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ICT/FCT Probes
During in-circuit testing (ICT), each component of an electronic assembly is checked for faults. Short circuits, interruptions, soldering or component faults are detected and assemblies are rejected according to a go/no-go test.During functional testing (FCT), the assemblies are tested completely or in partial areas for the intended operation. The function test of the modules is carried out in the end application or in an environment that simulates the end application.
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Flexible Multisensor Probes
IT Series
Physitemp multisensors are made with our specially manufactured thermocouple wire. We test and grade this wire to standards better than the accepted ''Special Limits of Error'' and guarantee 0.1°C accuracy in the range of 0-50°C . All multisensor probes conform to NIST standards. These multisensor probes are custom-made and should be ordered to your requirements on number of sensors and spacing between sensors.
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Current Measurement Probes
Comprehensive line of clamp-on current probes covers the entire spectrum of applications, from electrical panels to substations. AEMC Current Probes measure current without interrupting the circuit under test and extend the measuring capabilities of DMMs, recorders, power meters, and loggers. The numerous jaw sizes are designed to accommodate a wide variety of conductor diameters and ranges. Available for AC or DC measurements.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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High Voltage Differential Probes
DP Series
Shenzhen Micsig Instruments Co., Ltd.
*Micsig DP Series High Voltage Differential Probes can be used with any brand of oscilloscope. *It adopts high-impedance isolation between the input and output to protect personal safety, converts the input high-voltage signal to a low-voltage signal for observation and analysis on oscilloscope.
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Low & High Voltage Differential Probes
T3
Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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P2532 General Purpose Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 156Test Center (mm): 3.96Full Travel (mil): 139Full Travel (mm): 3.53Recommended Travel (mil): 93Recommended Travel (mm): 2.36Overall Length (mil): 812Overall Length (mm): 20.62Rec. Mounting Hole Size (mil): 94.5Rec. Mounting Hole Size (mm): 2.40Recommended Drill Size: #41 or 2.40 mm
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Fine Pitch Probes
Fine pitch probes are spring contact probes with pitches between 0.10 / 4mil and 1.00mm / 40mil.In this pitch, direct soldering and the use of mounting receptacles is usually no longer possible. Therefore, almost all fine pitch probes are designed as double-sided spring-loaded contact probes. Fine pitch probes are installed in corresponding test sockets, which enable exact contacting of the test points. Feinmetall fine pitch probes are suitable for common components such as BGA, LGA, QFP, QFN or WLCSP. Precision and 100% quality control characterize these probes.In smaller pitches of 60 – 300µm, carrier needles (beams) are also used.
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Near-Field Probes 100 kHz up to 50 MHz
LF1 set
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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BIP-12 Battery Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Resistance Remark: Probe Resistance Steel: 30 mOhms, Gold plated: 100 mOhmsTest Center (mil): 260Test Center (mm): 6.60Full Travel (mil): 394Full Travel (mm): 10.00Recommended Travel (mil): 315Recommended Travel (mm): 8.00Overall Length (mil): 1,220Overall Length (mm): 31.00
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CCA-003 Battery Probes
Current Rating (Amps): 10Average Probe Resistance (mOhm): 50Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 78Full Travel (mm): 1.98Recommended Travel (mil): 40Recommended Travel (mm): 1.02Mechanical Life (no of cyles): 100,000Overall Length (mil): 670Overall Length (mm): 17.02
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Logic Analyzer Probes
FS2354 & FS2355
The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
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Near Field Probes
A typical emi emission test is performed using broadband EMC antennas such as biconical, log periodics, Combilogs and horns. These antennas usually placed at 1, 3 or 10 meter distance as required by the test specification. These is considered far field measurements and the emission limits are given for the specific distance by the specification. During EMI compliance measurements, the emissions levels from products are compared with these limits. If the product exceeds these limits it is considered failing. These tests are typically conducted in a open area test site IOATS) or inside an anechoic chamber.
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Temperature Probes
Our Temperature Probes are ideal for the Instrumentation, medical, communication, machine builder and HVAC industries.
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Temperature Probes
Lake Shore offers a variety of temperature sensors in packages that enable mounting in very tight areas. But for some applications (especially if the sensors have to be immersed in liquid), you need to do more to protect the sensor circuitry. For these applications, a cryogenic temperature probe is the optimum choice. Encased in one of these stainless steel thermowell fixtures, the sensor can perform as designed, is unaffected by high pressure, and is sealed to keep electrical components and wiring protected from fluids and other elements.
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Probe Kit for PPE Series, PP005 and PP065 Probes
PK106
Probe Kit for PPE Series, PP005 and PP065 Probes.
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Broadband Current Probes
Conducted currents can be measured without making direct contact with the source conductor or metallic surface by means of clamp-on broadband current probes. The BCP-5xx EMC Current Probes are designed to permit field intensity meters, spectrum analyzers, and other 50W impedance instruments to measure quantitative magnitudes of current.
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Test Probes & Clips
CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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BIP-1 Battery Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 16Test Center (mil): 150Test Center (mm): 3.81Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 250,000Overall Length (mil): 323Overall Length (mm): 8.20
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Current Probes
Teledyne LeCroy current probes do not require the breaking of a circuit or the insertion of a shunt to make accurate and reliable current measurements. Based on a combination of Hall effect and transformer technology, Teledyne LeCroy current probes are ideal for making accurate AC, DC, and impulse current measurements.
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Digital Inspection Probes
DI-1000
The ergonomically designed DI-1000 is Lightel’s all digital video microscope probe. It connects directly to your PC through the computer’s USB2.0 port. Featuring easy single finger focusing, a built-in image freeze/capture button, and detectable resolution to 0.5µm, the DI-1000 package includes our free ConnectorViewTM (standard) software, providing digital zoom, image display, image capture, auto-calibration and basic analysis tools.
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Hall Probes
Hirst Magnetic Instruments Ltd
is a magnetic field sensor that passes electrical current when the sensor is perpendicular to a magnetic field. The stronger the B-Field, the more current it passes. Pira DCS # 5M10.10.
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Photometric Probes for Illuminance
LPPHOT03… Series
The probe LPPHOT03 measures illuminance (lux), defined as the ratio between the luminous flux (lumen) passing through a surface and the surface area (m²). The spectral response curve of a photometric probe is similar to the human eye curve, known as standard photopic curve V(λ). The difference in spectral response between LPPHOT03 and the standard photopic curve V(λ) is calculated by means of the error f’1.
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Optical Probes - Low Bandwidth
Depend on Tektronix to provide you with performance you can count on, and industry-leading service and support.*Broad Wavelength Response 500 to 950 nm or 1100 to 1700 nm*High-bandwidth DC up to 1.2 GHz*High Gain 1 V/mW*Low Noise <11 pW/√Hz*Probe Connects to DPO7000*1 and DPO/DSA/MSO70000*2Series*SONET/SDH and Fibre Channel Reference Receiver Performance
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Microwave Probes
S-Probe
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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High Voltage Differential Probes
High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.
