Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
Accessibility Test Probes
TF-24 Series
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Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Product
IC Test Probes
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C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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Test Probes & Clips
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CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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Product
ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Product
Test Probes and Pins
Probes
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Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Product
Fine Tip Test Probes
U1164A
Accessory Kit
Compatible with test leads shipped with U1210, U1240B, U1250, U1270 series of handheld clamp meter and multimeters
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Product
Fused Test Probes with Silicone Test Leads
AL-57FL
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Standard Electric Works Co., Ltd
● AL-57FL is an ideal tool which shows the indication of live voltage even with blown fuse.● 2 replaceable fast-acting fuses are built-in. The specs of the fuses are 1000V, 11A with internal rating of 20kA AC/DC.● Provide additional testing protection.● Help to prevent a possible mis-indication when there is voltage present.● CAT III 1000V, CAT IV 600V, 10A with protective cover.● 2mm probe tips, removable 4mm brass caged banana probe tips are also included.● Include High-quality silicone test leads, 1.5 meter long.● Wipe the fused test probes and silicone test leads periodically with a damp cloth and detergent. Do not use abrasives or solvents.● Operating temperature: -20 °C to +50 °C (-5 °F to 120 °F)● One year warranty● Can't be used on current mode with blown fuse.● Rating : EN 61010-031 CAT Ⅲ 1kV 10A / CAT Ⅳ 600V 10A
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Product
Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
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Product
Fine Pitch Test Probes
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Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Product
Semi-Rigid Test Probes Up to 6 GHz
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Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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Product
CAM/GATE Test Kits
Series 45
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The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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Product
IEC61032 Test Probe Pin
CX-112
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Shenzhen Chuangxin Instruments Co., Ltd.
1. Jointed test finger probe (Figure 2 / Test Probe B / IEC 61032)This is a precision probe made in accordance with all IEC standards. Examples are IEC 61032, 60950, 61010 and 60601; and it is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is Delrin®. Handle is designed to accept either a banana jack or a force gauge.It is no longer necessary to have a separate probe for the medical safety standard. This one probe will meet all the different requirements that are in the IEC standards.
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Product
Voltage Probe
KHZ43201
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Beijing KeHuan Century EMC Technology Co,.LTD
The KHZ43201 voltage probe is a standard low resistance test probe, which meets the technical requirements for this product in the CISPR16-1 and CISPR14-1 test equipment. When measuring the interference voltage of the power grid, the artificial power supply network cannot be used at the load port, and sometimes it is necessary to use a voltage probe to measure the interference of the signal port, the load port, and the antenna port. The input impedance of the voltage probe to the ground wire is greater than 1.5KΩ, which can protect the input terminal of the receiver.
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Product
PCIe Carrier For PMC And PrPMC
PCI104
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The PCI104 is a PCIe carrier for PCI Mezzanine Cards (PMC) or Processor PCI Mezzanine Cards (PrPMC). The PCI104 carrier allows simplified testing of PMC/PrPMCs and their associated PMC I/O Modules (PIMs) by using a PC environment during board development or deployment. The PCI104 can also reduce the costs of manufacturing PMC/PrPMCs by allowing manufacturers to use off-the-shelf PCs for functional testing. The PCI104 converts the PCIe x4 edge connection to PCI-X via a PCIe to PCI-X bridge. The trace lengths to the PMC/PrPMCare kept to a minimum so the PMC/PrPMC can run with a133MHz PCI-X clock speed. The J4 connector of the installed PMC/PrPMC is routed to a 96-pin DIN connector per theVITA-35 specification. The PCIe to PCI-X bridge can run in either transparent or non-transparent mode and can also operate in forward or reverse mode. The PCI104 has a fan mounted on the board to cool the PMC/PrPMC. The fan can easily be removed for testing and probing of hosted card.
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Product
Stand-Alone Test Fixture
MA 2012/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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Product
CAPACITANCE METER
C350
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This is a high quality digital capacitance meter. Check the accuracy and status of capacitors up to 20mF, a very handy tool for virtually any technician. It features high accuracy (0.5%) and 9 selectable ranges. A zero adjustment knob is also provided to "zero" test lead capacitance. Includes test probe set and yellow rubber boot.
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Product
Battery and Alternator Analyser for 12V DC Systems
1176
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Checks battery charge level and alternator output level. 880mm of insulated cable with test probe and earth (crocodile) clip. For 12V DC systems only. Display packed.Warning: For testing DC circuits on vehicles within the voltage range only. Not suitable for testing mains supply AC circuits.
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Test Thorn Probe
CX-41
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Thorn Probe For testing accessibility in appliances with visibly glowing heating elements.
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Product
Test Probe Leads, With 19-mm Tips And 4-mm Tips
U1169A
Accessory Kit
The U1169A consists of one pair (red and black) of insulated test leads, one pair of test probes with 19-mm tips and another pair of test probes with 4-mm tips. Recommended for use with Keysight handheld digital multimeters. Rated at CAT III 1000V, CAT IV 600V, 15A.
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Product
Test Finger Probe
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Shenzhen Bonad Instrument Co., Ltd.
BONAD’s test fingers, test probes and test needles comply with IEC 60065, IEC 60238, IEC 60335, IEC 60529 and IEC 61032 standards and are essential instruments for the protection against electric shock of household and similar electrical appliances. For more information, please contact us and BONAD will provide you with professional technical advice and high-quality testing equipment.
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Product
Heat Test Probe 43
CX-43
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Shenzhen Chuangxin Instruments Co., Ltd.
It's the necessary tool to proceed protecting electric shock test of household and similar electrical appliances.
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Product
Test Probe Connector, High Voltage, Voltage, 3 %
72-6530
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The 72-6530 is a high voltage Testy Probe with built-in meter measures voltages up to 40kVDC.
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Product
Accessibility Probes
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Educated Design & Development, Inc.
FOR TESTING THE PROTECTION AGAINST ACCESS TO HAZARDOUS PARTS Our complete line of accessibility probes will allow you to determine compliance with all IEC, EN, UL, CE, CSA and other international safety Standards. ED&D offers the highest quality test probes available in the world. These probes are used to determine if accessibility exists with fingers, tools, and foreign objects to hazardous areas [involving shock hazards (voltage), energy hazards (VA) and injury hazards (i.e. moving parts)]. If you can’t tell which probe is right for your products, send us a copy of the specifications from the safety standard you are using. We can provide custom probes to meet your needs. All probe bodies are machined from high quality Delrin® (extremely resistant to deformation). ISO/IEC 17025 Accredited and NIST-traceable Certificates of Calibration available! Measurement and Uncertainty data available. All ED&D Probes are Made in the USA.
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Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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Product
Stand-Alone Test Fixture
MA 2013/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Product
Passive probe with X1/X10 switch
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They are normally designated X1 and X10, although 1X and 10X are sometimes seen. The designation refers to the factor by which the impedance of the scope itelf is multiplied by the probe.The X1 probes are suitable for many low frequency applications. They offer the same input impedance of the oscilloscope which is normally 1 MΩ. However for applications where better accuracy is needed and as frequencies start to rise, other test probes are needed.
