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Product
Process & Material Characterization System
TriboLab CMP
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Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Product
NIR Spectrometer
NIRQuest Series
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The NIRQuest is a versatile NIR spectrometer for applications ranging from moisture detection and chemical analysis to high-resolution laser and optical fiber characterization. NIRQuest spectrometers cover the wavelength range from 900-2500 nm.
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Product
Instruments
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Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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Product
Metrology
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KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Product
CMP Tester
CP-6
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The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
PCI Express PLL Test Application
N1081PLCA
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Keysight N1081PLCA PCI Express PLL Test Application designed to measure transmitter PLL bandwidth and peaking based on the PCI Express 5.0 TX PLL Specifications. Use N1081PLCA PCIe PLL test software to test, debug and characterize your PCIe designs.
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Product
Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
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While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
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Product
Thick Film Passive Element
GBR-182
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GBR-182 series resistors are made in a thick film technology, on ceramic substrates (Al2O3 - 96%). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-182 series elements are used both for general, and professional applications.
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Product
Software
Electrochemistry Tests
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Materials Development Corporation
CyclicVoltammetry and Galvanostatic Charging are tests used throughout the industrial and scientific communities to study chemical reactions and behavior of electronic structures. They are extremely helpful in the monitoring of nano based dielectrics, used in super /ultra capacitors or self-assembled monolayers (SAMs). The Cyclic Voltammetry test applies a ramping voltage to a device and measures the resulting current. In acapacitor-like structure the current reveals loss in the dielectric as well as degradation over time. CyclicVoltammetry is used to characterize the performance of supercapacitors and ultracapacitors formed using various nano-technologies. It is also useful in the studies of self-assembled monolayers used for sensors.
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Product
Fork Sensors
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Leuze electronic GmbH + Co. KG
Fork sensors combine transmitter and receiver into a single device and therefore feature high operational reliability. They are characterized by simple mounting without the need for alignment as well as high sensitivity. The fork sensors are used for detecting small parts or for detecting labels and print marks, even on transparent films.
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Product
Battery Capacity Analyzer
600B
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The 600B Battery Capacity Analyzer addresses the need to test and maintain sealed lead acid (SLA) batteries used in backup power UPS, emergency lighting, fire alarms, security systems, and many other electrical systems. By quickly characterizing a battery's response to a load resistance, the meter displays the remaining battery capacity as an indicator of the battery's health.
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Product
CG-MALS
Calypso II
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Label-free, immobilization-free characterization of protein-protein and other macromolecular interactions with composition-gradient multi-angle light scattering.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Strain Gage Testing
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Response Dynamics Vibration Engineering, Inc.
Although strain measurement is often a key part of a root cause diagnosis, our analyses often also involve measurements of other parameters such as acceleration, relative displacement, pressure, temperature, flow, speed, load, dynamic stiffness, etc, to explore multiple parameters that may have a cause/effect relationship with the problem at hand. These measurements form part of a fact based hypothesis for the cause of the problem at hand. We use stain gauge testing and/or stain modeling and analysis, in conjunction with our structural dynamics expertise to characterize all the important pieces of the puzzle that come into play with dynamic strain issues (See Diagnostic Testing).
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Product
Dynamic Light Scattering (DLS)
NANOTRAC
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Dynamic Light Scattering (DLS) is an established and precise measurement technique for the characterization of particle sizes in suspensions and emulsions. Microtrac is a pioneer of particle analysis technology and has been developing optical systems based on Dynamic Light Scattering for over 30 years.
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Product
LXI Microwave Matrix, 10GHz, Single 8x4 With Loop-Thru
60-750-184-A
Matrix Switch Module
The 60-750-184-A is a single 8x4 10GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Particle Metrology System
Archimedes
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Archimedes is an innovative instrument which uses the technique of resonant mass measurement to detect and accurately size and count particles in the size range 50nm to 5um*. Archimedes can distinguish different species from their buoyant mass is particularly useful when characterizing proteinaceous aggregates from contaminating silicon oil in biopharmaceutical preparations, in distinguishing bubbles from lipid micelles and contaminants in ultrasound contrast agents or protein from fat in dairy products.
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Product
Optical Light Source
CARY-LS300B
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The CARY-LS300B optical light source provide 1310/1490/1550 nm three outputwavelengths to meet specific application requirements. It is a idea solution for the fiberoptic network characterization, out-door network construction inspection and lab application.
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Product
ThermalAir Desktop Series Temperature Forcing System
ThermalAir TA-1000A Desktop System
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The ThermalAir TA-1000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Product
Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Product
Physisorption & Chemisorption
ASAP 2020 Plus
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The ASAP 2020 Plus permits one instrument to accommodate almost any surface characterization need in your lab.
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Product
PNA-L Microwave Network Analyzer
N5232B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to20 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Test Cell System
qCf FC50/125
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qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Product
InfiniiVision Oscilloscopes
3000A X-Series
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100 MHz to 1 GHz, DSO and MSO modelsView time-correlated digital content with16 digital channels (MSO)Modulate signals within the scope with WaveGen, built-in 20 MHz function generator (optional)Quickly characterize signals with the built-in 3-digit voltmeter and 5-digit counter option Decode serial busses faster with hardware-based serial analysis options for CAN, LIN, IC, SPI, RS232 and more Protect your investment with full upgradability
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Product
Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Product
Device Characterization Software with Test Automation
14565B
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The Keysight 14565B device characterization software is designed for easy evaluation of portable battery powered device (like 3G handsets, PDA, WLAN, and Bluetooth enable devices) current profiles to ensure long operating life of devices.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131H
Calibration Cable
The Keysight 85131H is a 62.2 cm (24.5 in) long1 flexible cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.25 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.5 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 3 inch radius. Stability1 of the Keysight 85131H is less than 0.12 dB and phase is 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Transformers/Baluns
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Macom Technology Solutions Holdings Inc.
At MACOM we offer multiple industry standard transformers used in wireless, aerospace and defense and communications applications. Available in a variety of surface mount, flat pack, and connectorized packages, our transformers and baluns are available in balanced and unbalanced versions and are characterized as 50 and 75 ohm impedance devices. Working closely with system design engineers to meet custom specifications, our proven technological expertise and innovative high quality, low cost manufacturing capabilities makes MACOM the partner of choice for some of the world’s leading infrastructure companies.
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Product
AXIe M8000 Series of BER Testers
Bit Error Rate Tester (BERT)
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
