Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Video Analysis Software
BrainChip Studio
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BrainChip Studio aids law enforcement and intelligence organizations to rapidly search vast amounts of video footage and identify patterns or faces. A result of over 10 years of R&D, it uses an artificial intelligence (AI) technology called a spiking neural network (SNN), a type of neuromorphic computing that simulates the functionality of the human visual tract. Because faces have unique identifying features, the software includes advanced facial detection, extraction and classification algorithms. The SNN technology enables BrainChip Studio to work on low-resolution video and requires only a 24x24 pixel image to detect and classify faces.
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Product
Gas Analysis
QIC MultiStream
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The Hiden QIC MultiStream is a complete, multi-stream gas composition monitoring system. Capable of analysing gas streams at flow rates from 4 ml/min up to 10 L/min. The system is suited to a range of applications where multi-component, multi-stream gas analysis is required, environmental monitoring for example.
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Product
Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
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The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Signal Analysis
Modal Analysis
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Modal Analysis is used for analyzing pulse and transition characteristics of signals coming from the input channels of FFT spectrum analyzers and seismic stations in real time or recorded time realization view mode.
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Particle Size Analysis Systems
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The Aggregates Sizer aggregation analysis system enables the quantitative evaluation of particle amounts in the 0.1 µm to 10 µm range as a concentration (units: µg/mL or particles/mL).
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
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The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Product
Gas Analysis
HPR-90
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The HPR-90 automated package cracking analysis system is a complete system optimized to analyse gas within sealed volumes such as light bulbs.
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Product
Root Cause Failure Analysis
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Maintenance Reliability Group, LLC
Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.
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Non Destructive Analysis
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The submicron resolution of a submicron focus X-ray tube and digital image detection offers in 2D and Oblique View with High Magnification imaging mode high resolution X-ray images. A 3D image of the sample can be reconstructed from multiple image recordings during a 360° rotation of the sample. Virtual any cross section can be viewed at an offline workstation. This mode is a strong tool for multi-material components.
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Product
Powertrain Analysis System
KiBox2
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With the KiBox2 analysis system, you have all the data related to vehicle powertrains under control.
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Product
LC/MS/MS Method Package For Water Quality Analysis
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Shimadzu provides method files, including pre-registered MRM parameters with optimized quantitative and reference ions, LC separation parameters, and retention times and peak identification parameters for each compound, as well as report templates for outputting quantitation results, as a package. If retention times are adjusted when the system is introduced, based on the HPLC configuration delivered, the analysis process can be started as soon as the specified columns, mobile phases, and standard samples are supplied.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Fully automated Crude and Detergent Fibre analysis
Fibertec™ 8000
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The Fibertec 8000 is a fully automated system for determination of crude fibre, detergent fibre and related parameters according to standard reference 'crucible' methods such as Weende, van Soest and other recognised methods. Approvals for the crucible method include ISO, EEC, AOAC, AOCS. The Fibertec 8000 provides unrivalled accuracy, the highest safety and the lowest operator time of any fibre solution.Parameters: Crude fibre, neutral detergent fibre, acid detergent fibre, acid detergent lignin. Sample types: Raw materials and finished products in Feed and Agriculture.
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Compact System for Chemical Analysis Technology
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Small test system based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of measuring instruments for chemical analysis in a high mix / medium volume environment.
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Product
Gas Analysis
HPR-20 DLS
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The Hiden HPR-20 DLS gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Data Analysis & Graphing Software
OriginPro
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Take your data analysis to the next level with OriginPro. In addition to all of Origin's features, OriginPro offers advanced analysis tools and Apps for Peak Fitting, Surface Fitting, Statistics and Signal Processing. Features specific to OriginPro are marked with the PRO icon in this page.
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Product
Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Product
Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
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L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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Complete Graphical Power Quality Analysis System
PK5064
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This system contains the essentials for almost any power quality study, with the graphical insight of a colored visual display. Other standard systems that include the PS5000 are the PK5064-PRO and the PK5064-PRO+.
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Product
Residual Gas Analysis
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Systems for the examination of components present in a vessel or evolved from a process.Measures the concentration of gases and vapours in real time.
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Product
Portable Wafer Probe Station
PS-5026B
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High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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Product
Failure Analysis Services
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Innovative Circuits Engineering, inc
Innovative circuits engineerin's failure analysis group performs root cause analysis on a wide variety of integrated circuit devices.
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Product
Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Analysis Tool for ECU Networks and Distributed Systems
CANape
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The primary application area of CANape is in optimizing parameterization (calibration) of electronic control units. During a measurement process, you can simultaneously calibrate parameters and record signals. The communication between CANape and the ECUs takes place via protocols such as XCP or via microcontroller-specific interfaces with the VX1000 measurement and calibration hardware. CANape supports various ADAS sensors such as radar, LIDAR and video. Combined with high-performance hardware, CANape can store multiple gigabytes of data per second. Calibration data management and convenient measurement data evaluation including data management as well as reporting make CANape a complete tool for ECU calibration. Of course, CANape also provides access to bus data, diagnostic data and analog measurement data.
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Product
Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
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Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Product
Data Acquistion & Analysis Software
NextView 4
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One software for everything. NextView®4 covers the entire world of PC measurement data acquisition: displaying live data, recording measured values, analyzing your measurement applications - and much more.
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Product
04 With Soldering Eyelets | 1 Wafer | 24 Positions
04-1xx3-00/30-xx
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Very robust, multi wafer selector with 15° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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In-depth Execution Time Analysis For Critical Software
RapiTime
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*Timing analysis (inc. WCET) for Ada, C & C++ on-target & host**Identify code to optimize for worst-case behavior*Debug rare timing events*Simplify verification through integration with your CI tool*Produce evidence for DO-178 and ISO 26262 certification
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Enhanced Time-Domain Analysis With TDR
S95011B
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This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications. All functionality of the S95010B are included (TDR/TDT mode). In addition, the S95011B enables more detailed measurements and evaluations, such as eye-diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S95011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical calibration kits or ECal with DC option (i.e., N469xD or N4433D with Option 0DC) are recommended.
