Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Drop Testers
This process is vital for ensuring that products travel to customers safely and securely, eventually arriving damage free. In turn, drop test systems help companies save money and maintain positive brand-owner reputations by helping to design packaged products that will deliver products with their intended inherent quality intact. Lansmont Drop Test Systems are the gold standard for accurate and repeatable drop testing. Every drop tester we manufacture is factory-tested to ensure it meets flatness-of-drop requirements and exceeds industry specifications.
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C-Mic Testing System
BK3010
The BaKo BK3010 is our main C-Mic tester. It's small enough to carry under your arm and with a test time of under 0.5 seconds, it tests as fast as you can connect a microphone. Setting up the specifications is so easy and intuitive, we based the BK3012 D-Mic Tester on it. It is also the model for our BK9010B Fully Automatic C-mic Tester.
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Dynamically Controlled High Speed Digital I/O PXI Card
GX5050
The GX5050 is a high speed Dynamic Digital I/O card that provides a full set of features that is comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GC5050, but the GX5050 is a PXI card (6U) and the GC5050 is a PCI card. Both have the ability to operate independently of the host computer when in RUN mode.
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2M E1/Datacom Transmission Analyzers
GQ-4300D Series
Shenzhen Guoqin Technology Co., Ltd
GQ-4300D Series 2M E1/Datacom Transmission Analyzers is mainly used for measuring of the error rate of data communication and for the analysis of line fault and causes, and very suitable for the parameter measurement and routine maintenance testing of 2M system, N×64K communication channels
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PXI 5W Programmable Resistor Module, 1-Channel, 1.5Ω to 925Ω
40-252-121
The 40-252-121 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 925Ω with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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VCS
Test Specimen Parameters
a program from the scope of ZETLAB VIBRO software suite. The update of the software suite ZETLAB VIBRO includes a new user-friendly interface as well as a wide range of new functions, allowing the user to configure parameters of the vibration test system with the maximal possible prevention of errors occurrence.
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Radio Frequency, Communications, & Navigation Test Systems
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 2.5Ω to 102kΩ
40-251-140
The 40-251-140 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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ESI Test Jig
MS 1543
This Test System designed to test the analog, discrete, Ethernet, RS232, RS422, Synchro /Resolver and SPI Signals. It is standalone test equipment and has GUI ATP Software interface with laptop/PC through RS232/Ethernet Interface.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Multiple Module Serial Bus Test Instrument
Bi4-Series
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-02
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 1.81kΩ
40-251-022
The 40-251-022 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 10W Programmable Resistor Module, 1-Channel, 2Ω to 13.6kΩ
40-253-031
The 40-253-031 is a programmable resistor module with 1 channel which can be set between 2Ω and 13.6kΩ with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Software Drivers and Application Software Packages
In test system development, the best hardware is only usable if its software control environment is robust and easy-to-use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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PXI 5W Programmable Resistor Module, 2-Channel, 2Ω to 26.7kΩ
40-252-032
The 40-252-032 is a programmable resistor module with 2 channels which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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1.0 mm Female to Circuit Card Launch, DC to 110 GHz
11923A
The Keysight 11923A 1.0 mm female connector launch is designed to thread into a package or fixture housing to transition a microwave circuit from microstrip to coaxial connector. The Keysight 11923A connector launch is intended for use with 110 GHz test systems such as the Keysight 8510XF. The Keysight 11923A comes pre-assembled, but the user is responsible for machining the package and installing the connector. The procedure describing the necessary geometry for the package and installation will be provided.
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Drive Controller Function Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Load Frames
Multiaxial
MTS multiaxial load frames deliver all of these advantages. Engineered for superior performance in a range of testing applications, these systems represent decades of industry expertise. They include a variety of servohydraulic load frame configurations that apply force along multiple axes simultaneously, replicating real-world materials and component service conditions with absolute precision and accuracy.
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6-Slot LXI/USB Modular Chassis
60-106-001
Pickering Interfaces’ 60-106-001 modular LXI/USB chassis occupies only a small, 1U rack-height form factor, making it suitable for portable and space-restricted rack-mount applications. The chassis features remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment.This chassis is also available with built-in scan list sequencing and triggering (model 60-106-002).
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Vibration Test System
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Vibration Test System is a simulation of the various environments encountered in the manufacturing, assembly, transportation and use phases of execution. It is primarily used to identify the ability of a product to withstand environmental vibrations.
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Flying Prober Test
QTOUCH1202C
Qmax Test Technologies Pvt. Ltd.
he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.
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200KHz AUTOMATIC TRANSFORMER TEST SYSTEM
VE2729XAU
Its a Microprocessor Based 200KHz Automatic Transformer Tester with inbuilt 20 Pin Channel Scanner for Automatic Switching and Testing Coils & Transformers (Ferrite) with Max. 20 PINS. Test Parameters : -> Inductance (L)-> Leakage Inductance (Lk)-> Capacitance (C)-> DC Resistance (Rdc)-> AC Resistance (Rac)-> Turns Ratio with Winding Polaity-> Quality Factor (Q)-> Impedance (Z)
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Functional Testing
Whatever your functional testing requirement, whether analogue, digital, or a combination of technologies, we have a solution. With over 2500 applications delivered in this field we have a level of experience that cannot be matched. Ensure the reliability of your product with our functional testing tools. Our functional test solutions range from completely standalone applications to those matched for our FLEX range of ATE test systems. Whatever your testing needs, we will help you choose the best option for you.
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Test Solution Requirements Gathering
When we first talk to our customers about their test requirements, they generally know what they want to achieve but often do not have the detailed requirement specifications to enable us to design and build a suitable test system for them. The process of generating a detailed design specification is both time consuming and stressful, so we understand the challenges this causes.
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SIP-90-4 Test System Interface Probe
SIP-90-4
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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9075 - 75 Module Solution
VPC rack mountable receivers like the 9075 meet the standards essential to support advanced mass interconnect requirements. The 9075 receiver is designed to accept the 9025, 9050, 9050 VXI, and 9075 ITA and can be adapted to accommodate vacuum or mechanical fixturing. Connector modules can be intermixed to create custom interfaces which are ideal for functional and system testing applications.
