Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Probing Adaptors
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Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
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Product
Probing & Analysis Adapters
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No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Probing Machines
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Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Product
Magnetic Probing Systems
MPS-C-300 and MPS-C-350
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MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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CMM Contact Measurement (Probing)
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A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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Probing, Monitoring & Setting
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Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
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Topside Probing for Functional Test Fixtures
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Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.
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Product
Stack Probing Sensor
L722
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The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
BIP-2 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 365Overall Length (mm): 9.27
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Product
High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1HF-9.6
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1T1-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4H-1
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3A
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.09 (31.00) - 4.50 (128.00) Long Travel Bead Probe
BPLT-1HL-4.5
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 155gf
K100-A080155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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Product
Standard 1.08 (31.00) - 4.00 (114.00) Long Travel Bead Probe
BPLT-25HF-4
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Standard 1.68 (48.00) - 3.20 (91.00) General Purpose Probe
HPA-52T
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72I8-7
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Standard - 1.44 (41.00 - 4.50 (128.00) High Current Probe
HCP-13H
High Current Probe
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4H
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72H-8
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72I40-4
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1UN-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 1.80 (51.00) - 12.60 (357.00) Switch Probe
TSP138-FK300-3
Switch Probe
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70
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Standard 1.68 (48.00) - 3.20 (91.00) General Purpose Probe
HPA-52B
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4H-2
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Power Rail Probe, 6 GHz
N7024A
Oscilloscope Probe
The N7024A power rail probe is for users making power integrity measurements that need mV sensitivity when measuring noise, ripple and transients on their DC power rails. The probe is designed for measuring periodic and random disturbances (PARD), static and dynamic load response, programmable power rail response, and similar power integrity measurements. Many of today’s products have tighter tolerances on their DC power rails than the previous generations of these products, and the N7024A power rail probe is designed to help users ensure their products meet these tighter tolerances.
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Product
UHF True RMS Probe
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The UHF True RMS Probe is a frequency compensated power probe capable of measuring power even in a multiple carrier installation. Regardless of physical waveform, the probe will measure the True RMS power of the signal. When used together with our Broadcast Power Monitor type 3024, you can add Web and SNMP capabilities to your mast site installation.
