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High Impedance Active Probes
28 AND 29
Designed to serve the needs of integrated circuit engineers working in the most advanced high speed, submicron, MOS technology. These high frequency instruments include the attractive features of the Models 18C and 19 including full dc capability, negligible dc current drain, and extremely low input capacitance. In addition the frequency range of the Models 28 and 29 has been extended to a full 1 GHz.
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Switch Probes
A switch probe is designed primarily for “presence/ electrical” test applications such as detecting the absence or presence of contacts within a wire harness connector. In this case, the switch probe provides electrical interconnection and verifies the connector has been manufactured properly. If contacts are missing or out of place, the part is rejected. If all the contacts are in place, the part is accepted and an electrical test is performed, verifying the electrical integrity of the connector and the wires within the harness.
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Brute Hight Current Probes
P4301
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Logic Probes
Logic probes are used to analyze the logic states (high/true: logic 1 or low/false: logic 0) of digital signals. To verify and debug today’s high-speed, low-voltage digital signals, you need logic probes that can accurately acquire signals from a wide variety of electronic designs, while protecting signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions below.
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BIP-3 Battery Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 60Recommended Travel (mm): 1.52Mechanical Life (no of cyles): 250,000Overall Length (mil): 511Overall Length (mm): 12.98
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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SSP Switch Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Spring Force Remark: Force at switch point: 2.36 (66)Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 150Full Travel (mm): 3.81Recommended Travel (mil): 100Recommended Travel (mm): 2.54Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,210Overall Length (mm): 30.73Switch Point (mil): 25Switch Point (mm): 0.64
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EPA General Purpose Probes
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Test Fingers & Probes
Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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Transmission Line Probes
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
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Test Probes
A physical device used to connect electronic test equipment to a device under test (DUT).
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G-S General Purpose Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Near Field Micro Probes ICR HH H Field
The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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Quick Change Probes For Weld Seam Testing (ASTM)
SONOSCAN Q
In addition to angle beam probes according to european standards (EN), we offer probes with quick-change wedges for ultrasonic weld seam inspection as well as various wedges for the american market. Quick-change probes are used wherever access to the inspection object is difficult to reach with the larger AWS transducers. The relatively small, round elements also offer better defect resolution.
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Coupled Multielectrode Array Sensor (CMAS) Probes
CMAS probes are made from user-specified sensing materials, including carbon steels, stainless steels, and nickel-, aluminum-, and copper-based alloys. They can also be made from customer supplied materials that have the same microstructure/heat treatment as the system component materials to be monitored. The size of the sensing electrode varies from 0.1 to 3 mm (0.004" to 0.12") in diameter, depending on the application. Typical numbers of electrodes in a CMAS probe are 9, 16 or 25 for online corrosion monitoring and vary from 8 to 100 for laboratory corrosion and electrochemical studies.
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Interchangeable Temperature Humidity Probes
S.TC series
Interchangeable temperature and humidity probes with SICRAM 2 module and with cable for the HD2717T… and the HD2817T… transmitters series.
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Test Probes / Test Fixtures
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Current Probes | Current Sensors
Sensitivity of Conventional Probes Deliver Precise Measurement of Low Current Waveforms from 1 mA. High-precision Current Sensors, DC to 4 MHz, DC to 20 kHz, up to 50 kHz and load current sensors,
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Low Voltage Single Ended Probes
A low voltage single-ended probe is typically used for measuring high-speed, ground referenced signals up to 12 V. These low voltage probes are the best choice for making measurements on high impedance, high frequency circuit elements which require minimal probe loading. Users should select probes with a low input capacitance specification (~1 pF) to minimize the probe’s loading effect on the circuit. A probe with lower input capacitance will offer higher input impedance at higher frequencies.
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Interposers and Probes
The Summit product family includes a wide variety of Interposer systems, designed to reliably capture serial data traffic while minimizing perturbations in the serial data stream. Probes include interposers, which are designed to capture data traffic crossing the PCI Express card connector interface, and MidBus probes, which are designed to capture traffic flowing within a PCB.
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High Impedance Active Probes
35
The Picoprobe Model 35 has been engineered to meet the stringent demands of advanced high frequency circuit designers.
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Ultrasonic Probes And Cables
The cable connects the main body of ultrasound diagnostic equipment and the probe used for echographic investigation.
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Replacement Accessory Kit for ZS Series Probes
PK-ZS
Replacement Accessory Kit for ZS Series Probes
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High Frequency Spring Probes
We have spring probes for high frequency for 0.5 and 0.8mm pitch. We provide spring probe with low insertion loss by shorten the total length to 1.5mm (use length 1.1mm).
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High Impedance Probes
Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
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µHELIX® Test Probes
Series S200, S300, S400, and S500
Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
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Probes
Sper Scientific portfolio of probes provides the right solution for your testing needs, backed by years of product innovation and technical support. All of our probes are designed to meet the accuracy, ease of use, durability and flexibility for your water quality testing needs.
