Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Vibration Analysis
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The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
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Product
Simulation And Analysis Software
fcXplorer Analyzer
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Avionic Interface Fiber Channel Simulation and Analysis Test Software, fcXplorer, is an easy-to-use graphical user interface for Fiber Channel Simulyzer modules. fcXplorer is designed for troubleshooting, optimization, planning and configuration of fiber channel data. The low and high level protocol analysis offers acquisition, filtering, time stamping and interpretation of Fiber Channel data traffic and generates statistics.
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Product
04 With Soldering Eyelets | 4 Wafers | 12 Positions
04-4xx4-00/30-xx
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Very robust, multi wafer selector with 30° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Thermal Analysis Instruments
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Typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature.
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Measurement, Data Analysis, Visualization, Automation
Imc STUDIO
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With imc STUDIO, you are ready to start your measurement in a few minutes. A clearly organized channel configuration list, extensive sorting and filtering functions, numerous assistants, built-in sensor management and support of TEDS are just some of the useful functions for achieving quick, intuitive system configuration.
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Product
ESPI Analysis Application
TP601010
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First released by Intel in June 2013, the Enhanced Serial Peripheral Interface (“eSPI”) is designed as a replacement for the Low Pin Count (“LPC”) bus. eSPI supports communication between Embedded Controller (EC), Baseboard Management Controller (BMC), Super-I/O (SIO) and Port-80 debug cards. eSPI was available in the Sky Lake chipset (2015) and is available in the Kaby Lake [current] chipset. Cannonlake will support eSPI and is slated for release the second half of 2017. Icelake is scheduled for release in 2019 and it will mark the first chipset when eSPI becomes mandatory.
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Product
Impedance Analysis For E5061B-3L5 LF-RF Network Analyzer
E5007A
Network Analyzer
The E5007A provides the impedance analysis (ZA) firmware for the E5061B LF-RF network analyzer. This option enables the analyzer to measure impedance parameters of electronic components such as capacitors, inductors, and resonators. The combination of NA and ZA capabilities further enhances the analyzer’s versatility as a general R&D tool. Basic ZA functionalities including fixture compensation and equivalent circuit analysis are supported by the firmware. The DC biased impedance measurement is possible with the built-in DC bias source provided by the E5061B-3L3/3L4/3L51.
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Text Analysis
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Text analytics is the process of transforming unstructured text documents into usable, structured data. Text analysis works by breaking apart sentences and phrases into their components, and then evaluating each part’s role and meaning using complex software rules and machine learning algorithms. Data analysts and other professionals use text mining tools to derive useful information and context-rich insights from large volumes of raw text, such as social media comments, online reviews, and news articles. In this way, text analytics software forms the backbone of business intelligence programs, including voice of customer/customer experience management, social listening and media monitoring, and voice of employee/workforce analytics.
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Product
Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Product
Spectroscopy, Elemental & Isotope Analysis
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Research, production and analytical laboratories worldwide rely on us for rapid, efficient qualitative and quantitative analysis. Our innovative instruments and user-friendly software serve a range of industrial, educational, environmental and health markets. We offer a comprehensive portfolio for the quantification and identification of trace elemental species at ppm to sub-ppt levels in addition to isotopes. We also provide a wide range of lab-based and handheld instruments employing analytical techniques including XRF, FTIR, NIR, Raman spectroscopy, IRMS, ICP-MS and more.
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Spectrum Analysis For E5081A Up To 20 GHz
S960904B
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The Keysight S960904 spectrum analyzer (SA) software application adds high-performance spectrum analysis to the E5081A ENA-X up to 20 GHz. With fast-stepped FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The application enables simultaneous spectrum measurements using test and reference receivers. The multichannel SA pairs with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application uses source-power and receiver-response calibration and fixture de-embedding, providing highly accurate in-fixture and on-wafer spectrum measurements.
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Sound and Vibration Real-Time Analysis System
DS-3200 series
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The DS-3000 series Data Station is a PC-based FFT Analyzer with high functions and high performance. This new FFT Analyzer has two times or more of real-time analysis capability compared to the existing model the DS-2000 series, having the high-speed calculation performance, reliability, and user-friendliness based on our accumulated experience.
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Product
In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
DDR5 Protocol Debug And Analysis Solution
U4970A
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The DDR5 solution bundle provides a systemized hardware, probing, and software solution for DDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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X-ray Fluorescence, XRF Analysis Services
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Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Product
Software Composition Analysis
SCA
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*Test Immediately in Your Development EnvironmentLaunch scans right from the command line for fast feedback in the pipeline and IDE. See and fix code errors earlier in the Software Development Life Cycle.*Reduce Fix Time From Hours to MinutesAuto-remediation capabilities prescribe intelligent fixes, generate auto-pull requests, and minimize disruption for higher accuracy and faster fix rates. *Automate Open-Source Policy and GovernanceEasily manage your open-source usage with continuous monitoring, extensive analytics, and flexible policies.
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Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Trace Moisture Analysis System
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Analyzing moisture, and how much of it, is critical to the performance of petroleum products, as well as infrastructure and product integrity. For example, moisture in petrochemical feedstock can cause pipelines and valves to freeze, as well as poison some catalysts. One popular method used to analyze for moisture is Karl Fischer Titration (KFT). KFT has a wide dynamic range but has difficulty in measuring relatively low amounts of moisture. In addition, there are the well-known problems of side reactions and known interferences.
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Satellite Carrier Reconnaissance and Analysis System
SCL-SACRAS
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Shoghi’s Satellite Carrier Reconnaissance and Analysis System (SCL-SACRAS) is capable of detecting Point-to-Point satellite links, which work for international Voice networks, GSM Abis backhaul links, IP links and VSAT networks of major VSAT manufacturers including iDirect, Hughes, Gilat, Eastar Romantis, Comtech; including the various types of proprietary protocols and services running on them.SCL-SACRAS can be utilized for the carrying out the detailed reconnaissance of satellite carrier frequencies running on various target satellites, for identification of target carriers for regular monitoring which are of the customer’s interest. Military or intelligence agency customers can utilize this system to identify the target links on respective satellites for continuous monitoring, using the Shoghi VSAT Monitoring System.
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System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Analysis In Real Time
Live Analyzer
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Vibration Research Corporation
With Live Analyzer, you don’t have to wait until post-process to begin data analysis. View data in real-time and then pause the live stream to select, analyze, and export a section of the time waveform. Access the ObserVIEW graphing packages, employ averaging, analyze tachometer channels, and more.
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Benchmark, Competitive and Failure Analysis
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Helping you determine the root cause of product failures and evaluate products against industry competition and standards.We provide third-party verification and support for claims related to performance versus competition, root product failure cause, and benchmark industry performance. As an independent laboratory with over 60 years of product testing experience, our expertise helps you evaluate products for a variety of performance related characteristics. Additionally, we can provide expert witness legal testimony for insurance claims, CPSC filings, and civil/criminal court cases through our testing results and data.
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Harmonic Analysis Software
HI_WAVE
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HI_WAVE simulates resonance and harmonic distortion in industrial, commercial, and utility power systems.
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Stack Usage Analysis
StackAnalyzer
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AbsInt Angewandte Informatik GmbH
StackAnalyzer automatically determines the worst-case stack usage of the tasks in your application. The analysis results are shown as annotations in the call graph and control flow graph
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Complete Power Analysis System
PK3564-PRO
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PK3564-PRO complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, and 1-year deluxe warranty.
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Measuring & Analysis Equipment
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Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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Product
04 With Pins For PCB | 3 Wafers | 12 Positions
04-3xx4-20/70-xx
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Very robust, multi wafer selector with 30° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
Time Domain Analysis
S96010B
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The S96010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on the E5080B.
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Incident-based Abnormal Software Behavior Analysis Services
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If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
