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High Frequency Coaxial Analytical Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm differential, single-ended probe.
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USB Data Communications Multiplexers
These USB multiplexers are ideal for the testing of multiple devices that use USB interfaces, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance and uses long lifetime electro-mechanical relays characterized for use in data communications systems.
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Remote Radio Head Test, Reference Solution
The Remote Radio Head Test, Reference Solution provides the physical interfaces together with the vector signal analysis and vector signal generation you need to carry out comprehensive functional and performance testing of your RRH). Fully characterize the uplink and downlink, RF air-interface to and from the digital "front-haul".
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Magnet Testing
m-axis
m-axis is a measurement system that can be used to characterize permanent magnets in terms of their magnetic specifications (magnetic moment and magnetization angle) with high precision. In addition to the four standard measuring ranges, the modular design allows the system to be adapted to customer-specific requirements. The measurement systems can be used for 100% in-line quality control via our m-axis I/O module.
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Modulation Distortion Up To And Beyond 125 GHz
S930713B
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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X-ray Inspection System
Cougar ECO / Cheetah ECO
Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry. These microfocus systems, which have been developed by Yxlon in Germany, are characterized by an excellent price-performance ratio. Being entry-level systems in two sizes, each of them provides best inspection results in quality control in the SMT and semiconductor industries.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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100 Watt Dynamic Measurement DC Source, 20V, 5A
66332A
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections. The Keysight 66332A Dynamic Measurement dc Source provides dynamic measurement and analysis of voltage and current waveforms. It is ideal for testing digital wireless communications products/components because it not only provides the power for testing, but also performs the peak current measurements required to characterize the pulsed current demands of these products.
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Optical Component Test
Test and characterize modern optical components, including photonic integrated circuits (PICs) and silicon photonics, with unmatched speed, precision and accuracy. Accelerate and improve your design or optimize your production with Luna’s suite of component analyzers and testers.
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PXI/PXIe MIL-STD-1553 Multiplexer, Single 16-Channel, 2-Pole
42-739-001
The modules are ideal for the testing of multiple devices that use a serial communication interface, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance. The module uses long lifetime electromechanical relays characterized for use in communications systems.
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Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Static Image Analysis System Particle Size
PSA300
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Portable Test Platform
FTB-4 Pro
The FTB-4 Pro is the latest addition to EXFO’s test orchestration portfolio which transforms business as usual into smarter, scalable network testing that significantly increases operational efficiency and provides vital insights into field operations, network performance and service delivery. The 4 slot modular FTB-4 Pro platform enables a unique combination for 100G commissioning, turn-up and troubleshooting which includes the FTBx-88200NGE 100G Multiservice tester (with iOptics transceiver validation software) and the FTB-5240S-P optical spectrum analyzer. There is no need to carry additional platforms or swap modules for unmatched transport and spectral testing on a single platform that no one in the industry can offer. The versatile FTB-4 Pro platform supports a wide range of modules for field testing, data center interconnect, submarine testing, and lab applications for maximum flexibility and ROI across all phases of the service delivery chain: development, deployment, maintenance and troubleshooting. Module combinations on the FTB-4 Pro can also include iOLM/OTDRs, market leading OLTS for fiber characterization, dispersion solutions and other transport modules all with compatibility with EXFO’s market leading fiber inspection probes.
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Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-01
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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LXI Microwave Matrix, 10GHz, Single 3x3
60-750-133
The 60-750-133 is a single 3x3 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Laser Diffraction Systems
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm diffenrential, single-ended probe.
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Bluetooth Measurement Interface
BTC-4148
The Portland Tool & Die BTC-4148 is a complete interface for measuring and characterizing Bluetooth audio devices including handsets, headsets, speakers, car kits and other devices with Bluetooth audio input or output.
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Automated Distortion Characterization and Information System
ADCS
Matrix Test Equipment Incorporated
The Automated Distortion Characterization and Information System (ADCS) is an extension of the Matrix equipment control software that automatically makes RF measurements selected from the following: Cross Modulation (XMOD), Composite Triple Beat (CTB), Composite Second Order (CSO), Carrier to Noise (C/N), Discrete Second Order, Discrete Third Order Distortion. Measurements are made, and the test results and a profile describing the test conditions are saved in a database for later retrieval or reporting.
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Particle Size Analyzers
Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar offers two different technologies to characterize particles from the nanometer to the millimeter range. The Litesizer series employs light-scattering technology to determine not only particle size, but also zeta potential, transmittance, molecular mass, and the refractive index of nano- and microparticles in liquid dispersions. The PSA series uses laser diffraction technology to measure the size of particles in both liquid dispersions and dry powders in the micro and millimeter range. Side by side they open up a wide range of possibilities for comprehensive particle characterization.
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In-Process Test OTDR
8000i
The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
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Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Validation Testers
M Series
The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD W-Series
The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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Drivetrain Tester
G5.DT
The G5.DT series is bidirectional regenerative. It was developed specifically for testing DC components of the electrical drive train or DC components of other parts of the vehicle electrical system. It is suitable for use in laboratories and on test benches. The modular and finely graded G5.DT series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies are equipped with a powerful CAN multi-protocol interface (1 kHz, 16 bit) and optionally offer test bench relevant safety functions such as PL e according to EN ISO 13849, insulation monitoring as well as automatic discharge on the load side in case of shutdown.
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LXI Microwave Matrix, 20GHz, Single 3x3 With Loop-Thru
60-751-133-A
The 60-751-133-A is a single 3x3 20GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Rebuilt Testers
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Signal Path Analyzers
HL2200 Series
HYPERLABS HL2200 Series Signal Path Analyzers™ provide high-performance test and measurement capabilities for a fraction of the cost of traditional benchtop systems. These differential, multi-channel instruments are ideal for interconnect characterization, debugging cable assemblies, coupon testing, controlled impedance analysis, and other applications requiring a fast rise time.
