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Characterization Platform
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Process & Material Characterization System
TriboLab CMP
Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of waferpolishing processes. Small R&D-scale specialty system for CMP. Reproduces full-scale wafer polishing process conditions without downtime on production equipment. Provides unmatched measurement repeatability and detail. Allows testing on small coupons for substantial cost savings over whole-wafer testing.
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Pulse Characterization Sensors
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Device Characterization
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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TIM Characterization Tools
Thermal Engineering Associates, Inc.
Combining Thermal Test Vehicles (TTVs) with Thermal Test Boards (TTBs) results in a set of tools that perform the basis for TIM thermal characterization under application-oriented measurement conditions. Availability of these tools creates a de facto standard that enable both TIM manufacturers and TIM users to compare measurement results under the same conditions.
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Material Characterization Products
MeasureReady®
Unique real-time sampling architecture for synchronous sourcing and measuring.
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Bench & Characterization Boards
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Antenna Characterization
Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Image Sensor Characterization Systems
Image Sensor QE and Spectral Responsivity Characterization
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Solar Cell I-V Characterization System
VS6821
Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Active Device Characterization Solution Up To 50 GHz For 5G
N5245BM
The N5245BM provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 50 GHz for 5G applications.
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Automated Compliance and Device Characterization Tests
N5990A
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Thermal Characterization Testing Services
Thermal Engineering Associates, Inc.
Thermal Characterization - TEA offers this service to customers having need for precise thermal parameter values for product data sheets, purchase specifications, specific application configurations, and/or device comparisons. This service is offered for a wide range of Discrete Devices (i.e., Bipolar Junction Transistors, MOSFETs, IGBTs, Diodes, SCRs, Triacs) and Integrated Circuits (i.e., digital, linear and mixed-signal devices).
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Amplifier Characterization With Wideband Modulated Signal
N5245BV
The N5245BV provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for amplifier measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements.
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Solar Cell I-V Characterization System
VS6825
Industrial Vision Technology Pte Ltd.
The VS-6825A I-V test system is tailored for high-efficiency Solar cell production lines. It is able to eliminate the impact of HJT/IBC/TOPCON’s high capacitance characteristics on measurement results.
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Laser Diode Characterization Systems
Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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Metrology
KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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Differential Scanning Calorimetry
Nano DSC
The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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SATA 3 Receiver Test Automation Software
N5991ST3A
The N5991ST3A is the latest receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize SATA devices and hosts.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Electroacoustic Test
CRYSOUND offers comprehensive and expert electroacoustic measurement solutions for a broad spectrum of consumer electronics, including headphones, microphones, and speakers. These solutions are characterized by powerful functionality and robust stability.
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Power Measurements For The 3000A/T/G X-Series
D3000PWRB
The power software package for Keysight’s InfiniiVision 3000A, 3000T, and 3000G X-Series oscilloscopes enables a broad range of automated power supply characterization measurements including critical frequency response measurements (3000T/G X-Series only) such as power supply rejection ratio (PSRR) and control loop response. This package also enables hardware-based pass / fail mask testing and USB PD triggering and decode (3000T/G X-Series only).
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PNA-X Microwave Network Analyzer, 13.5 GHz
N5241B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Digital Tesla Meter
HT208
Model HT208 digital teslameter is controlled by the SCM,which is suitable for handle operation.It can be used to measure DC or AC magnetic field and flux dencity.The device can be carried on one’sperson. It is characterized by its wide measuring range,simple operation and clear display. It is still added with the function of maintenance such as holding Measure Value/Peak Value,As mT or Gs unit of display can be change over,Measuring range of 200mT or 2000mT can be choosed,and others that as reseting zero by key and so on. The power is one piece of battery 9V. It can be used continually about 20 hours
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Power Energy & Power Quality Analysers
Designed for test and maintenance teams working in industrial or administrative buildings can be used to obtain a snapshot of the main features characterizing the quality of the electrical network.
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C-SGN Emulator
The C-SGN Emulator combines the MME, SGW, and PGW functions, simulating the optimized EPC network required for CIoT. As part of the NetTest suite, the C-SGN Emulator creates an end-to-end lab environment for testing functions and features that characterize enhanced Machine Type Communication (eMTC) and Narrow Band Internet of Things (NB-IoT) implementations. In order to reduce complexity in the setup of a test environment, it also supports simulation of SMS Central Function (SMS-SC) and the Service Capability Exposure Functions (SCEF).
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Standard Products
SBIR offers an extensive line of reliable, high performance test equipment used to characterize and calibrate IR, Visible and Laser systems. Products include blackbodies, visible sources, target wheels, targets, collimators, target projectors, laser test modules/systems and IRWindows™ software for automated testing. These modular, cost effective instruments are user-friendly and easily integrated into automated test systems. For more information, including printable data sheets, select a product from the list.
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ATI Performance Oscilloscopes
DPO70000SX
DPO70000SX ATI Performance Oscilloscopes deliver the industry’s most accurate capture of high-speed signal behavior to verify, validate and characterize your next generation designs. Capture up to 70 GHz signals with the lowest noise and highest fidelity, ensuring the most accurate measurements of your signal’s true characteristics.
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Heat Deflection Tester
Apparatus is used to determine the Heat Deflection Temperature or the Vi cat Softening Point. All the specimens are charged with a constant load and immersed in a bath, where temperature is increased at a standard velocity. The attained heat resistance rate of plastic materials is a widely required parameter for product characterization, for quality control, as well as for evaluating their conformity to the previewed applications.
