using the FCM-100 Module in conjunction with pressure measurement equipment (such as the PTM-1000) and velocity measurement equipment (such as the eATVS); it is possible to develop fan curves (P vs. Flow rate) that can be used to verify fan manufacturer data or to characterize fans of unknown performance.
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Product
Surface Analysis and Materials Characterization Services
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The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Product
DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
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DDR5 Receiver Conformance and Characterization Test Application.
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Product
Device Characterization Software with Test Automation
14565B
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The Keysight 14565B device characterization software is designed for easy evaluation of portable battery powered device (like 3G handsets, PDA, WLAN, and Bluetooth enable devices) current profiles to ensure long operating life of devices.
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Product
Image Analyzers
Morphologi Range
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Morphological imaging is fast becoming an essential technology in the laboratory toolkit for particle characterization. The Morphologi 4 is a fully automated static image analysis system which provides a complete detailed description of the morphological properties of particulate materials. The Morphologi 4-ID combines the same automated static image analysis with Raman spectroscopy in a single, integrated platform, providing component-specific morphological descriptions of chemical species within a blend.
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Product
Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
Manual Tuners
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Manual tuners are used both in the laboratory and as system components to establish or transform impedances for a number of applications. They can be used to establish optimum source or load terminations for device characterization, normalize a source or load for precision laboratory measurements and/or calibrations (noise, power, etc.), and can act as a matching transformer between a mismatched source and a mismatched load.
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Product
Capillary Rheometers
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Plastics are amazing materials with the unique ability to flow when heated to relatively low temperatures. They can be formed into a wide variety of shapes and tailored for many different applications. However, their flow properties during this process are complex and affected by many parameters. Instron® provides comprehensive and effective testing solutions in plastics applications and industries through the CEAST SmartRHEO Series. This capillary rheometer simulates the process conditions, measuring the plastic materials flow behavior that characterizes the rheology of materials.
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Product
CIELab Color Sensor
PR0128
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The CIELab Color Sensor PR0128 is a color detection system with integrated high power light source, for determining the surface color. It is characterized by the identification of the smallest color nuances and the highest long-term stability. Here, up to 63 completely different products in different colors can be independently controlled and tested without changing parameters or gain levels.
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Product
Climate Test
Series C
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With our CTS climatic test chambers, you can also simulate the stress factor humidity in your tests next to the temperature. The humidity is measured by a capacitive moisture sensor, which is characterized by high accuracy, long term stability and low maintenance.
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Product
Modulation Distortion Up To 70 GHz
S930707B
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S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Temperature Calibration Software v5.1
MET/TEMP II
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MET/TEMP II software allows you to easily automate the calibration of a wide range of temperature sensors. It provides a comprehensive temperature calibration solution that allows you to test large quantities of sensors, calculate characterization coefficients, and print calibration reports. You can standardize comparison or fixed point calibrations and use multiple temperature sources or references in one test.
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Product
In-Process Test OTDR
8000i
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The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
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Product
Thick Film Passive Element
GBR-181
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GBR-181series resistors are made in a thick film technology, or ceramic substrates (Al2O3) - 96&). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-181 series elements are used both for general, and professional applications. Other values of resistance, and tolerance (up to 0.1%) are available on request.
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Product
Telurometer
AMRU-10
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AMRU-10 is a simple meter that allows to perform measurements by the technical method, as well as the measurement of the resistance of the grounding by the bipolar method. The device is characterized by its ease of operation, high resistance to disturbances and high accuracy.
