Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Sound Level Meter, 30 dB, 130 dB, 1.4 dB, 0.1 dB, 0 °C, 40 °C
MP780905
Digital sound level meter with USB interface. It is perfect for sound system testing, speaker system measurement and environmental noise level monitoring. This is designed to meet the measurement requirements of safety engineers, health, industrial safety offices and sound quality control in various environments.
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PMC Carrier Module
DP-VME-5114
DP-VME-5114 is a VME-Based PMC Carrier Module. This 6U VME board PMC carrier can accommodate two PMCs. This board can be used for data acquisition, automated testing and checkout systems
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LED Driver Automatic Test System
ATE-2
•This system includes 2 groups (left and right); the 2 groups can work in turn, so that to improve the work efficiency. For example, if the left is on working, then the right can make wire connection. •It can test 4 LED drivers input and output at one time. •The equipment can connect with electronic load and LED load, the two difference loads can be fast switch under the control of computer. •Enable to print out the series number and parameters of sub-quality products by working with a micro-printer, •Enable to achieve the bar-code record function by working with a bar-code scanner. •The test report can be saved as Excel file for consult, statistic and analysis purpose. •Good software interface to freely choose the difference parameters combination, so that to meet different demands. All the parameters can set limit, and with the quality analysis function.
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Receiver, 9025, 25 Module, EMI Gasket
310104431
The 25 Module Receiver is a rugged system devised to accommodate medium I/O. With high contact point availability, the 25 Module Receiver is suited for larger test and measurement systems. This 9025 offers a gasket for EMI applications.
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Servopulser Control Unit
4890 Controller
The 4890 32-bit digital controller incorporates a high-speed DSP, high-resolution A/D converter and high-performance processor. Its features include 2-degree-of-freedom PID control, auto-tuning and realtime gain adjustment developed especially for testing systems. The combination of these features both heighten control precision and dramatically improve ease of use compared with existing controller models. A variety of tests can be easily performed by using the Windows-based GLUON software which offers comprehensive customization wizards.
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Test Tables / System Solutions
WEETECH, as a manufacturer of test equipment, offers its customers also a "Ready To Use" test system solution. It consists of the test table, the customer-specific adaptation as well as the test device, and is very quickly ready for use at the customer's site. According to the customer's requirements, the set-up is designed as a system with permanently installed adaptations for the production of constant cable harnesses in large quantities or with interchangeable adapters for the flexible production of different cable harnesses. Depending on the application, a larger table version or a smaller desk version is available. Various interfaces are available for integrating these solutions into a complete production automation system.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
42-878-212
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Battery and Capacitor Testers
Battery test system developed on the basis of the experience and know-how that we have amassed through implementing numerous custom-built battery evaluation systems.
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Tan Delta Test System
Precision measuring bridge is designed for determining the capacitance and dielectric dissipation factor of liquid and solid insulants, cables, capacitors, line transformers, generators, motors, bushings etc. Furthermore it can also be used for power loss measurement on shunt reactors or similar apparatus. This system is suitable for both low and high voltage measurement at line frequency. Measurement reports can be printed. This measuring equipment has been specially developed to maximise efficiency in production and quality control environments. Its outstanding accuracy also makes it suitable for laboratory and research applications.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Scienlab Measurement And Control Module
SL1064B
The Measurement & Control Module SL1064B is a rack-mount gateway for CAN- and LIN-buses with up to 6 channels. It can be used as a configurable communication interface between Scienlab Battery Test Systems and devices under test (especially their BMS) as well as additional components using CAN communication.
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Automated Bench Test Equipment
The Automated Bench Test Equipment (BTE) provides a combination of automatically sequenced and manually selected electrical or electro-mechcanical stimulation to an electronic or electro-mechanical unit under test. The system simulates the normal and threshold operational ranges of each of the inputs and communication channels of the unit under test.
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Application-Specific Test Systems & Components
Ease system integration with Keysight System products and services. You can be sure you´re getting outstanding system-ready instruments, open software, and PC-standard I/O that give you the freedom to choose the best tools for your test, and the assurance that they´ll work together, every time.
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FPGA PXI High-Performance Digital I/O Card
GX3702
The GX3702 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3702 is supplied with an integral expansion board providing access to the FPGA's 160 I/Os and is pin for pin compatible with the NI PXI 7813R and 7811R FPGA cards . Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Gas-insulated AC Test System
Yangzhou Power Electric Co., Ltd
The test system is used to do AC voltage withstand test and PD measurement for high voltage insulation products, combined electrical equipment, instrument transformers, etc.
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Vector Signal Generator
MGKS
The MGKS vector signal generator is designed to reproduce arbitrary waveforms, as well as sinusoidal signals with amplitude, frequency, phase modulation or without modulation. The generator can be used for research, tuning and testing of systems and devices used in radio electronics, automation, computing and measuring technology, instrument making.
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Evaluation and Data Mining
Magpie
LXinstruments Magpie is a user-friendly evaluation and data mining application for our test database. The data to be evaluated can be preselected via complex, easily configurable filters. Based on the selected data, it is then possible to create reports and perform statistical evaluations as well as machine capability analyses. The graphical GUI supports easy administration of the database by authorized users.The LXinstruments Magpie evaluation licenses are always linked to the data source, which would generally mean a test system. The test data generated by the test system will be marked as available for evaluation while it is stored in the database.
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Double Lift Zero-distance Drop Test System
KRD42 series
KRD42 series double lift zero drop tester is mainly suitable for large size packaging products to resist drop impact performance, its powerful power system and unique sample support for easy loading and unloading of oversized, overweight items, and automatically rise to the set height, complete the drop test.
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5G Carrier Acceptance Test System
NetOp
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 102kΩ
50-298-140
The 50-298-140 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Safety Chamber, Hydrostatic Test
9901HTX-72x24x12
The 6 ft wide by 2 ft deep Hydrostatic Test Safety Chamber, when combined with one of our pump systems, provides a complete hydrostatic test system for testing hose and assemblies or other components requiring pressure testing.
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PXI High Density Precision Resistor Module, 3-Channel, 4Ω to 11.4MΩ
40-298-153
The 40-298-153 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 11.4MΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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DC Power Supplies
XG 850
AMETEK Programmable Power, Inc.
The Sorensen XG Series is an 850 Watt, 1U half-rack DC power supply. The XG Series is the new standard for powerful, programmable DC power systems. Designed for test, production, laboratory, OEM and quality assurance applications, the XG Series provides a wealth of features to ensure accuracy and greater efficiency. It puts clean, reliable power at your disposal and delivers stable, variable output voltage and current for a broad range of development, test and system requirements.
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3U Rackmount Appliance for PCI Express® Gen4
R300-G4
Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols, such as PCIe, SAS, and SATA.
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Flexible KRT Relay Testing Software Support
ISO9001
KINGSINE Electric Automation Co., Ltd.
Kingsine relay testing system V2 is the newest relay testing system which developed by kingsine Electric Automation Co., LTD. It is the professional software platform customized for power plant, transformer substation , protection realy producer and other related enterprises through our long-term R & D accumulation and practice and intergrated the newest technic and design concept from world-wide.
