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Pilot H4 Next Automatic
The Pilot H4 Next series automatic version represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system.
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Manual Step Attenuator
WATT-3SM352
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customers demand. All Warisons products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Phasing Voltmeter/Sensor (2 in 1)
STB Electrical Test Equipment, Inc
STB unit replaces 3 separate units manufactured by competitors - line phasing, capacitance phasing and line to ground Versatile, lightweight and easy to useEach portable meter has a single rangeMeter usage: Voltage detection and phasing at capacitance test points or voltage detection and phasing on bare energized conductors (overhead & underground)Probes can be separated to be used as a voltage sensor or capacitance sensorFive position selector.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 305gf
K100-K150305-SKAU
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Straight Wire Porbe Pins
Buckling Beam
Straight wire probe pins are a proven solution for various electronics production test environments.
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USB Oscilloscope
Handyscope HS6 DIFF
This powerful USB 3.0 super speed oscilloscope combines fast sampling up to 1 GS/s with high resolutions of 12, 14 and 16 bit and a large memory of 64 MSamples on all four channels. The oscilloscope supports continuous streaming measurements up to 200 MS/s and can be synchronized with other oscilloscopes using the CMI interface to form a multi channel combined instrument with synchronized timebase. The CMI interface is available by default on the Handyscope HS6 DIFF. Optionally, the Handyscope HS6 DIFF can be delivered with SureConnect connection test and resistance measurement on each channel. Also, the Handyscope HS6 DIFF can be delivered with SafeGround option. With SafeGround you can switch the differential inputs of the Handyscope HS6 DIFF into single ended inputs with ground protection. It allows to make measurements using standard attenuating probes and protects the scope when a short circuit to ground is created.
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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25L18-12
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4E-1
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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JTAG Debug Probe for Cortex-M
J-Trace PRO
SEGGER Microcontroller GmbH & Co. KG
J-Trace PRO for Cortex-M is setting a new standard for trace probes. It enables continuous streaming trace via its Gigabit Ethernet interface, lifting the limitations by internal buffers and slow data transmission.J-Trace PRO can capture omplete traces over long periods - thereby enabling the recording of infrequent, hard-to-reproduce bugs. This is particularly helpful when the program flow 'runs off the rails' and stops in a fault state. It also supports extended trace features, such as code coverage (so engineers have visibility of which parts of the application code have been executed) and execution profiling (providing visibility as to which instructions have been executed and how often - so hotspots can be addressed and optimization opportunities identified).
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T-6-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Acute High Voltage Differential Probe, 10x/100x, 25MHz, 700V
ADP1025
*USB Powered (or Power Bank)*Bandwidth up to 25 MHz*Overrange Indicator*Audible Overrange Alarm*Bandwidth Limit : 5 MHz / Full*Can be used by any DSO which has the USB port(s).*EC Declaration: EN 61010-031:2002 +A1:2008*Double-layer wire for power insulation
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1Z1-6-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4F-2
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Probe Card
VS Series
Japan Electronic Materials Corp.
*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test
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Standard 0.70 (2.00) - 1.70 (4.80) General Purpose Probe
P2662AG-2V1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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InfiniiMax II Series Probe Amplifier, 10 GHz
1168B
Provides a large common mode range and a large offset range for measuring differential and single-ended signals.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1L24-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 2.67 (76.00) - 7.00 (198.00) Bead Probe
BTP-72F-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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Alternate 2.54 (72.00) - 6.20 (176.00) General Purpose Probe
HPA-52D-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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Create Topographic Profiles from SPM Images
TopoStitch
topoStitch™ offers the easiest and most accurate way to stitch topographic or greyscale images from Scanning Probe Microscopes (SPM’s), profilers, interferometers, confocal microscopes or any other instrument type. All images are placed automatically according to stage position coordinates when stored in the image files. Otherwise, the Grid Layout Wizard helps to lay out images in seconds. topoStitch™ even offers advanced snapping and semi transparent rendering, which makes it easy to place and adjust images manually.
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High-Resolution Scanning Probe Microscope (SPM)
High-Resolution Scanning Probe Microscope (SPM)
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Near Field Micro Probe ICR HV H Field
The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3B
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Digital Media Probe - 10GB Ethernet
VB330
The VB330 Probe is the flagship in the VideoBRIDGE product range. Equipped with up to two 10GB Ethernet inputs it is capable of monitoring thousands of streams in backbone networks and central head-ends. The VB330 utilises the same visual and intuitive approach to monitoring and analytics as other VideoBRIDGE probes.
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SINGLE ENERGY IMPACT HAMMERS
Shenzhen Chuangxin Instruments Co., Ltd.
It’s used to test the mechanical integrity of product enclosures and check the durability of enclosures for electrical appliances of other electrical appliances and other electronic products. If damage occurs from the Impact Hammer test, accessibility probes can be used to measure the extent or severity of the damage. The Impact Hammer simulates the mechanical impact to which electrical equipment maybe subjected.
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Probes With Lead Wires
Used when the probe is installed some distance from the logger, controller, or other data acquisition device. Available in a variety of lead wire types with stripped leads or connectors attached.
