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Product
Modular Test Systems
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Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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Product
Basic Contact Probe F72217B180G100
F72217B180G100
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The Basic Contact Probe F72217B180G100 is a precision-engineered component designed for reliability and accuracy in various applications. This probe is part of the F722 series, characterized by its threaded design which allows for seamless integration into systems requiring highly dependable electrical connectivity. Capable of operating in temperature ranges from -45°C to +100°C, it is especially suitable for harsh environments, ensuring consistent performance under diverse conditions.
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Product
Process & Material Characterization System
TriboLab CMP
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Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Product
LED solar simulators
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We offer innovative A + A + A + LED solar simulators for the integration of the production process and for the stand-alone operation in the laboratory or goods receipt. Our LED solar simulators are characterized by maximum repeatability, a long pulse duration and very low maintenance.
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Product
Programmable Digital Attenuator
LDA-602EH
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The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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Product
Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Mainframe
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Vevo LAB Suite
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Vevo LAB offers basic and advanced tools for visualizing, quantifying and characterizing disease progression.
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Product
Nand Flash Tester
NplusT
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NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Product
Thermal Warpage Metrology Tool
AXP 2.0
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The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal profile.
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Product
Test Cells
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Our test cells accurately characterize the dielectric properties of liquids and solid material.
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Product
5G NR Automation Test Tool
IQfact5G
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IQfact5G ensures quality device characterization and facilitates easy customization of test flow, thus significantly reducing engineering effort.
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Product
Semiconductor Package Wind Tunnel
WT-100
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Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Product
Compound Semi | MEMS | HDD Manufacturing
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KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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Product
PathWave BenchVue Electronic Load App
BV0012B
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Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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Product
Basic Contact Probes (100 Mil) F10006B250G300
1011395
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The Basic Contact Probes (100 mil) F10006B250G300, with order code 1011395, are designed for excellence in reliability and precision in various applications. These sophisticated probes are characterized by their ability to operate efficiently within a temperature range of -45°C to +80°C, making them ideal for environments requiring robust performance. Engineered with a contact resistance of just 20 mOhm and a continuous current capacity of 5A, these probes ensure secure and low-resistance connections for effective signal transfer.
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Product
Automatic Calibration Module
ACM4509
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ACM4509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full four-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Product
Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Product
Fine Pitch Probes (300µm - 500µm) FP300D2929B015G035L066
1051670
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The Fine Pitch Probes (300µm - 500µm) FP300D2929B015G035L066 are designed for precision applications requiring high reliability and performance. This double plunger probe is part of the FP-D family, characterized by a pitch of 0.40 mm (16 mil). It is engineered to deliver a typical contact resistance of just 100 mOhm, ensuring low resistance and high signal integrity during electrical testing. Notably, the design features a reliable preload of 6.00 cN and a spring force of 35.00 cN, providing optimal contact pressure for effective operation.
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Product
LXI Microwave Matrix, 10GHz, Dual 3x3
60-750-233
Matrix Switch Module
The 60-750-233 is a dual 3x3 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Manual Tuners
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Manual tuners are used both in the laboratory and as system components to establish or transform impedances for a number of applications. They can be used to establish optimum source or load terminations for device characterization, normalize a source or load for precision laboratory measurements and/or calibrations (noise, power, etc.), and can act as a matching transformer between a mismatched source and a mismatched load.
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Product
Switch Probe F88617B400G900SM
1004223
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The F88617B400G900SM Switch Probe is engineered with precision and reliability, making it an excellent choice for various applications requiring normally open (NO) functionality. This probe features a robust design characterized by a family model of F886-NO, allowing it to operate efficiently in temperature ranges from -45°C to +100°C. With a comprehensive understanding of electrical and mechanical specifications, users can expect a device that not only meets but exceeds performance expectations.
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Product
LXI Microwave Matrix, 20GHz, Single 4x4
60-751-144
Matrix Switch Module
The 60-751-144 is a single 4x4 20GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-02
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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Product
Solid-State Battery X-Ray & CT Test Cell
STM1
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Solid-state battery test cell designed for monochromatic X-ray and CT imaging, featuring an X-ray-transparent structure for non-destructive electrochemical and structural characterization.
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Product
Oil-In-Water Analyzer
RTG100
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique which is a direct measurement on individual acoustic echoes that are characterized using advanced signal processing.
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Product
FA Leakage Switch Mainframe
B2200A
Mainframe
The B2200A reduces the cost of test by enabling characterization tests to be automated, without compromising the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.
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Product
Particle Tracking Analyzer
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Is a widely used technique to characterize nanoparticles in liquids. It combines laser light scattering and video microscopy to visualize and track the Brownian motion of individual particles. By analyzing their movement, the particle size (hydrodynamic diameter) and concentration can be determined using the Stokes-Einstein equation.
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Product
Signal Generator Frequency Extenders
FES
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These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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Product
Coaxial Probe F83205S0007L650IK25
1029303
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The Kelvin Probes (F832) are designed specifically for high-performance applications requiring precise measurements in challenging environments. This particular model, the F83205S0007L650IK25, boasts a robust temperature tolerance that spans from -45°C to +200°C, making it suitable for a diverse range of industrial applications. The coaxial design, characterized by a pitch of 5.5 mm, ensures reliable connectivity and signal integrity even at higher frequencies, with an operational frequency of up to 1.2 GHz.
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Product
Basic Contact Probes (100 Mil) F77206B200G300
1001624
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The Basic Contact Probes (100 mil) F77206B200G300, with order code 1001624, are designed for precision and reliability in critical applications. These probes feature a robust design characterized by a pitch of 2.54 mm (100 mil) and a temperature range of -45°C to +80°C, making them suitable for diverse operating environments. They boast a continuous current capacity of 5.00 A, ensuring strong electrical performance with a typical contact resistance of just 25.00 mOhm, which is vital for maintaining signal integrity in high-performance measurements.
