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ATCA 5U 7 Slot replicated Mesh - dual shelf managers
109ATCA507-3000R
The 5U 7-slot ATCA backplane is a Replicated Mesh, compliant to the PICMG 3.0 Rev 3.0 specification. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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Instruments
Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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Antenna and Component Testing
Alpha Omega Electromagnetics, L.L.C.
We extensively test and characterize our antennas and related RF components to ensure they meet and exceed required performance parameters as well as our customer expectations. Antennas and active and passive RF components are characterized in the lab at AOE and antennas are also fully characterized in anechoic chambers. Passive antennas are characterized for gain, antenna patterns, polarization, etc. and active antennas are additionally fully characterized for EIRP, G/T and Noise Figure.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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UXG X-Series Agile Signal Generator, Modified Version
N5191A
et closer to reality: simulate increasingly complex signal environments for radar, EW & antenna-test Test sooner & increase confidence in EW systems by generating signal simulations when you need them: the UXG is a scalable threat simulator Use pulse descriptor words (PDWs) to generate long pulse trains & individually control pulse characteristics Quickly characterize antennas over a wide frequency range with fast frequency tuning Performance without requiring an export license
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Ferroelectric Test System
LCII
Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
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ATCA 5U 4 Slot replicated Mesh - dual shelf managers
109ATCA504-3000R
The 5U 4 slot ATCA backplane is a replicated Mesh with dual shelf managers. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Modulation Distortion Up To 43.5 GHz
S930704B
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Dynamic Particle Image Analysis System
iSpect DIA-10
Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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High Voltage Optically Isolated Probe, 350 MHz Bandwidth. Includes soft-carrying case.
DL03-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Display Measurement Systems
DTS Series
Instrument Systems Optische Messtechnik GmbH
Characterization of emissive, transmissive, reflective, and transflective displaysViewing-angle-dependent analysis of illuminance, contrast, color, and derived parametersDetermination of the electro-optical transfer function: analysis of luminance, contrast, and color depending on electrical driving conditionsMeasurement of transient properties, such as switching times, flicker, and modulation
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Blackbodies
Blackbodies are devices that work as near perfect emitters of thermal radiation in range from visible to microwaves. There are many blackbodies available on international market. Inframet specializes in high-tech expensive blackbodies optimized for narrow market of high requirements. All blackbodies offered by Inframet are characterized by special features.
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Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Modulator
SFT3332
Hangzhou Softel Optic Co., Ltd.
SFT3332 IP Mux-Scrambling modulator is the latest generational Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 32 multiplexing channels, 32 scrambling channels and 32 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 32 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation CATV broadcasting system.
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Antenna, Ridged Guide
EM-6960 | 200 MHz – 2 GHz
The EM-6960 operates over the 200 MHz to 2 GHz frequency range and is characterized by relatively high gain and low VSWR over this wide range.
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LXI Microwave Matrix, 10GHz, Dual 4x4
60-750-244-B
The 60-750-244-B is a dual 4x4 10GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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TLP Tester
Tokyo Electronics Trading Co., Ltd.
A method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures.
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Deep-Level Transient Spectroscopy System
FT 1030
The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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Analytical Instrument
LabSpec 4 Hi-Res
Analytical Spectral Devices, Inc.
The LabSpec 4 Hi-Res analytical spectrometer is designed for analysis of materials that are characterized by sharp spectral features that may require more resolute spectral data for accurate detection and identification.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Digital Interconnect Test System, Reference Solution
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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16 Mux-scrambling Modulator
Hangzhou Softel Optic Co., Ltd.
SFT3394C is a high performance and cost-effective QAM modulator designed by Softel. It has 16 DVB-S/S2 FTA tuner input to 16 non-adjacent carrier output with multiplexing, scrambling and QAM modulating included. It also supports maximum 512 IP input port and one IP (MPTS) output through GE1 and TS input for re-mux through 2 ASI ports. SFT3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation CATV broadcasting system.
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Terahertz Spectrometers
Due to its non-invasive and non-ionizing properties, terahertz (THz) radiation is unparalleled in its sensing capabilities. Based on state-of-the-art research results, HÜBNER Photonics division developed innovative and highly compact plug & play systems – allowing contact-free detection, characterization and analysis as well as hyperspectral imaging of materials by THz spectroscopy within a few seconds.
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Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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PathWave BenchVue Advanced Power Control And Analysis
BV9201B
The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Thermal Conductivity Analyzer
TCi
The default C-Therm TCi Thermal Conductivity Analyzer employs the Modified Transient Plane Source (MTPS) technique in characterizing the thermal conductivity and effusivity of materials.
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Test Cells
Our test cells accurately characterize the dielectric properties of liquids and solid material.
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Foundation IP
TSMC
Our Foundation IPs embed power management features (multi-Vt/multi-channel libraries, multi-VDD characterization, integrated power-switches, source-biasing…) which allow designers to explore the SoC architecture. Optimal configurations can be generated to meet the application’s Performance, Power and Area constraints. We also complement our offering to reach best-in-class Energy Efficient SoC by serving Always-On power-domains with a dedicated offer, optimized to achieve the ultra-low-power requirements of battery-operated devices in sleep mode.
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WiGig RF Tester
IQgig-RF Model B
When used in conjunction with IQgig-IF, an optimized test solution for conducted testing of WiGig chipsets and baseband modules, the IQgig family products provide a total test solution for R&D characterization and high volume manufacturing.
