Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Thermal Analysis
Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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Failure Analysis Services
Introducing our Failure Analysis services partner, close neighbour and collaborator NanoScope Services. Working together with NanoScope we offer the following portfolio of advanced FA services.
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Electric Shock Protection Analysis
60364-4-41 StandardBS 7671 StandardEN 50122 StandardTN-C, TN-S, TN-C-S, TT & IT Earthing TypesElectric shock requirementsLoop impedance and current calculationTouch voltage calculation and evaluationCalculation considers resistance to ground / earthGround Fault Current Interrupter (GFCI) or Residual Current Circuit Breaker (RCCB) or Residual Current Detector (RCD) protectionReports in Crystal Reports and MS Excel
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Winmeter Battery Analysis Software
Explorer Technology Group (ETG)
The Winmeter Battery Analysis Software enables the user download and integrate data from the DMA-35n-BATT, DSG-30 or DLV-30 products and produce text and graphical battery analysis reports. With these reports, the user can quickly identify batteries that are likely to require preventative maintenance.
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Veracode Analysis Center
Innovating through software holds many promises, but it can also create some major operational headaches. Without a holistic approach to application security, teams often lose valuable time onboarding, learning, and managing multiple AppSec tools that don't “play well” together. Various testing methods, metrics, and dashboards provide incomplete views of activity, and security teams often struggle to maintain control and understand overall risk.
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Pharmaceutical Analysis Contract Services
Specialist pharmaceutical analysis contract services to support development programs (R&D), regulatory submissions, GMP manufacturing and post-marketing requirements Pharmaceutical analysis contract services can play an important role in your the development process and GMP manufacturing. Concerns about drug safety, costly development programs, complex manufacturing, market demands for evidence-based data and increased regulatory requirements are all issues that can be addressed through a better understanding of your drug substance, drug product or manufacturing process which, in turn, can only be achieved through experienced analytical studies and robust analytical data.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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MPI PA Wafer Probers
MPI Photonics Automation is the industry-leading provider of turnkey wafer test and measurement solutions. We offer a complete line of high-performance wafer probers designed to address the diverse and complex needs of the Photonics, Optoelectronic, Semiconductor, and Laser industries.
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Wafer Chip Inspection System
7940
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Wafer Test
Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Dynamic Particle Image Analysis System
iSpect DIA-10
Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Stress Analysis Strain Gages
Bondable foil strain gages (strain gauges) available in thousands of possible pattern designs and combinations of grid alloys, backing materials, resistances, and options.
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Sample Analysis Services
Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Beverage Analysis
Analyze multiple quality control parameters of your beverages in parallel, within 3 to 5 minutes only. See all parameters on a bright, easily customized 10.4’’ touchscreen display. Anton Paar’s modular beverage analysis solutions are quickly adapted to your needs in a Plug and Play fashion. In any case, the sample filling and measurement process is completely transparent and traceable.
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SSA-J Precision Clock Jitter Analysis Software
E5001A
To meet the demanding needs of today's advanced digital communication systems, Keysight offers Precision Clock Jitter Analysis software (E5001A SSA-J) for more precise and accurate characterization and evaluation of clock-signal jitter.
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Air Gap Monitoring & Analysis
Solutions for air gap monitoring in order to plan maintenance prior to reduced operating efficiency or damage from magnetically induced heating or rubbing between the rotor and stator.
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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Big Data Analysis Solution
It is a solution that monitors failures that may occur throughout the communication network and the quality of customer service in real time, collects and analyzes the results, and provides them.
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*Structural Analysis
Guangzhou Amittari Instruments Co.Ltd
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Serial to Parallel Analysis Package
B4601C
Your system uses serial buses to communicate between ICs and transfer data to and from peripheral devices. Sifting through thousands of serial bits by looking at long vertical columns of captured 1's and 0's can be very tedious, time-consuming, and error prone. The Keysight Technologies B4601C serial to parallel analysis package is general-purpose software that allows easy viewing and analysis of serial data.
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Automated Analysis Software
RevospECT Pro
RevospECT Pro is the industry’s first commercially available high-powered, adaptable and scalable automated analysis system. It provides end users the power and control to perform comprehensive automated analysis of eddy current data. RevospECT has a proven track record in the field and meets rigorous industry standards for flaw analysis from bobbin, rotating and array inspection techniques. Once configured for an inspection, RevospECT Pro will process and analyze data at an extremely fast rate utilizing its robust distributed processing power, often outpacing data acquisition rates and generating results that can be verified immediately by the reviewing data analyst. More importantly than system speed is the consistency of the results that are delivered using computer-aided analysis.
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Spectrum Analysis, Up To 90 GHz
S930909B
The S930909B spectrum analysis adds high-performance microwave spectrum analysis up to 90 GHz to the N5290A/91A broadband network analyzers and other various banded millimeter-wave network analyzer configurations
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Wafer Defect observing instrument
HS-WDI
Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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Wafer and Cells PL System
HS-PL
Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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Power Analysis Software
PAS
PAS is SATEC's comprehensive analysis and engineering software designed to program and monitor all SATEC devices. It includes a variety of additional tools to assist in system setup, such as the communication debugging module.
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Tool for the Automated Analysis of Measured Data
TRACE-CHECK
Day-to-day testing of newly developed features produces large amounts of data that are never analyzed or used. Sporadic errors often remain undetected and problems relating to complex real-time behaviour are generally hard to identify. To resolve such issues, TraceTronic has designed the tool TRACE-CHECK. This software has been successfully applied in test automation environments,
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Analysis Application for E84
GCI's industry leading E84 diagnostic software is a powerful, Windows-based graphical analysis application that can upload and analyze data from GCI's E84 Handheld Tester, E84 DLD, and RJ-11 Optical Transceiver products. The E84 Analysis Application can also display the signals of a live material handoff in real-time when connected to GCI's E84 DLD or RJ-11 Optical Transceiver.
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Ultrasonic Wafer Scanner
AutoWafer
Installed in more wafer applications than all other automatic ultrasonic testing tools combined, AutoWafer provides a complete, production-ready wafer scanner for wafers from 100mm to 200mm, including multiple sizes in a single batch.
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Impurity Analysis In Bulk Gas
High-purity gas is necessary in industries such as chemical, medical, and foods. Precisely controlled GC enables identification and quantitation of a trace amount of impurities in bulk gas. If the gas resources in a factory consist of multiple lines, a sample line selector SLS-2020 can be utilized to switch sample lines automatically, allowing a single GC to analyze all samples.
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Spectrophotometers, Laboratory And Analysis Systems
Instruments, accessories and calibration standards for in-situ and ex-situ optical transmission, reflection, absorption, and photoluminescence measurements
