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Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
784777-02
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Hardness Testers
The QATM hardness tester portfolio covers all standard test methods, such as Vickers, Brinell, Knoop & Rockwell, as well as a wide test load range. The entire hardness tester range is characterized by technological innovation, precise measuring instruments and maximum comfort due to automation and advanced interfaces.
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Optical Clock-Recovery Modules / O-CR
Optical clock-recovery modules are required when a clock signal is not present to trigger the oscilloscope or when it is better to use the embedded clock present in the data stream, such as for 100G Lambda optical signals.Clock-recovery modules are essential for transmitter signal characterization.
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Surface Plasmon Resonance Analysis
Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Optically Isolated Measurement System
IsoVu
IsoVu offers complete galvanic isolation and is the industry’s first measurement solution capable of accurately resolving high bandwidth, low voltage differential signals in the presence of large common mode voltages. The stand out feature of IsoVu™ is its best in class common mode rejection across the entire bandwidth. Accurate differential measurements rely on a measurement system’s bandwidth, rise time, common mode voltage, common mode rejection capability, and the ability to connect to smaller test points to characterize devices that are shrinking in size and increasing in performance. Despite these requirements, advancements in test and measurement for power testing, EMI testing, ESD testing, and remote measurement capability have been minimal at best and have not kept pace with changing requirements. While differential voltage probes have had modest performance gains in regard to bandwidth, these probes have failed to make any substantial improvements in regard to common mode rejection, and connectivity. IsoVu is a leap forward in technology and is the only solution with the required combination of high bandwidth, high common mode voltage, and high common mode rejection to enable these differential measurements.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Thick Film Passive Element
GBR-181
GBR-181series resistors are made in a thick film technology, or ceramic substrates (Al2O3) - 96&). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-181 series elements are used both for general, and professional applications. Other values of resistance, and tolerance (up to 0.1%) are available on request.
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Total Flux Measurement Systems
LED’s and Luminaires must be characterized and tested for brightness and color, for production quality control and also for R&D. The Gamma Scientific Total Flux Measurement System combines our accurate Radoma Spectrometer and an integrating sphere for total flux (total power) and color measurements of LED, micro LED and Luminaires. Measurement parameters include spectrum, lumens, total power, peak and dominant wavelength, CRI, CCT, FWHM and other optical properties.
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Laser Diode Characterization Testing
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Variable Angle Spectroscopic Ellipsometer
VUV-VASE
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
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Linea Imaging Modules
The Opto linea imaging modules are characterized by the slim, straight, all-aluminum housing.
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Reverberation Chambers
Over the past several decades, RCs have been enjoying growing popularity as a promising facility for the characterization of wireless devices and for EMC testing. The RC (Reverberation Chamber) measurement method exhibits much competitive superiority over the AC (Anechoic Chamber) method and TEM Cell method, such as low cost, enhanced test repeatability, a more realistic test environment, and easily achieved high-field environment. The application of the RC for performing EMC testing was first proposed by H. A. Mendes in 1968. In the recent IEC 61000-4-21 standard, the importance of EMC testing using RCs as an alternative measurement technique has been recognized.
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PXIe-5650, 1.3 GHz RF Signal Generator
781215-01
The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope
780319-03
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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CMP Process and Material Characterization System
CP-4
he new Bruker CP-4 CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost effective characterization of wafer polishing processes. Reproduces full-scale wafer polishing-process conditions. Provides unmatched measurement repeatability and detail. Performs tests on small coupons rather than whole wafers for substantial cost savings.
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7U 14 slot ATCA backplane
109ATCA714-1003R
The 7U 14 slot ATCA backplane is a dual start with radial IPMI, designed to meet 40Gbps (4 x 10G ports) data rates. Elma's ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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GPC/SEC Data Systems for Enhanced Control and Performance
Agilent GPC/SEC data systems enable powerful control, data acquisition, calculations, and result reporting. For accurate molecular weight analysis and complete polymer and protein characterization, GPC/SEC software provides the functionality required for conventional and advanced GPC/SEC in a simple, powerful, fully integrated package.GPC/SEC software for OpenLAB CDS adds application-specific calibration, data processing, and reporting to your OpenLAB CDS. Cirrus GPC Multi Detector software, an add-on to OpenLAB CDS ChemStation, allows you to process conventional GPC data using a column calibration. Bio-SEC software is a dedicated standalone package for characterisation of proteins and other biomolecules.
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The Leading Measurement System for the Analysis of Porous Materials
ELWIS
ELWIS (Evaluation of Light Weight Impedance System) offers a full and rapid characterization of porous materials based on the analysis of a single sample. The ELWIS system consists of the ELWIS-A and ELWIS-S components which can be used independently from each other although both applications are needed for a complete material simulation.ELWIS-A measures acoustic parameters that are needed to evaluate the acoustic performance of sound insulation and sound-absorbing multi-layer materials. An additional impedance tube for absorption measurements at higher frequencies is available for ELWIS-A.ELWIS-S measures structural parameters that are needed to simulate the dynamic and acoustic behavior of sound packages in the medium to low frequency range (including the "Poisson Ratio" for foam materials).ELWIS is very easy to operate: Thanks to its user-friendly software, the system can also be used to obtain reliable results by users with only limited experience in the characterization of porous materials.
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PXIe-4143, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit
782431-01
PXIe, 4-Channel, ±24 V, 150 mA Precision PXI Source Measure Unit - The PXIe-4143 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4143 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4143 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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Time Domain Reflectometers
HL1100 Series
HYPERLABS HL1100 Series TDR instruments provide high-performance test and measurement capabilities for use in the field or in the lab. These instruments are used for applications such as fault detection in cables and interconnects, impedance characterization, time of flight analysis, water level measurement, and more.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Rheometers
The MCR rheometer series from the market leader offers you one thing first and foremost: an open range of possibilities. Whatever your rheological requirements are and will be in the future – based on its modular setup, your MCR rheometer is efficiently and comfortably adapted and extended to meet your needs, from routine quality control to high-end R&D applications. An investment in an MCR rheometer is always a safe investment in longstanding technology: The air-bearing-supported EC motor, for example, was developed by Anton Paar and has been used in all MCR models for over 25 years to ensure accuracy across a vast viscosity range. It makes it possible to measure liquids with a viscosity even lower than water and also characterize stiff materials like polymer composites or steel by DMA – and everything in-between.
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Environmental Monitoring
Is the processes and activities that are done to characterize and describe the state of the environment.
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Field Comm Analyzer
S5800H
S5800H Series Field Comm Analyzer is an 8.4 inch large touch screen instrument which is designed specifically for wireless communications field engineers and technicians. S5800H series provide all necessary measurement functions and performance to accurately characterize the signal environment in addition to clearing, detecting, identifying and locating signal interferenc.
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Rheometer longitudinal
DT-600
Characterizes visco-elastic longitudinal properties of Newtonian and non-Newtonian liquids of any composition.
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Thermal Warpage and Strain Measurement Tool
PS200S
The TherMoir PS200S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement forsamples up to 150 mm x 200 mm. With time-temperature profiling capability, the TherMoir PS200S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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ATI Performance Oscilloscopes
DPO70000SX
DPO70000SX ATI Performance Oscilloscopes deliver the industry’s most accurate capture of high-speed signal behavior to verify, validate and characterize your next generation designs. Capture up to 70 GHz signals with the lowest noise and highest fidelity, ensuring the most accurate measurements of your signal’s true characteristics.
