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Product
Cryogenic Probe Station
FWPX
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Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.
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Product
PNA-X Microwave Network Analyzer
N5241A
Network Analyzer
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Enterprise Yield Management Solution
dataConductor
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dataConductor is an interactive enterprise yield management solution for the semiconductor industry. With dataConductor, semiconductor manufacturers can collect data from diverse, global manufacturing systems and combine them into a single warehouse to manage yields during data characterization, yield ramp and volume production.The dataConductor platform is a comprehensive enterprise yield management system built upon our high-performance dC Warehouse. dataConductor features an optimized Oracle database, standard and custom data parsers, and a full suite of analysis capabilities that can be tailored to your particular environment.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-01
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Fiber Optic Network Test
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Test and characterize fiber optic cables, assemblies and network with unmatched speed, precision and spatial resolution. Luna’s OBR reflectometers can analyze loss with a spatial resolution and sensitivity unmatched in the industry.
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Product
Hardness Testers
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The QATM hardness tester portfolio covers all standard test methods, such as Vickers, Brinell, Knoop & Rockwell, as well as a wide test load range. The entire hardness tester range is characterized by technological innovation, precise measuring instruments and maximum comfort due to automation and advanced interfaces.
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Product
Capillary Rheometers
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Plastics are amazing materials with the unique ability to flow when heated to relatively low temperatures. They can be formed into a wide variety of shapes and tailored for many different applications. However, their flow properties during this process are complex and affected by many parameters. Instron® provides comprehensive and effective testing solutions in plastics applications and industries through the CEAST SmartRHEO Series. This capillary rheometer simulates the process conditions, measuring the plastic materials flow behavior that characterizes the rheology of materials.
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Product
Photochemical Pollution Monitoring System
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Are large-scale air quality models that simulate the changes of pollutant concentrations in the atmosphere using a set of mathematical equations characterizing the chemical and physical processes in the atmosphere.
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Product
FMC Loopback Test Board
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The FMC loopback tester board enables developers and assembly factories to test and characterize the FMC carrier board interfaces. The board features full differential loopbacks on all the FMC high pin count (HPC) connector interfaces including LA, HA, HB, DP and CLK. It also provides a 125MHz transceiver LVDS reference clocks on GBTCLK signals. The FMC loopback board is based on VITA 57 standard with ruggedized conduction or air cooling.
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Product
Spectroscopic Analyzer / Test
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Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
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Product
Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Product
Precision Current-Voltage Analyzers
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The powerful characterization software and integrated SMU of Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into characteristics across a wide range of applications. The Precision Current-Voltage Analyzer Series comprises the following three analyzer families:
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Product
Image Analyzers
Morphologi Range
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Morphological imaging is fast becoming an essential technology in the laboratory toolkit for particle characterization. The Morphologi 4 is a fully automated static image analysis system which provides a complete detailed description of the morphological properties of particulate materials. The Morphologi 4-ID combines the same automated static image analysis with Raman spectroscopy in a single, integrated platform, providing component-specific morphological descriptions of chemical species within a blend.
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Product
Switches
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Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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Product
EasyEXPERT Group+ Software (for PC)
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Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Product
Precision Mechanical Calibration Kit, DC To 26.5 GHz, 3.5 Mm
85052C
Mechanical Calibration Kit
The Keysight 85052C precision mechanical calibration kit contains precision standard devices to characterize the systematic errors of Keysight network analyzers in the 3.5 mm interface. This kit also contains adapters to change the gender of the test port and a torque wrench for proper connection.
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Product
OTDR
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Wuhan Sunma Technology Co., Ltd.
OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
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Product
Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
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Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Product
Arbitrary Function Generator
HMF2525/HMF2550
Function Generator
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131H
Calibration Cable
The Keysight 85131H is a 62.2 cm (24.5 in) long1 flexible cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.25 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.5 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 3 inch radius. Stability1 of the Keysight 85131H is less than 0.12 dB and phase is 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Photonic Device Testing
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ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
In-situ Gas Analyzers
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Real-time gas analysis directly within the processInnovative measurement technology that allows the devices to be mounted directly at the measurement site: In-situ gas analyzers take measurements directly within the process under system conditions. These analyzers are primarily characterized by their minimal maintenance requirements and extremely short response times. SICK's in-situ gas analyzers are available in two different versions:The cross-duct version for representative measurement results across the entire duct diameterThe measuring probe version, optimized for single-sided gas duct installation
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Product
PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
Signal Module
PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Phase Noise Analyzers
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The phase noise analyzer portfolio from Rohde & Schwarz offers an affordable, mid-range solution with high sensitivity and fast measurements as well as high-end ultra-high-sensitivity solutions with advanced measurements modes. Ideal for phase noise analysis and VCO tests, the industry-leading solutions enable two-path phase noise analysis with real-time cross correlation and fast VCO characterization with built-in low-noise DC sources. Additionally, high-end signal and spectrum analysis can be added into a single box.
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Product
Base Station Emulator
SUTP 5018
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Designed to create a custom cellular environment to serve testing and characterization needs. The combination of high power, real-time computing and the software defined radio platform enables this instrument to create your own cells for testing in a compact size and cost-efficient way.
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Product
IP GAM
SFT 3316
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Hangzhou Softel Optic Co., Ltd.
SFT 3316 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by Softel. It has 1 6 multiplexing channels, 16 scrambling channels and 16 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 16 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
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Product
Deep-Level Transient Spectroscopy System
FT 1030
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The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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Product
Imaging Platform
TRITOM
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The patented TriTom imaging platform is based on Photoacoustic Fluorescence Tomography (PAFT) technology that provides unparalleled capabilities for whole body imaging and in vivo characterization of small animal models.
