Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Pattern Generators
Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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Compliance Test Systems
LMG Test Suite
ZES ZIMMER Electronic Systems GmbH
The ZES ZIMMER test system LMG Test Suite tests in accordance with the currently valid version of EN 61000-3-2/-12 or EN 61000-3-3/-11 and also supports measurements per ECE R-10.4 Annex 11 (e.g. electromagnetic compatibility of vehicles). As a manufacturer of precision power measurement technology, we are represented on the international standards committee. As a result, changes in standards are immediately incorporated into our test systems.
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2100Vdc Screw Terminal Connector Board | Cable & Harness Tester
CB29H
CAMI Research Inc. (Acton, MA) announces another new board for its CableEye cable and harness testing systems. Populated with four 16-pole screw terminal blocks, the board addresses high voltage (HiPot) testing to 2100Vdc/1200Vac. Of particular interest to the harness testing market, the CB29H is also available as a transition board variant (CB29AH). The CB29H and CB29AH boards are high voltage versions of the CB29 with the high voltage traces running on inner layers to afford additional safety, and protection from contamination.
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PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 31.5Ω
40-252-110
The 40-252-110 is a programmable resistor module with 2 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 239Ω
40-251-113
The 40-251-113 is a programmable resistor module with 4 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Load Frames
Multiaxial
MTS multiaxial load frames deliver all of these advantages. Engineered for superior performance in a range of testing applications, these systems represent decades of industry expertise. They include a variety of servohydraulic load frame configurations that apply force along multiple axes simultaneously, replicating real-world materials and component service conditions with absolute precision and accuracy.
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LCZ LCR Meter
SS1063
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.
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Auxiliary
To complement our main battery test equipment systems, Arbin Instruments also offers a full complement of auxiliary modules to address further testing requirements. These modules expand testing capability beyond the main charge/discharge control circuitry and can be placed in either the main chassis or a small external chassis, making it easy to add auxiliary options to your existing systems.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Sound Level Test System
In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Test System
NFC Xplorer
The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Direct Digital Synthesizer (DDS)
Corech’s Direct Digital Synthesizer series offers 0.001Hz frequency step and 0dBm to +10dBm output power. These cost competitive, rugged and compact module are the ideal choice for RF & Microwave systems such as communication systems, test and measurement equipment, radar systems etc.
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Multiport Coaxial Switch, DC to 4 GHz, SP6T
87106A
The Keysight 87106A multiport switch improves insertion loss repeatability and isolation, which is necessary for higher performance test systems. The repeatability and reliability of this switch is vital to ATS measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. The Keysight 87106A terminated multiport switch provides the long life and reliability required for automated test and measurement, signal monitoring, and routing applications. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications. Low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy.
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Brake Test Systems
GIANT 9000 Series
The major test target is to detect noise and vibrations generated by the vehicles brake. Our intention was to build a dynamometer that can operate either with brakes mounted to the complete vehicle, or with just the axle module mounted to a universal adaptor system or wheel suspensions.
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Battery Pack BMS Test Equipment
WA-BMS-3NE
Xiamen WinAck Battery Technology Co., Ltd.
The battery BMS test system can be applied to the integrated test of 1S~100S power lithium-ionbattery pack BMS with LMU and BMCU modules, such as the BMS performance andHILL test.
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Automatic Transformer Test System
TH2829AX-24
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 24 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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PCIe Compliance Testing
Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 4.0 and PCIe 5.0 specification. This solution combines a Summit Z58 or Summit Z516 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 4.0 and PCI Express 5.0 Link and Transaction Layer Compliance Testing.
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Semiconductor Test Platform
PAx
PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.
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Battery Formation and Testing System
BFS 2000
BENNING Elektrotechnik und Elektronik GmbH
For many decades now, BENNING has designed and manufactured charge/discharge converters for the battery industry. These converters are used in both the production and testing processes involved in battery manufacturing and for series-testing of batteries. BENNING's BFS battery production and testing system provides a solution which makes it easier to control and monitor production and test processes which saves both time and energy. When used in power stations and rail applications (mobile version), it can be used to test and maintain a wide range of battery types.
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In-Circuit Testers
SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Adapter
EXC-1553UNET/Px(S)
The EXC-1553UNET/Px is an intelligent, single - or - dual channel, MIL-STD-1553 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1553 bus, both in the lab and in the field.The EXC-1553UNET/Px shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.
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TTESync For VxWorks 653
TTESync is a synchronization component that allows tight synchronization of VxWorks 653 partitions to the fault-tolerant system-wide cycle time of the TTEthernet communication network. All partitions executed on different modules can be “pinned down” within the overall system cycle time, thus enabling the lowest latency and minimum jitter in message exchange among distributed functions. At system level this results in clean layering, well-understood functional interactions and simpler application design, testing and system integration. System architects can reduce system complexity and further optimize system size, weight, power (SWaP) and life-cycle costs.
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Bump Test Machine
Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
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Test System
Maynuo Electronic Co.,Ltd a professional R & D and production of programmable DC electronic loads, programmable DC power supply, high power load, power supply, AC power supply, power supply, such as testing high-performance mobile phone test equipment and facilities, as well as electrical, electronic, aerospace, military, chemical, automotive, battery charger, battery, solar cell production lines and other industries to provide automated testing program. The company has many years experience in a number of outstanding technical R & D, product innovation by the majority of users. We are committed to provide users with more accurate and more stable more easily accessible to the higher cost of test instruments, to create the industry in testing the influence of an international brand of excellence.
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PCI High Density Pecision Resistor Card, 6-Channel, 3.5Ω To 773kΩ
50-298-043
The 50-298-043 is a high density programmable resistor card with 6 channels which can be set between 3.5Ω and 773kΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 201kΩ
40-298-141
The 40-298-141 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 201kΩ with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Fiber Optical Switch Tray To 16x16 Ports
SERIES 6000 MULTIMODE
The Series 6000 Multimode switch is designed to meet the needs of the most demanding component, subsystem and system test applications. All-optical switching allows test equipment connections to be fully automated and controlled remotely 24/7 via software from virtually anywhere in the world.
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Semiconductor Test
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
