Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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AUTOMATED SAFETY AND COMPLIANCE
DMC's test and measurement system offerings include designs and development of Automated Safety, Compliance, and Benchmark Testing. These serve interests of commercial product certification, including fire hazards, safety and signaling, lighting, building safety, energy, and hazardous location testing. These also serve interests of product and technology benchmarking, including brand quality protection, consumer quality, and energy efficiency. Test systems have been developed by DMC to support many standards, including UL (Underwriters Laboratories), Consumer Reports, Intertek, Energy Star, and EN / CEN European Standards.
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PXI High Density Precision Resistor Module, 18-Channel, 2Ω to 31.5Ω
40-298-010
The 40-298-010 is a high density programmable resistor module with 18 channels which can be set between 2Ω and 31.5Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 1.51MΩ
40-251-150
The 40-251-150 is a programmable resistor module with 1 channel which can be set between 3Ω and 1.51MΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Thermal Shroud
BC8-55/150C
When combined with a thermal conditioner such as the Bemco PCL3L-III or PCL3M-III, this shroud converts a 24 inch inside diameter by 30 inch high vacuum only vertical bell jar into a 19 inch inside diameter by 20 inch high thermal vacuum testing system. With a convenient clam shell door, test objects are easily loaded by simply raising the bell jar above the top of the door opening.
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AMIDA ATI 600 Tester
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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SPMI Protocol Analyzer and Exerciser
PGY-SPMI-EX-PD
Prodigy Technovations Pvt. Ltd.
SPMI Protocol Analyzer (PGY-SPMI-EX-PD) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. SPMI (System Power Management Interface) is a MIPI (Mobile Industry Processor Interface) standard with 2-wire synchronous serial, bidirectional interface that connects the integrated Power Controller(PC) of a System on- Chip (SoC) processor system with one or more Power Management Integrated Circuits (PMIC) voltage regulation systems.
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Deep And Sloped Pan Fixtures
Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
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Laser Power Meters
Is used to measure the energy output of laser beams for testing or laser system applications. It uses detection sensor to determine the intensity of a laser beam’s energy output.
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Testability Director
Advanced Test Engineering Solutions, Inc.
A spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government''s Testability Program for Electronic Systems and Equipments. But Version 3.1 goes much further, bringing you hundreds of guidelines from IC design through board and system testing.
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Precision LCR Meter
TH2817A
Changzhou Tonghui Electronic Co., Ltd.
TH2817A is a new precision LCR meter combined with years of technical experience and newest measurement technology of instrument industry. With powerful measurement functions, high performance and low cost, TH2817A has been one of the world advanced instruments, and it provides users a super value measurement resolution and experience. The meter offers stable 6 digit resolution, wide frequency range (50Hz to 100kHz for TH2817A ), programmable signal level (0.01V to 2.0V), up to 30 meas/sec measurement rate, 9 measurement ranges, 30Ω or 100Ω constant output impedance and friendly operation interface. TH2817A can be used for incoming inspection of components, quality control of product line and high accuracy laboratory use. The HANDLER, GPIB, RS232C interfaces make it easy to build an automatic component test system,
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Automatic Safety Test System
LS9955/56
The LS9955/LS9956 Automatic Safety Test System is according to GB4706.1, IEC/EN60335-1, UL60335, GB7000, IEC60598, GB4943, IEC60950 and GB9706.1. It used for luminaries, home application and motor tools safety test in production line or Lab R&D.
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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PCI High Density Pecision Resistor Card, 6-Channel, 4Ω To 5.82MΩ
50-298-052
The 50-298-052 is a high density programmable resistor card with 6 channels which can be set between 4Ω and 5.82MΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Engineering/Development System
ULTRA L
The ULTRA L is a high performance “Lab” system that provides thermal conditioning, mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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True Concurrent Test
TestStation Duo
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Motor Drive Analyzer, 1 GHz, 8 Ch, 12 bits, 10 GS/s, 50 Mpts/Ch
MDA 8108HD
Static power analysis - like a dedicated power analyzer.Dynamic power analysis – capture more information.Complete test coverage – control system, power section, motor.Comprehensive mechanical interface.Harmonics calculation option.Vector display option (THREEPHASEVECTOR).Waveform Transformations option (THREEPHASEdq0).16 Channels with OscilloSYNC™.
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Transportation Bounce Test System
KRD51 series
Bounce testing simulates the constant loose cargo state during truck transport. Often times, containers carrying military and civilian hardware (such as: medical supplies, electronics, weaponry, communication devices) travel for extended periods of time and must be transported off-road. All of these items must maintain functionality upon arrival at their destinations.
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GO-2000 Goniophotometer
Hangzhou Everfine Photo-E-Info Co., LTD
GO-2000 is a highly automated luminaire light distribution performance test system, mainly used for all kinds of indoor lamps, road lamps and floodlights ( add B-β test accessories) light distribution performance test, total luminous flux test and electrical parameters (voltage, current, power, power factor) measurement.
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Functional Test Fixtures
RNS can build almost any test equipment and automated test machinery. We have delivered soltions for HiPot, LED Test, Leak Test and RF shielded applications for years. We can provide Complete Test Systems, including Test Fixtures, Rack System and even Programming. Our team is committed and has a proven track record of delivering exceptional products independent of scope, so simple- and high-complexity projects are handled with equal care.
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Solenoid Test Systems
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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Microhardness Testers
Newage Testing Instruments, Inc.
Newage Testing Instruments offers a range of microhardness testing solutions including the cost-effective MT91 and MS-ZH microhardness testing system.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Power mixed test system
Power device or module with which are digitally controlled and memory can be measured per system.
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3U Rackmount Appliance for PCI Express® Gen5
R300-G5 Pro
Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols.
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Universal Frequency Counters
GT210PXI-2
GuideTech’s GT210PXI-2 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system with optimal cost. The ability to precisely resolve frequency and time yields both increased accuracy as well as reduced measurement time.
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Transformer Testing
Measuring bridges or electronic burdens can be individually integrated into existing CT/VT test systems. Customized solutions are our core competence.
