Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Handheld Water Quality Analysis Tool
PoolPro™ PS6FCᴱ & PS9TKB
The fastest, most accurate, reliable, easy-to-use handheld water quality analysis tool for any pool or spa. POOLPRO™ does the job of up to nine tests in one easy to use instrument:*Monitor disinfectant residuals*Determine water balance corrections*Calibrate equipment*Ensure proper TDS levels in saltwater chlorine generator
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Correlation Analysis
EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Inline Wafer Testing
IL-800
Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Wafer Thickness Measuring System
WT-425
Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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High Performance Isotope analysis of LC Separated Compounds
Iso CHROM® LC
Elementar Analysensysteme GmbH
Unlike the existing LC-inlet solution via chemical oxidation, the iso CHROM LC works with high-temperature combustion. It quantitatively converts organic carbon to CO2.In addition, the easy-to-use iso CHROM LC shows outstanding precision, accuracy, and linearity without significant peak broadening that can diminish the chromatographic performance. In continuous operation, virtually all peaks in a chromatogram can be analyzed for the stable isotope ratios of carbon.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Data Acquisition & Analysis
Avionics Interface Technologies
We provide fully integrated avionics data bus and high speed network analyzer and data acquisition systems. Combining our extensive product catalog of Avionics interface modules, and our easy to use Analyzer software applications, with our Engineering Expertise, we are able to satisfy a wide range of avionics network data capture and analysis requirements with our COTS products or with customized solutions.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Data Logger Configuration Tool With Integrated Data Analysis.
DiaLog
DiaLog is an advanced Rebel Data Logger configuration tool with all the features you require to setup the Rebel family of data loggers. Acquire recorded data for analysis or export through the modern interface with built-in support for industry-standard files, integrated graphical data analysis and included batch processing for handling very large amounts of data files.
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Semi-Automatic Contactless Wafer Detector
NCS-200SA
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Cable Pulling Analysis
CABLE
CABLE quickly solves complex three-dimensional cable pulling tension and sidewall pressure calculations, allowing you to make rapid and accurate design decisions.Don't leave installation to chance.
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Ultrasonic Imaging with Molecular Analysis
MOLECULUS
MoleculUS is a dual-modality ultrasound and photoacoustic data acquisition unit that allows the simultaneous collection of ultrasound and photoacoustic channels sharing the same probe elements. The analog signal path of MoleculUS is split into PA and US paths. PA and US modes operate sequentially in time with support for US preview mode and continuous on-fly multiplexing between modes.
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Single or Multi-Track Stereo Image Analysis
StereoScope Pack
The best tools to check the stereo image of your audio projects: the Blue Cat's StereoScope Pro plugin offers you high precision and advanced audio to MIDI CC capabilities for single track analysis, and Blue Cat's StereoScope Multi has unique multiple tracks monitoring features.
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Imaging & Analysis
Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Advanced Data Collection, Display and Analysis Software for WIndows & Mac
PASCO Capstone
PASCO is pushing the limits of technology, so you can push your students to their potential. Working closely with educators, we continuously develop Capstone™, making improvements and enhancing the teaching features. Capstone is designed to handle large data sets, high-speed sampling, and customized preferences to fit the needs of your lab. A straightforward user interface is approachable for beginners, yet Capstone offers all the capabilities needed for even the most advanced users. Our generous site license allows students to install PASCO Capstone on their own computers so they may perform data analysis off campus.
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Gas Analysis
HPR-20 TMS
The Hiden HPR-20 TMS Transient MS is configured for fast event gas analysis of gases and vapours at pressures near atmosphere. Ideal for fast gas switching experiments the MS features the Hiden QIC quartz-lined 0.9 m sampling interface.
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Surface Analysis
InSight-450 3DAFM
Based on the production-proven InSight® 3DAFM platform for 300mm, the InSight-450 3DAFM is ideally suited for a broad range of roughness, depth and CD applications.
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Venable Stability Analysis Software
In 1983, Venable launched the renowned K-Factor Technique, still in use by many instrument manufacturers today. Venable has elevated the original software with its innovative Stability Analysis program. Go straight from measurement to design using Stability Analysis as its dynamic functionality eliminates lengthy manual value calculations and guesswork. Compensation amplifier synthesis capability, or coefficients for digital power supplies, enables user to achieve exact feedback loop bandwidth and phase margin desired on the first try.
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Vibration Analysis
The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Software for Test, Analysis and Simulation applications
AIM Software Solutions
AIM offers PBA.pro Software for Test, Analysis and Simulation applications. PBA.pro is compatible with Windows and LINUX Operating Systems and supports most of the AIM interface hardware modules. The flexible, scalable and open PBA.pro concept supports a wide spectrum of customer applications.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Spectrum Analysis Up To And Beyond 125 GHz
S93094B
The S93094B has all of the capability of the S93090xA spectrum analyzer application with an upper frequency limit determined solely by the broadband or banded millimeter-wave frequency extenders used in the system.
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DisplayPort v1.3 Protocol Analysis Probe
FS4500
The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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Gas Analysis
QIC BioStream
A gas analysis system for continuous analysis of gases and vapours from multiple fermentation reactors with multi off gas and multi reactor dissolved gas species analysis capability. A high-performance Proteus multi-stream valve supplied with 20, 40 or 80 inlet streams is included with programmable sequence control software for analysis of multiple reactors. Streams can be allocated for either dissolved species analysis or off gas analysis.
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Data Collection and Analysis System
3002
The Model 3002 SER System is a state of the art data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER) data in conformance with PRC-002-1 and PRC-018-1.
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Neutron Activation Analysis
Neutron Activation Analysis (NAA) is one of the most sensitive analytical techniques used for multi-element analysis available today. The NAA procedure is capable of providing both quantitative and qualitative results for individual elements, with sensitivities that can be superior to those possible by any other analytical technique. Elemental Analysis Incorporated (EAI), as an innovator in the development and application of radio-nuclear chemistry analytical techniques, now offers its clients the ability to analyze some 75 individual elements (including certain organic elements) by NAA at trace and ultra-trace concentrations. Moreover, by developing scientific liaisons with selected nuclear reactor sites in North America, EAI is able to offer customers the expertise and capabilities of the premier scientists and research facilities available today. Combined with EAI’s tradition of excellence in customer service and technical assistance, EAI is uniquely positioned to assist clients with timely, cost-effective, and reliable trace element analysis for almost every conceivable field of industry or scientific research.
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Automotive Serial Triggering and Analysis (CAN, LIN) for DSOX1000 Series Oscilloscopes
DSOX1AUTO
The automotive serial triggering and analysis (CAN, LIN) option for InfiniiVision 1000 X-Series oscilloscopes allows you to trigger on either standard or extended CAN message IDs, including the message ID of a remote transfer request frame. It supports triggering on a data frame and allows you to specify message IDs, data and data length for filtering messages of interest. Triggering on active error frames also is supported. In addition, it supports triggering on LIN frame IDs and data, and it includes color-coded parity and check sums errors. You can easily isolate serial packets to find error sources due to hardware or software related problems.
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Automated Routine Analysis of Waters by Purge & Trap Concentration
AQUATek LVA
The AQUATek LVA is a full automation solution for routine analysis of waters by purge and trap concentration. It utilizes a fixed volume loop that is filled with liquid sample, internal and/or surrogate standards are added, and then the sample is transferred to the Lumin or Stratum PTC. Upon completion of the purge step by the concentrator, the AQUATek LVA then initiates a clean up cycle where the sample loop and concentrator sparger are cleaned with 90o C water via the two-stage water heater.
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Bug Finder Analysis
Polyspace
Polyspace Bug Finder checks compliance with coding rule standards such as MISRA C, MISRA C++, JSF++, and custom naming conventions. It generates reports consisting of bugs found, code-rule violations, and code quality metrics, including cyclomatic complexity. Polyspace Bug Finder can be used with the Eclipse IDE and integrated into build systems.





























