Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Acoustics Analysis
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The sounds a product makes directly impact on user experiences. Sounds create strong emotions — positively or negatively — that reinforce brand identity. The difficulty of predicting acoustic results means that a single engineering mistake can prove costly to the final product, making Ansys Acoustics Analysis a powerful solution to ensure optimal acoustics and a successful end product.
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Product
Wafer Prober
Prexa MS
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The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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Product
3/4D Image Visualization and Analysis Software
Imaris
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Our latest release, Imaris 8.4, introduces a new and innovative approach to tracing neuron structures in 3D images. Torch™, a patent-pending tool which intuitively highlights structures in close proximity to the cursor while darkening the rest of the image, enables users to efficiently and accurately trace individual neurons within dense and thick samples. Improved depth visibility makes tracing in thick samples easier than ever before, allowing for the selection of a dynamic region of interest for tracing. All of this possible with terabyte-sized datasets.
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Network Analysis
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Professional electrical measurement and power quality analysis equipment and software used to monitor, record, and evaluate power grids, electrical systems, and telecommunication networks.
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Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Data Reporting and Analysis Software
TRACS
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TRACS (Trending-Reporting-Analysis-Capture-Software) is a graphical reporting software tool, which runs over a network and captures data from connected machines for analysis and reporting from a remote computer. Developed in partnership with AutoCoding Systems, TRACS displays live and historical batch data for all production runs and is designed to work with LOMA’s Metal Detectors, Checkweighing, X-ray Inspection and Combination Systems.
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DFT Testability Analysis Software
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Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Product
Trace Viewer (Software Application For Trace Analysis)
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TraceViewer application provides you with a full range of options when analyzing traces (information on the condition of a fiber at any given point of its length, received from the optical time-domain reflectometer) - receiving, viewing, editing and labeling.
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Equipment Failure Diagnosis System and Safety Management System
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A system for diagnosing failures of rotating machinery such as turbines, motors, pumps, fans, and compressors, which are major facilities in nuclear power, hydropower, thermal power plants, petrochemical plants, shipbuilding, and aviation, through displacement sensors.
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Solmetric Certified Shade Analysis Training
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The premier shade analysis training certificate from the solar industry’s expert in shade
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Product
Spectrum Analysis, Up To 70 GHz
S930907B
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The S930907B spectrum analysis (SA) adds high-performance microwave spectrum analysis to the N522xB/N524xB PNA family up to 70 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Product
Vibration Analysis Software For Squeak & Rattle Testing
MB BSR Suite
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MB BSR SUITE is the complete solution for all measurement tasks in the field of NVH, Squeak & Rattle and Sound Quality testing. Comprehensive analysis and assessment capabilities also enable the use of the BSR Suite for analysis and evaluation of functional and operating noise, vibrational effects on humans as well as the acoustic and haptic feedback of controls and actuators. Predefined test configurations for typical tasks such as multi-channel road load data acquisition, drive-file generation and objective Squeak & Rattle and Sound Quality testing allow for fast and simple operation. Signal statistics and user defined thresholds or reference-curves can be used for objective evaluation of different acoustic or haptic quality criteria. In addition the development and integration of application- or customer-specific analyses and evaluation methods is also possible at any time. Contact MB to find a solution for your measurement task!
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Testing & Analysis Food Services
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Intertek is a leading provider of testing and analysis services to the global food industry. We can help you implement comprehensive food safety and quality strategies, and achieve compliance with local, national and international regulations. Food testing is integral to the efficient production of safe, quality products. With the food industry increasingly subject to scrutiny, testing to ensure compliance with food safety regulations and to protect public health, is a must.
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Product
Simulation & Analysis Solution for Automotive Audio Networks
A2B Analyzer System
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The A2B Analyzer System is designed specifically for development teams servicing automotive OEMs, Tier 1s, and audio connectivity equipment suppliers. The deterministic nature of the A2B technology makes it particularly well-suited for automotive audio devices (active speakers, microphones) and newer applications such as ANC. The A2B Analyzer System consists of a compact hardware device, an accompanying software development kit (SDK), and network configuration and simulation tools.. The hardware device includes a USB 2.0 interface for PC connectivity for audio data and command/control functions. The small form factor device also features a variety of popular audio and connectivity peripherals.
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Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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3D Surface Texture Analysis Software
TrueMap 6
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Rendering styles: solid, wireframe, wireframe + pointsFull control of surface lighting, including direction, and ambient shadingRendering options including side walls, grid lines, and countour linesEdit the z exaggeration to help visualize surface deviationsRender the axes labels relative to the surface mean, maximum, minimum, or unchanged from the values stored in the fileRender the surface using a gradient to represent the surface heights, or use a solid color, or even use the true color values from the data file if they are availableMultiple options for gradients and even an optimization feature to use the height distribution
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Product
Operation Support System for Wafer Prober
N-PAF
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N-PAF (Network-Based Prober Advanced Function) is a networking system developed for more effective operation and maintenance of multiple wafer probers. Remote operation helps save on labor on the factory floor. An E10-compliant RAM Analyzer can be used for operation management of the system
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Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Live Packet Analysis For Reliable Networks
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MetaGeek App is the culmination of MetaGeek’s best work in Layer 2 wireless troubleshooting. Enhance and streamline your wireless network performance and resolve roaming issues with ease. MetaGeek App also adds automatic event detection, intelligent client following, and a bunch of other useful capabilities never seen before in a MetaGeek product. With Oscium Nomad (included in the Packets Bundle) you can simultaneously capture on four different channels.
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Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
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The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Inorganic Elemental Analysis
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Elementar Analysensysteme GmbH
The elemental composition of a material determines its properties. Elemental analysis is therefore essential for the characterization and quality control of materials that need to meet certain requirements.Elementar's user-friendly inductar® series for inorganic elmental analysis uses the high-temperature combustion method to determine elemental concentrations of carbon, sulfur, oxygen, nitrogen, and hydrogen and is the ideal solution for R&D, routine, and high-throughput laboratories.
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Product
04 With Pins For PCB | 2 Wafers | 24 Positions
04-2xx3-20/70-xx
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Very robust, multi wafer selector with 15° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Portable Data Acquisition & Analysis System
LapCAT III
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# 4, 8, or 16 channels# 1 MHz aggregate 12 bit sampling. Resolution is 0.024% of full scale# 13 recording durations, user selected: 132 msec to 1320 sec# Digital Triggering from any channel, with +/- slope or window# 6 full scale gain ranges, user selected: 0.4, 1, 2, 4, 10, and 20 volts full scale - with a 10mV/g accelerometer these equal 40g, 100g, 200g, 400g 1000g and 2000g full scale - higher or lower ranges by different sensor selection
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Real-time 1/1, 1/3 Octave Analysis Software
DS-0323
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This software analyzes the 1/1 and 1/3 octave bands for 2 - 32 channels (2 - 64 channels when two units are connected ) in real-time from 0.5 to 20 kHz. The filter is compatible with the IEC, JIS, and ANSI standards. The equivalent continuous A-weighted sound pressure level (Laeq) and the single-shot sound exposure level (Lae) are calculated simultaneously by setting measurement time. Variations in level (time series) for each band can be saved for up to 2,000 points.
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Image Analysis & Stage Micrometers
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The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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Catalysis and Thermal Analysis
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A system for catalyst characterisation, reaction testing, kinetic and thermodynamic measurements.
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Fully Automatic 4 Point Probe System for Silicon Wafer
WS-8800
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*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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