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Temperature Calibration Software v5.1
MET/TEMP II
MET/TEMP II software allows you to easily automate the calibration of a wide range of temperature sensors. It provides a comprehensive temperature calibration solution that allows you to test large quantities of sensors, calculate characterization coefficients, and print calibration reports. You can standardize comparison or fixed point calibrations and use multiple temperature sources or references in one test.
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High-resolution Spectrometer
HR4000
Our next-generation high-resolution spectrometer is a novel combination of optics and electronics that is ideal for applications such as characterizing lasers, measuring gas absorbance, and determining atomic emission lines.
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Noise Source, 10 MHz to 18 GHz, nominal ENR 6 dB
346A
The Keysight 346A noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The very small change in reflection coefficient (<0.01) from ON to OFF is designed especially for accurate characterization of input-impedance-sensitive devices (like GaAsFETs and many UHF amplifiers).
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PNA Microwave Network Analyzer
N5221B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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X-ray Diffraction (XRD) Instruments
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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LXI Microwave Matrix, 10GHz, Single 4x4
60-750-144
The 60-750-144 is a single 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Electroacoustic Test
CRYSOUND offers comprehensive and expert electroacoustic measurement solutions for a broad spectrum of consumer electronics, including headphones, microphones, and speakers. These solutions are characterized by powerful functionality and robust stability.
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Materials Test System
ModuLab XM MTS
I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) High-speed pulse (used to activate charge carriers in electronic and dielectric materials)Staircase and smooth stepless analog ramp waveformsImpedance, admittance, permittivity / capacitance, electrical modulusC-V capacitance - voltage, Mott-SchottkyAutomatic sequencing of time domain and impedance/capacitance measurements
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-02
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR … test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Vector And Scalar Mixer / Converter Measurements
S95083B
The Keysight S95083B measurement software includes the scalar mixer / converter plus phase (SMC+Phase) measurement class. It provides fully calibrated conversion gain / loss, relative phase, and absolute group delay measurements of mixers and converters without the need for reference or calibration mixers. Eliminating the calibration mixer requires a U9391C / F / G comb generator and an external DC power supply. A vector mixer characterization (VMC) is also included for measuring group delay of frequency-converting devices. VMC can be used to characterize a user-supplied calibration mixer.
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InfiniiVision Oscilloscopes
3000T X-Series
100 MHz - 1 GHz, DSO and MSO models Speed testing with simplified operation and documentation enabled by the 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone Touch Triggering See the most signal detail with 1,000,000 wfms/s update rateQuickly modulate and characterize signals with built-in WaveGen 20 MHz ARB, 3-digit voltmeter and 8-digit frequency counter & totalizer options Decode serial busses faster with hardware-based serial analysis options Protect your investment with full upgradeability
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Nucleic Acid Analysis And Protein Characterization
Utilizing automated microfluidic capillary electrophoresis (micro-CE) technology, our instruments enable the user to simplify the process of traditional gel separations, resulting in even more accurate and reproducible data in a fraction of the time. Separate, identify and analyze genomic and protein samples in seconds and visualize your data as an electropherogram, virtual gel, or tabular report.
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Dual Blackbody Wide FOV
Dual blackbody, all reflective background IR target projector is used to characterize WFOV IR sensor systems. It features a broadband, 3 to 14 micron range, reflective IR target technology for the most accurate and stable differential targets, controlled background radiance, a 5º FOV with 36º uniform background.
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4-Channel Simultaneous Sampling Module for DAQ970A and DAQ973A
DAQM909A
The Keysight DAQM909A module enables the DAQ970A and DAQ973A Data Acquisition System to perform dynamic data acquisition for applications such as harmonic and noise distortion, power analysis, and acoustic characterization of electromechanical devices.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Dynamic Imaging Particle Analysis Technology
FlowCam® Macro
Yokogawa Fluid Imaging Technologies, Inc.
Based on proven FlowCam dynamic imaging particle analysis technology, and optimized for larger particles (50μm to 5mm), FlowCam Macro provides rapid particle characterization that goes beyond just particle size. Direct, image-based measurements of particle size and shape enable differentiation of particle types in a heterogeneous mixture.
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Enterprise Yield Management Solution
dataConductor
dataConductor is an interactive enterprise yield management solution for the semiconductor industry. With dataConductor, semiconductor manufacturers can collect data from diverse, global manufacturing systems and combine them into a single warehouse to manage yields during data characterization, yield ramp and volume production.The dataConductor platform is a comprehensive enterprise yield management system built upon our high-performance dC Warehouse. dataConductor features an optimized Oracle database, standard and custom data parsers, and a full suite of analysis capabilities that can be tailored to your particular environment.
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Nanomechanical Test System
Hysitron TS 77 Select
The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales.
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Open Loop Current Sensor
C03 30A
The C03 offers efficient and precise sensor solutions for direct, alternating and pulsed currents in industrial, commercial and communication systems. It consists of three main components: an accurate, linear Hall sensor with low temperature drift, a flux collector and a transformer. It is characterized by a very low resistance and thus lowers power loss and temperature drift - for optimal performance.
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PNA-L Microwave Network Analyzer
N5232B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to20 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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EasyEXPERT Group+ Software (for PC)
Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Membrane Conductivity Testing
Designed for membrane and separator characterization in a liquid environment. Measure resistance, conductivity, permeability, cross-over, and selectivity.
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LXI Microwave Matrix, 20GHz, Single 3x3, Terminated
60-751-133-B
The 60-751-133-B is a single 3x3 20GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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PNA Microwave Network Analyzer
N5227B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Custom Bench Test
TestEdge provides customized bench test. If your device has specialized test requirements, it may be necessary to test your device using specialized bench equipment rather than traditional ATE. In other situations, both ATE and a custom bench setup may be required to fully characterize the device and provide necessary correlation. Finally, it may be useful to create a custom bench setup to facilitate device debug.
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Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
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PNA-X Microwave Network Analyzer
N5245B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Keithley Automated Characterization Suite Software
ACS
Keithley’s Automated Characterization Suite (ACS) is a flexible, interactive software test environment designed for device characterization, parametric test, reliability test, and even simple functional tests. ACS supports a wide array of Keithley instrumentation and systems, hardware configurations, and test settings, from a few bench-top instruments for use in a QA lab to fully integrated and automated rack-based parametric testers. With ACS, users are ready and able to perform tests quickly without the need for programming knowledge.
