Fine Pitch
Fine Pitch Probes range from 0.25 mm to 0.50 mm pitch. They are suitable for sockets and contactors with high pin count.
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Product
Narrow (Fine) Pitch Connectors
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Panasonic Industrial Devices Sales Company of America
Panasonic’s industry leading “tough contact” design provides customers with the reliability that is required when developing the latest computer or wearable device. Our Narrow (Fine) Pitch Connectors line-up includes both Board-to-Board and Board-to-FPC options. Backed by our staff of technical engineers, Panasonic offers a full “hands on” solution from designing-in assistance to manufacturing. Discover how Panasonic Narrow Pitch Connectors can elevate your applications.
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Product
Fine Pitch Probe FP380D0301B025P023L032
1151224
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The FP380D0301B025P023L032 is a cutting-edge Double Plunger Probe engineered for flexible applications, ensuring high performance across a diverse range of operational conditions. With a remarkable temperature tolerance ranging from -45°C to +120°C, this probe is ideal for environments that demand reliable and precise measurements. Its innovative design allows for adaptability, making it a valuable component in various industrial solutions.
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Product
Fine Pitch Probes FP280D1101P013U025L054
1087982
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The FP280D1101P013U025L054 Fine Pitch Probes are designed for precision applications where space is limited. With a pitch of just 0.35 mm (14 mil), these double plunger probes cater perfectly to demanding electronic testing environments. Suitable for temperatures ranging from -45°C to +120°C, they ensure reliable performance across diverse conditions. The unique design features a palladium-plated plunger and gold-plated barrel, combining durability with excellent conductivity, suitable for high-frequency operations up to 11.5 GHz.
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Product
Fine Pitch Probes (300µm - 500µm) FP380D2903B022G024L057
1127689
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The Fine Pitch Probes (300µm - 500µm) FP380D2903B022G024L057 is an advanced solution designed for high-precision applications in electronic test and measurement. With its double plunger probe design, it achieves a pitch of 0.50 mm (20 mil), making it ideal for densely packed circuitry. This probe operates efficiently within a temperature range of -45°C to +150°C, ensuring reliability across various environments.
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Product
Fine Pitch Probes (< 300µm) FP280D0301P013U030L057
1030726
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The Fine Pitch Probes (Model: FP280D0301P013U030L057) are specially designed for high precision applications, boasting a double plunger probe design that ensures reliable performance. With a pitch of just 0.35 mm (14 mil), these probes are optimized for use in environments ranging from -45°C to +120°C, making them versatile for various operational requirements. Their advanced engineering provides notable stability in contact resistance, typically measuring at 100 mOhm, even at a continuous current of 1.5 A, proving essential for maintaining signal integrity in demanding conditions.
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Product
Fine Pitch Probes (300µm - 500µm) FP380D0101B027L050L243
1003136
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The Fine Pitch Probes FP380D0101B027L050L243 are designed with precision and versatility to meet the demanding requirements of various applications. Featuring a double plunger probe design with a pitch of 0.50 mm (20 mil), these probes operate effectively in temperatures ranging from -45°C to +100°C. The mechanical specifications ensure reliability, with a preload of 10 cN and a spring force of 50 cN, providing a nominal travel of 2 mm and a maximum travel of 2.50 mm, while maintaining a pointing accuracy of +/- 0.04 mm.
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Product
Fine Pitch Probes (< 300µm) FP260D0301B014G025L072
1023003
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The Fine Pitch Probes (FP260D0301B014G025L072) are designed for precision and reliability in various electronic applications. This specific model features a double plunger probe design that allows for a pitch of 0.35 mm, making it suitable for ultra-fine pitch connections in dense electronic configurations. It operates effectively within a temperature range from -45°C to +150°C, ensuring stability across environments. The robust construction includes beryllium copper for the plunger material and incorporates gold plating, enhancing conductivity and durability.
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Product
Fine Pitch Probes (> 500 Μm) FP580D2929B030G060L058NM
1028445
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The Fine Pitch Probes FP580D2929B030G060L058NM represent a sophisticated solution for precision applications requiring meticulous electrical connectivity. Designed with a double plunger probe configuration, these probes excel in environments demanding reliability and durability. Operating effectively across a broad temperature range from -45°C to +150°C, they maintain optimal performance even under extreme conditions. The unique design philosophy emphasizes both functionality and accuracy, making these probes an essential tool for advanced testing and assembly tasks.
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Product
Fine Pitch Probes FP480S01B034G050L158
1001399
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The Fine Pitch Probes (300µm - 500µm) FP480S01B034G050L158 is a high-performance basic contact probe designed for precision applications. With a pitch of 1.00 mm (39 mil), this probe operates within a temperature range of -45°C to +100°C, making it suitable for a variety of environmental conditions. Its robust design features a total length of 15.80 mm and a projection height of 4.00 mm, ensuring ease of use in tight spaces while maintaining accuracy and reliability.
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Product
Fine Pitch Double Plunder Probe FP200D2901P012U014L037
1030191
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The Fine Pitch Double Plunger Probe FP200D2901P012U014L037 (item number 1030191) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP200D2901P012U014L037 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200D2901P012U014L037, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.3 mm / 12 mil, spring force 14 cN, continuous current 0.7 A.
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Product
Fine Pitch Probe FP380D2903P022U024L057
1127686
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The FP380D2903P022U024L057 fine pitch probe is designed for precision applications, accommodating pitches between 300µm to 500µm with exceptional reliability. This probe, falling under the FP-D family, is engineered to endure harsh environments, featuring an operational temperature range of -45°C to +150°C. Its double plunger design ensures consistent contact, making it suitable for high-frequency applications up to 16.7GHz while maintaining a low contact resistance of just 120mOhm.
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Product
Fine Pitch Probes (< 300µm) FP200D2901B010G017L037
1023129
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The Fine Pitch Probes (FP200D2901B010G017L037) are expertly engineered to cater to precise applications requiring a pitch of less than 300µm. Housed within the FP-D family, these double plunger probes are capable of operating efficiently across a wide temperature range from -45°C to +120°C, ensuring reliable performance in various environments. With dimensions meticulously defined, they feature a total length of only 3.70 mm and a fine tip style diameter of 0.10 mm, making them ideal for crowded circuits where precision is crucial.
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Product
Fine Pitch Probes (300µm - 500µm) FP300D2901B015G030L057
1023005
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The Fine Pitch Probes (300µm - 500µm) FP300D2901B015G030L057 represent a sophisticated solution designed for high-precision applications in electronics testing and assembly. With a double plunger probe configuration, these probes are engineered for flexibility and high temperature resilience, operating efficiently within a temperature range of -45°C to +120°C. The compact design features a pitch of 0.40mm (16 mil), making it ideal for densely packed circuitry. The advanced materials utilized, including beryllium copper for the plunger and nickel plating for the barrel, ensure durability and reliable performance even under rigorous testing conditions.
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Product
Fine Pitch Probes (< 300µm) FP280D2903P016U020L057
1081003
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The Fine Pitch Probes (FP280D2903P016U020L057) are meticulously designed for high precision applications, characterized by their unique double plunger design and family classification FP-D. These probes boast a pitch measurement of just 0.35 mm (14 mils), providing exceptional fine-tuned performance essential in modern electronic assembly techniques. Capable of operating over a wide temperature range of -45°C to +150°C, these probes ensure reliability across various environmental conditions. Their robust construction, featuring high-grade steel for the spring and palladium for the plunger, ensures durability while maintaining optimal performance even under continuous use.
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Product
Fine Pitch Probes (300µm - 500µm) FP380D1111B027L050L243
1003137
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The Fine Pitch Probes (300µm - 500µm) FP380D1111B027L050L243 represent a significant advancement in precision probing technology, designed to meet the stringent requirements of modern electronics testing. This innovative double plunger probe falls within the FP-D family, featuring a compact pitch of 0.50 mm (20 mils) which is essential for accessing densely packed circuitry. Capable of operating in temperatures ranging from -45°C to +100°C, these probes provide versatility and reliability under varying conditions.
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Product
Fine Pitch Probes (300µm - 500µm) FP350D2901B021G020L069
1023459
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Introducing the Fine Pitch Probes FP350D2901B021G020L069, a crucial component for advanced electrical applications. These double plunger probes, with a pitch of just 0.50 mm (20 mil), are designed to withstand a wide temperature range from -45°C to +150°C, making them adaptable for various environments. Their precision engineering ensures remarkable performance with a typical contact resistance of just 66 mOhm and the capability to handle continuous currents of up to 2.00 A. With a maximum travel of 0.75 mm, these probes provide excellent contact stability, essential for high-frequency applications up to 25.3 GHz.
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Product
Fine Pitch Probes (300µm - 500µm) FP380D0103B022G024L057
1127691
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The Fine Pitch Probes (300µm - 500µm) FP380D0103B022G024L057 is specially designed for precision connectivity, offering a unique double plunger probe configuration ideal for high-frequency testing applications up to 16.7 GHz. Engineered within a temperature range of -45°C to +150°C, these probes ensure reliability and performance across a variety of environments. The FP-D family emphasizes seamless integration with devices that require a pitch of only 0.50 mm (20 mil), making them suitable for fine-pitch applications where space is at a premium.
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Product
Fine Pitch Probes (> 500 Μm) FP680D1111S036L085L245
1035970
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The Fine Pitch Probes (> 500 µm) FP680D1111S036L085L245 are designed with utmost precision and reliability in mind. This double plunger probe features a family designation of FP-D and supports a pitch of 0.80 mm (31 mils), making it ideal for various high-performance electrical applications. Operating within a temperature range of -45°C to +100°C, these probes are engineered for durability and sustained functionality under diverse environmental conditions.
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Product
Fine Pitch Double Plunger Probe FP580D0329B030G020L059
1003844
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The Fine Pitch Double Plunger Probe FP580D0329B030G020L059 (item number 1003844) is designed for precise contacting where installation space is limited. Tip style 03 (Conical 60°) targets FP580D0329B030G020L059 at solder pads and vias at small pitches; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP580D0329B030G020L059, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.75 mm / 30 mil, spring force 20 cN, continuous current 3.5 A.
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Product
Fine Pitch Probes (> 500 Μm) FP800D0301B050G025L057
1130443
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The Fine Pitch Probes model FP800D0301B050G025L057 is engineered for high precision and reliability in demanding applications. With a double plunger design that allows for effective and stable contact, these probes are suitable for complex testing scenarios. They achieve a pitch of 1.00 mm (39 mil) and can operate in a temperature range from -45°C to +150°C, making them versatile for various environments. Their ability to sustain continuous current of 3.50 A and maintain a low contact resistance of 55.00 mOhm at a frequency of 7.10 GHz ensures that they perform exceptionally under rigorous conditions, providing precise data acquisition.
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Product
Fine Pitch Probes (300µm - 500µm) FP380D2901P019U030L087
1024574
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The Fine Pitch Probes (300µm - 500µm) FP380D2901P019U030L087 are precision devices designed for high-performance applications, ensuring reliable electrical connections in tight spaces. These double plunger probes feature a pitch of just 0.50 mm (20 mil), making them ideal for advanced circuitry while withstanding a wide temperature range from -45°C to +150°C. The efficient design accommodates continuous currents of up to 2.10 A with a typical contact resistance of only 120 mOhm, providing excellent conductivity for high-frequency operations, boasting a frequency capability of 6.10 GHz.
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Product
Fine Pitch Probes (> 500 Μm) FP510D0101B035G050L166
1001356
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The Fine Pitch Probes FP510D0101B035G050L166 are designed with precision and reliability at the forefront, making them an essential choice for companies requiring high-performance testing solutions. Engineered with a double plunger probe design, these probes feature a pitch of 0.70 mm (28 mil), allowing for meticulous connections in tight configurations. The probes operate efficiently across a wide temperature range from -45°C to +100°C, ensuring adaptability in various environmental conditions.
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Product
Fine Pitch Probes (< 300µm) FP280D2901B013G015L057
1031134
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The Fine Pitch Probes (FP280D2901B013G015L057) are designed to meet high-performance standards with exceptional precision, making them an ideal choice for various electronic applications. These Double Plunger Probes, categorized under the FP-D family, feature a compact pitch of 0.35 mm (14 mil), enabling efficient connections in tight spaces. With a resilient operational temperature range from -45°C to +150°C, these probes guarantee reliable performance across diverse environments. The combination of Beryllium copper and bronze materials ensures durability while maintaining optimal conductivity, enhanced by gold plating for superior reliability.
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Product
Fine Pitch & Interface Solutions
1147211
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Fine Pitch & Interface Solutions by FEINMETALL represent the pinnacle of reliability and precision in electronic component testing. With a focus on fine pitch probes available in various pitch sizes from 0.11 mm to over 0.50 mm, these solutions cater to a wide range of applications. The experience gained over more than 60 years in test engineering ensures that FEINMETALL constantly meets the high demands of the high-tech industry, providing tailored solutions for board tests, wire harness checks, and high-current applications.
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Product
Fine Pitch Connector Test
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C.C.P. Contact Probes Co., LTD.
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.
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Product
Fine Pitch Probe FP580D1629B030G040L059
1001489
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The FP580D1629B030G040L059 probe is engineered with precision for high-performance applications, featuring a fine pitch design that is especially effective for interfacing with devices requiring contact points greater than 500 µm. This double plunger probe, part of the FP-D family, ensures excellent connectivity across various environments, supporting temperatures ranging from -45°C to +100°C, making it suitable for both demanding industrial and delicate electronic contexts.
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Product
Fine Pitch Probe H750DR
1001694
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The H750DR Fine Pitch Probe is designed for precision applications, catering to the needs of engineers and technicians who require reliable connections in compact areas. With a total length of 9.00 mm and a collar height of only 0.50 mm, this probe maintains a minimal footprint while delivering optimal performance. The robust construction includes an insulated Cu-Wire with a red coating, measuring 1x0.25 (AWG30) and offering an impressive insulation range from -100°C to +150°C, ensuring functionality in extreme conditions. The probe's specific designs also feature a press ring diameter of 0.52 mm and an outer diameter of 0.70 mm, highlighting its meticulous engineering for fine pitch applications exceeding 500 µm.
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Product
Fine Pitch Probes FP800D2901B050G025L057
1130428
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The Fine Pitch Probes FP800D2901B050G025L057 are engineered for precision applications requiring outstanding reliability and performance across various temperature ranges. Designed within the FP-D family, these double plunger probes are optimal for tight pitch applications, featuring a pitch measurement of 1.00 mm / 39 mils, and are capable of operating effectively from -45°C to +200°C. Their compact design, with an overall length of 5.70 mm and a projection height of just 1.10 mm, makes them suitable for use in high-density electronic assemblies where space is a critical factor.
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Product
Fine Pitch Probe FP590D0303S038G035L087
1023461
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The FP590D0303S038G035L087 Fine Pitch Probe is expertly designed for high-precision applications, featuring a double plunger mechanism that ensures reliable performance in varied environments. With a pitch of 0.80 mm (31 mil), this probe is optimized for effective contact in tightly spaced configurations. Its operational temperature range spans from -45°C to +150°C, making it ideal for demanding industrial conditions that require durability and stability.
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Product
Fine Pitch Probes (300µm - 500µm) FP480S18B034G050L158
1001400
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The Fine Pitch Probes (300µm - 500µm) FP480S18B034G050L158 are meticulously designed basic contact probes that prove essential for high-precision applications. Operating within an extreme temperature range of -45°C to +100°C, these probes are optimized for stability and reliability in varied environmental conditions. They possess a family designation of FP-S, featuring a 1.00 mm pitch that allows for efficient and reliable micro connections. The probe showcases excellent mechanical properties with a preload specification of 15 cN, ensuring a robust and stable contact during use. The electrical specifications highlight a continuous current capability of 1.00 A and a typical contact resistance of just 65 mOhm, confirming these probes' suitability for demanding electrical applications. Mechanical features further include a nominal travel of 2.00 mm, with maximum travel reaching up to 2.30 mm and a pointing accuracy of +/- 0.05 mm, making these probes ideal for tasks requiring precise measurements. The carefully selected materials, such as Beryllium copper for the plunger and gold plating for superior conductivity, ensure longevity and optimal performance. With a total length of 15.80 mm and a tip style diameter of just 0.34 mm, these probes are compact yet powerful, designed for advanced technological settings.
