Fine Pitch Double Plunger Probe FP380D2901P025U023L032

Fine Pitch Double Plunger Probe FP380D2901P025U023L032

The Fine Pitch Double Plunger Probe FP380D2901P025U023L032 (item number 1127921) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP380D2901P025U023L032 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D2901P025U023L032, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D2901P025U023L032 includes pitch 0.5 mm / 20 mil, spring force 23 cN, continuous current 1.4 A.

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