Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Material Analysis Instrument
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Thermogravimetric Analysis measures the amount and rate of change in the weight of a material as a function of temperature or time in a controlled atmosphere.
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Probing & Analysis Adapters
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No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Product
Universal Analysis Tool
CANalyzer
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CANalyzer is the universal analysis tool for ECU networks and distributed systems. CANalyzer makes it easy to observe, analyze, and supplement data traffic in CAN, LIN, MOST, or FlexRay systems. With powerful functions and user-programmability, all needs are covered from simple network analysis to advanced troubleshooting of complex problems.
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Smart Analysis for PHP
PHPSA
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PHPSA is a development tool aimed at bringing complex analysis for PHP applications and libraries.*Static analysis*Code metrics*Branch prediction*Sandbox (AST) Compiler
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Analysis Software
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Analysis software that can streamline how you collect, analyse and report your bat call data.
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Mercury Porosimetry Analysis
AutoPore V
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The AutoPore V Series Mercury Porosimeters can determine a broader pore size distribution more quickly and accurately than other methods. This instrument also features enhanced safety features and offers new data reduction and reporting characteristics of your material.
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Wafer Testing
Trio Vertical
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SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
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Datalogger for IAQ Analysis
HD37AB1347
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Datalogger for indoor air quality analysis (IAQ). Measurement of airspeed, temperature, relative humidity, atmospheric pressure, CO² and CO.
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Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
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Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Analysis Software
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We offer comprehensive software solutions for analyzing sound and vibration as well as communication and audio quality. Thanks to a modular structure, users can tailor specific solutions to their individual requirements.
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Natural Gas Analysis
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Recently, natural gas has been recognized as a clean resournce for energy, in addition to being a raw material for chemical products. Recently a cutting-edge drilling technology has increased the use of shale gas. As the production area diversifies, the need for gas composition analysis has increased. Shimadzu addresses analytical requests with a wide system GC lineup. For analysis of liquified gas, such as LPG, a dedicated injector with a vaporizer is available. Both manual injection and online injection are available. The operation software can automatically calculate needed values, such as indexes, calorific values, etc.
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Seismic Analysis and Monitoring
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Seismic analysis and monitoring have been designed on the base of the contemporary seismic studies. We can offer you a wide range of tools for geophysical surveys, seismic tomography, automated monitoring of bearing structures (structural health monitoring), seismic monitoring of oil piping systems.
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Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Non-contact Inline P/N Checker Module For Solar Wafer
PN-100BI
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*Principle: Photovoltaic effect with the laser diode*Suitable for production line and tranceportation system*Connect to host PC by LAN to send measurement command and data
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Distribution Network Analysis
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Distribution system analysis and optimization tools used for network planning, simulation, and prediction of system response using schematic or geospatial views.
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Metallurgy Analysis
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The metallurgical group is well equipped and staffed (9 full-time metallurgists and technicians) to evaluate materials ranging from cast iron to superalloys to composites. They are experienced in classical metallographic techniques, as well as the latest preparation methods.
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Particulate & Source Analysis System
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Encompass the identification of microscopic particles.
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Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Power System Analysis Software
DSATools
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DSATools™ is a suite of leading-edge power system analysis tools that provides the capabilities for a complete assessment of system security, including all forms of stability. DSATools™ offers a complete toolset for power system planning and operational studies. In addition to rich modeling capabilities and advanced computational methods, the software is packed with useful study tools that enable significant productivity improvements.
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Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Noise Analysis Software
noiseLAB
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noiseLAB is a professional software recording and analysis package for making Type 1 Precision measurements to international standards. Precision Recorder: noiseLAB makes high quality recordings of up to 8 channels of sound. Precision Analysis of: Sound Level (Fast, Slow, Impulse, Taktmak. Custom Time Constant, Leq). Statistical Values (L1, L5, L10, L50, L90, L95, L99). Octave Spectra (1/1, 1/3, 1/6, 1/12, and 1/24th octave).....
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Solution for Flight-Data Recording and Analysis
dataMARS-RCS
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AMPOL's reliable and field-proven product, the dataMARS RCS, is a complete, state-of-the-art, flight qualified solution for recording, monitoring and analysis of flight data. With a powerful 1GHz CPU and a rugged design, the RCS is well equipped to handle harsh environments and tough requirements. The modular design can be tailored to specific project requirements providing a complete solution including real-time monitoring, recording and post analysis of multiple concurrent data sources, all of which are time-tagged for synchronized replay. The shock-absorbing tray-mount allows the use of hard-drives with low-cost but high-volume storage.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Standard Modal Analysis
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EDM Modal Standard Modal Analysis provides the user with a complete arsenal of tools, from FRF data selection and parameter identification to results validation and mode shape animation.
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Solution for Flight-Data Recording and Analysis
dataMARS104
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AMPOL's reliable and field-proven product, the dataMARS104, is a complete, state-of-the-art, flight qualified solution for recording, monitoring and analyzing flight data. Once the unit is installed on the aircraft, its solid-state recording media can be easily removed and taken directly into the lab for analysis and report generation. Its included unique and powerful post-analysis software has the ability to decode flight data on-the-fly, even while recording is in progress providing an accurate, up-to-date, realtime picture of the data as it happens.
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Correlation Analysis
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EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Air Quality Analysis
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Ambient Gas Monitoring: We offer a variety of analyzers for the ambient monitoring of the criteria pollutant gases, including CO, NOX, SO2, and others such as CH4 and CO2. Source Gas Monitoring (Emissions Monitoring): Experience reliable measurement in your process for emissions compliance every time.Ambient Particulate Monitoring: Experience our monitoring technology and gain the power to do more than just inform.Emissions Calibrators: For continuous monitoring of mercury in exhaust stacks, waste incinerators, and cement kilns, or multi-gas models to control the calibration of gas concentrations.
