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Compound Semi | MEMS | HDD Manufacturing
KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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ARINC 429 Receiver
9429 RX
In addition to its wide supply voltage range from 18 V – 36 V the 9429RX module is characterized by its electrical isolation between the cRIO rack and the ARINC interface.
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Power Dividers/Combiners
Macom Technology Solutions Holdings Inc.
MACOM’s power combiners and dividers are used in aerospace and defense, wireless, and wireline communications applications. These devices can also be used for broadband CATV applications. They are available in a variety of connectorized and surface mount packages. Available in subsets operating between the 400 kHz to 26 GHz frequency range, our dividers and combiners are characterized as both 50 and 75 ohm devices
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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Flash Diffusivity Analyzers
DLF 2800
The Discovery Laser Flash DLF 2800 is an advanced freestanding instrument for the measurement of thermal diffusivity and specific heat capacity of materials from room temperature to 2800°C. The distinctive design incorporates a proprietary laser, laser optics, detector, and furnace technologies, and along with the unique six-position sample carousel, ensures unprecedented measurement accuracy and sample throughput. With the ability to operate in a variety of atmospheric conditions, including inert gas or under vacuum, the DLF 2800 can characterize a wide variety of materials, including polymers, ceramics, carbons, graphite, composites, glasses, metals, and alloys.
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Portable Digital Tesla Meter
HT20
This instrument is convenient for operator to measure magneticinduction of DC magnetic field accurately. It is characterized by its wide range, clear display of LCD, and indefectible structure of sensor.A piece of 9V dry battery, which acts as its power supply, can servefor 4 hours continuously. Meanwhile, regulated power supply (enclosed) is available to 220VAC.
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Hydrogen Analyzer
H‑500
Determination of hydrogen using the heat extraction method is a special requirement for the characterization of steel, steel alloys, copper and other metals. ELTRA’s H-500 is designed for the rapid and accurate determination of hydrogen in these materials. The H-500 analyzer uses the heat extraction technique and is equipped with a resistance furnace with quartz tube. The temperature can be set up to 1000 °C in steps of 1 °C. The usual working range of the H-500 is about 900° to 1000° C.
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STDF Test Data Analysis Tool
DataView
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Displacement and Encoders
INCREMENTAL digital Transducers are mainly designed for displacement measurement in machine tools and other industrial applications. The sensors are characterized by high precision and are absolutely dust and waterproof. The used materials permit applications in heavy industrial environments.DISPLACEMENT Transducers are suitable for measurements of small distances up to 50mm. They are characterized by high accuracy and repeatability, reliability and fast response. Digital ENCODERS operate on optical or magnetical principal and are offered with incremental or absolute coded outputs. They are suitable for precision industrial applications.
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FMC Loopback Test Board
The FMC loopback tester board enables developers and assembly factories to test and characterize the FMC carrier board interfaces. The board features full differential loopbacks on all the FMC high pin count (HPC) connector interfaces including LA, HA, HB, DP and CLK. It also provides a 125MHz transceiver LVDS reference clocks on GBTCLK signals. The FMC loopback board is based on VITA 57 standard with ruggedized conduction or air cooling.
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Fine Pitch Probes
Fine pitch probes are spring contact probes with pitches between 0.10 / 4mil and 1.00mm / 40mil.In this pitch, direct soldering and the use of mounting receptacles is usually no longer possible. Therefore, almost all fine pitch probes are designed as double-sided spring-loaded contact probes. Fine pitch probes are installed in corresponding test sockets, which enable exact contacting of the test points. Feinmetall fine pitch probes are suitable for common components such as BGA, LGA, QFP, QFN or WLCSP. Precision and 100% quality control characterize these probes.In smaller pitches of 60 – 300µm, carrier needles (beams) are also used.
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IR/Visible Ranging Projectors
SBIR offers various ranging test bench systems that can be configured for non-infinity focus testing. Each system can be specifically designed for various tasks including characterizing the performance of IR and visible sensors and performing multi-sensor boresighting (IR to Visible to Laser).
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Differential Scanning Calorimetry
Nano DSC
The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Probe Card
VC43™/VC43EAF™
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Microspectrophotometer
MSP Series
Angstrom Sun Technologies, Inc.
Microspectrophotometer (MSP) is an advanced optical system. The key difference with typical low cost reflectometer is in its capability to characterize optical properties of thin films over a micron region area. With unique design by Angstrom's professionals, user can enjoy digital imaging capability in Microspectrophotometers (MSP series) by live video, powerful digital editing, measurement tools for reflection, transmission, absorption spectra. Data acquisition only takes milliseconds.
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Mux-scrambling Modulator
SFT3394T
Hangzhou Softel Optic Co., Ltd.
SFT3394T is a high performance and cost-effective DVB-T modulator designed by SOFTEL. It has 16 DVB-S/S2 FTA tuner input, 8 groups multiplexing and 8 groups modulating, and supports maximum 512 IP input through GE1 and GE2 port and 8 IP (MPTS) output through GE1 port and 8 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. To meet customers’ various requirements, this device is also equipped with 2 ASI input ports. NDS3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation broadcasting system.
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Test Services
D-Coax offers RF/Microwave test services for your researchprojects, as well as, production quantities tests. We have available resources and expertise in the high frequency interconnects testing that will benefit your research and products. We will work with you to make your requested tests the most accurate and reliable and we'll complete them in a timely fashion. The following parameters can be characterized or tested to specifications with our test services: Time Domain: Impedance, Impedance profile, rise time, propagation delay, skew and more. Frequency Domain: S21 - Insertion loss, S11- Return loss, S12 - Reverse Insertion loss (port 2 insertion loss), S22 - Reverse Return loss (port 2 return loss) and more.
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Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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ENA Vector Network Analyzer
E5072A
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Parameter & Device Analyzers, Curve Tracer
Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Series provides a wide selection of IV analyzers suitable to your specific measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Pulser / Sampler Core
Furaxa has researched, developed, and characterized a novel monolithic arrayable pulse and sample aperture generation technology. Recent results include demonstration of sub-10ps pulse/aperture generation at repetition rates up to 3 Billion Pulses/Samples Per Second (BPPS) with jitter that is estimated at sub-10fs. Further, simulations in a number of InP DHBT processes exhibit sub-3ps 20BPPS performance. The IP is process-independent, and has been achieved in CMOS SOI, InP HBT, SiGe and GaAs so far. Please contact us regarding your specific foundry and technical requirements: The company currently licenses the sampler/pulser technology for use by application and market, and is interested in discussing how the technology can enable our partners' applications. A short list of characterized Pulser/Sampler Cores is given below.
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Nanomechanical Test System
Hysitron TI Premier
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Scatterometer with Thin Film Measurement Capabilities
OptiPrime-X Series
The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Network Analyzer Software
Network analyzer software tools enable you to investigate, characterize, and troubleshoot your designs in a variety of measurement applications. Software applications are available for PNA-X, PNA-L, PNA and ENA series network analyzers.
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Frequency Multipliers
The Kuhne electronic Frequency Multipliers can be characterized by a high band width, a very good suppression of fundamental and harmonic waves, a small current consumption and a very compact housing.
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High-Performance Multifunction Calibrator
5730A
The new 50 MHz wideband option for the 5730A High-Performance Multifunction Calibrator provides expanded wideband capabilities to self-maintaining laboratories by providing a method to calibrate the 50 MHz input of the 5790B AC Meaasurement Standard. This is accomplished by characterizing the 5730A's 50 MHz output using a precision thermal voltage converter (TVC), thus reducing uncertainties to calibrate the 5790B.
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Materials Test Systems
An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Cryostats
attoCRYO
Fundamental research in physics, as well as specimen characterization in materials science often require the use of (ultra) low temperatures. Many phenomena also involve the application of high magnetic fields, usually generated by superconducting magnets. attocube provides a broad portfolio of versatile cryostats for sensitive measurements at variable temperatures and extreme conditions.
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Functional Test
Products and systems used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
