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Product
Modular Test Systems
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Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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Product
PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
Digital Pattern
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Product
Fluxgate 150A Current Sensor
LF03
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Our LF03 current sensor works with the dynamic Fluxgate measurement technology. It is characterized by its simple, practical design and prevents high temperature drifts. Fluxgate technology uses the phenomenon of magnetic saturation to modulate the measured magnetic field and convert it into an electric field.
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Product
In-Process Test OTDR
8000i
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The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
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Product
Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Mainframe
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Static and dynamic analysis
MEMS
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Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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Product
Vector And Scalar Mixer / Converter Measurements
S95083B
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The Keysight S95083B measurement software includes the scalar mixer / converter plus phase (SMC+Phase) measurement class. It provides fully calibrated conversion gain / loss, relative phase, and absolute group delay measurements of mixers and converters without the need for reference or calibration mixers. Eliminating the calibration mixer requires a U9391C / F / G comb generator and an external DC power supply. A vector mixer characterization (VMC) is also included for measuring group delay of frequency-converting devices. VMC can be used to characterize a user-supplied calibration mixer.
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Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
Test Cells
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Our test cells accurately characterize the dielectric properties of liquids and solid material.
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Product
Frequency-Resolved Optical Gating Pulse Analyzer
IQFROG
Analyzer
The IQFROG measures pulse intensity and phase in both spectral and temporal domains, yielding a complete pulse characterization. With its long delay arm and high resolution spectrometer, it measures chirped pulses up to 50 ps wide, or up to 10 ps wide if the pulse is transform limited. The IQFROG is available in 1.0 and 1.5 micron wavelengths.
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Product
LXI Microwave Matrix, 10GHz, Dual 3x3, Terminated With Loop-Thru
60-750-233-C
Matrix Switch Module
The 60-750-233-C is a dual 3x3 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
Source Measure Unit
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
Impedance Analyzers
HTF-1100.
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A laboratory furnace used specifically for the electrical characterization of materials and also for heat treatment between ambient temperature and 1100 °C.
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Product
Nanomechanical Test Instruments
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Product
LXI Microwave Matrix, 20GHz, Single 4x4 With Loop-Thru
60-751-144-A
Matrix Switch Module
The 60-751-144-A is a single 4x4 20GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Benchtop Research System
XENON X-1100
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The XENON X-1100 is the only low-cost benchtop Pulsed Light system that enables researchers to more easily characterize new processes using XENON’s proven technology.
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Product
InfiniiVision Oscilloscopes
3000T X-Series
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100 MHz - 1 GHz, DSO and MSO models Speed testing with simplified operation and documentation enabled by the 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone Touch Triggering See the most signal detail with 1,000,000 wfms/s update rateQuickly modulate and characterize signals with built-in WaveGen 20 MHz ARB, 3-digit voltmeter and 8-digit frequency counter & totalizer options Decode serial busses faster with hardware-based serial analysis options Protect your investment with full upgradeability
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-01
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
SAM Premium Line
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PVA TePla Analytical Systems GmbH
The SAM Premium Line combines acoustic microscopy and optical microscopy. It enables the scanner to be combined with both an inversion as well as a reflected-light microscope. The technology used in the SAM Premium Line is based on a core platform that employs the latest production and research technology. The individual systems are characterized by high throughput, high flexibility and a wide scanning range. They can be expanded to suit customer requirements and specified for the most diverse applications.
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Product
Infiniium UXR-Series Oscilloscope: 33 GHz, 4 Channels
UXR0334A
Oscilloscope
The UXR0334A is the 33 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope, that offers 10-bit high-definition ADC, 20 femtoseconds (typical) of intrinsic jitter for exceptional jitter characterization.
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
PXI Microwave Switch Modules
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Pickering's PXI Microwave Switch Modules vary from simple multiplexer and switch configurations to integrated matrices and large multiplexers. Most products are characterized for 50 operation however certain 75 versions are supplied either as standard or custom products. Remote versions occupy a single PXI slot with the microwave switches mounted separately from the host chassis, connection to the module is via a supplied control cable.
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Product
LXI Microwave Matrix, 20GHz, Single 4x4
60-751-144
Matrix Switch Module
The 60-751-144 is a single 4x4 20GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Test Data Investment Services
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PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development
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Product
WavePulser 40iX High-speed Interconnect Analyzer
WavePulser 40iX Series
Analyzer
WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox provides unmatched characterization insight of high-speed interconnects.
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Product
STDF Test Data Analysis Tool
DataView
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DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Product
PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
Thermal Warpage Metrology Tool
AXP 2.0
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The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal profile.
