Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 395kΩ
40-298-142
The 40-298-142 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 395kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Conducted Immunity Test System
Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
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Wide Range High Voltage Programmable DC Power Supply
N3600 Series
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.
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Data Acquisition
For devices with analog outputs, we are now shipping our new multi-channel data acquisition system. This high-speed, low-noise solution is highly modular, so you can test scientific CCDs and high-speed machine-vision CMOS sensors with the same basic system. Swappable pre-amps and A/D converter modules enable you to reconfigure your test system to fit your needs.
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Electromagnetic anechoic box/Shield box/Anechoic chamber
The necessity of a wireless system test has risen by the spread of recent wireless telecommunication equipment as shown in cellular phone, wireless LAN, RF-ID tag and ETC (Electronic Toll Collection system). It is necessary for a wireless test to be performed in anechoic environment in which an external noise is intercepted and a radio wave does not reflect internally. An anechoic chamber (room version of a shield box) is proper facilities but needs a wide space and a huge cost. Especially, the equipment under wireless system test on the production line can not radiate any signal radio wave outside before approval. The shield box satisfies these conditions.
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Current-Voltage Measurement System
Sciencetech''s IV Testers are electrical current-voltage measurement systems used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load.This IV Test system can measure electrical power from photovoltaic cells up to 20W. The voltage envelope is limited to 20V and the current to 1A. A higher power version, up to 60W, is available. In general, the limitation on this model is the 1A current limit: if your solar cell generates more than 1A, we recommend upgrading to the 60W version.
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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PXI 2.5W Programmable Resistor Module, 8-Channel, 1Ω to 62.1Ω
40-251-011
The 40-251-011 is a programmable resistor module with 8 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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AXIe Chassis and Controllers
AXIe is a new open standard for high-performance, modular instrumentation, and incorporates the best features of other modular formats including VXIbus, LXI and PXI. Keysight has designed a new line of scalable chassis in this new format. Along with controller options, these new AXIe chassis will form the basis of a high-performance, AXIe-based test system.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Bare Board Tester
1232
High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices. The 1232 is a bare board tester that utilizes the full range of Hioki’s in-circuit testing technologies to deliver LSI reliability testing, complex component separation testing, high continuity and insulation testing, and more. (Double-sided alignment) Testable board dimensions: 50 × 50 to 330 × 330 mm (including clamp area) • Support for build-up boards that require resistance guarantees.
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PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 470Ω
50-298-014
The 50-298-014 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 470Ω with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Flying Prober Test
QTOUCH1202C
Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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PXI-2567 , 64-Channel PXI Relay Driver Module
778572-67
64-Channel PXI Relay Driver Module—The PXI‑2567 is an external relay driver that works with internal or external power sources. The PXI‑2567 allows you to control relays when the current and voltage requirements for those relays exceed the capabilities found in existing relay modules or for relays embedded in a test system. The PXI‑2567 includes overcurrent, overvoltage, and flyback protection to ensure long-life operation. The PXI‑2567 can also drive small DC motors or other inductive relay coils.
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Power mixed test system
Power device or module with which are digitally controlled and memory can be measured per system.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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PXIe-2540, 350 MHz, 8x9 PXI RF Matrix Switch Module
780587-40
PXIe, 350 MHz, 8x9 PXI RF Matrix Switch Module—The PXIe‑2540 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXIe‑2540 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers.
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ICT: In-Circuit Testing
XILS In-Line Handling Solutions
Designed to cover a large number of test points, with long panels for future expansion, the XILS series of Handlers, PCB test systems in the line of EIIT - Innovative Engineering Solutions, is ready for the most demanding applications.
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Stationary Circuit Breaker Test System
ACTAS C160
Stationary test system for carrying out fully automatic final factory tests, type and function tests on all kinds of switchgear devices, such as circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit. All the electrical and mechanical parameters needed for the assessment of switching performance are measured in real time and evaluated without either the main contact chambers or the drive unit having to be opened. The system has analog and incremental input channels for the acquisition of analog quantities.
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PCI High Density Pecision Resistor Card, 9-Channel, 2.5Ω To 472Ω
50-298-020
The 50-298-020 is a high density programmable resistor card with 9 channels which can be set between 2.5Ω and 472Ω with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Torque Instruments
Advanced Force & Torque Indicator
Used with a range of 'plug and play' torque and force sensors - ideal for 'static' or 'dynamic' (rotary) torque measurementCan be used as part of a Mecmesin test system or mounted to one of your own test rigs
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Positioning Test System
TS-LBS
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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802.11ad & ay (WiGig) Test System
IQgig-IF
When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Flying Probe Tester
FA1817
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Database API
Woodcreeper
LXinstruments Woodcreeper provides a convenient database API for our MySQL test database. It allows manipulation of the database from within the test sequence, for instance when data from upstream process steps needs to be accessed. Third party test systems can also be easily linked to the LXinstruments test database. One license for Woodcreeper comes with the TSCOE4 system license; standalone licenses are also available.
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PXI Precision Resistor Module 4-Channel, 2 to 52.4k
40-297-133
This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI System for LRU Test
ARINC 629
PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
