Semiconductor Test
prevails upon the DUT to demonstrate It's fulfillment of test requirements.
See Also: ATE
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Product
Semiconductor Test
Ismeca NY32
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32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
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Semiconductor Test Platform
Diamondx DxV
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The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:
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Semiconductor Test Equipment
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Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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Semiconductor Test
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Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Product
Semiconductor Test System
TS-960e
Test System
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Semiconductor Test & High-Speed Digital
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Rosenberger Hochfrequenztechnik GmbH & Co. KG
The wide product range means that a variety of semiconductor test applications and high-speed digital applications are possible. To meet the ever-challenging technological requirements and increasing demands of the semiconductor test equipment industry, Rosenberger has developed and produces multiport mini-coax connectors and cable assemblies – for applications up to 40 GHz – , and spring-loaded coax products. Probes and customer-specific cable assemblies are also available.
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Semiconductor Test System
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IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Semiconductor Test Services
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Tests regarding function, electrical and optoelectronical parameter. Electrical test of wafer up to 8? and packaged devices - selection and volume test.
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Semiconductor Test Equipment
IC Tester
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Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging.
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Product
Semiconductor Test Hardware Solutions
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A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Product
Semiconductor Test
Ismeca NY20
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20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as Intelligent Features that enable extended autonomous operation and productivity.
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Product
Semiconductors Testing
test
Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Test Handler
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Test Handler is an equipment that automates the final testing of semiconductor devices. It handles device transportation, controls temperature during semiconductor testing, and sorts devices based on test results.
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Wafer Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
Analog Input Module
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Product
Semiconductor
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With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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MPI Advanced Technologies & Accessories
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MPI Advanced Semiconductor Test
MPI become very fast the truly innovation leader in the Advanced Semiconductor Tests market. By offering wide range of system’s accessories and unique advanced technologies, such as Automated Test over Multiple Temperatures ATMT™, NoiseShield™, PHC™, VCE™, mDrive™, MPI is offering variety of complete test solutions at highest value.
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Semiconductor
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The semiconductor industry faces continuous pressure to reduce device size and costs while improving performance and reliability. Semiconductor, test and assembly automation manufacturers demand the same improvements from the motion technology which drives it. Haydon Kerk Pittman continues to develop new technologies in motors, lead-screws, gears, encoders, actuators, slides, drives and complete sub-systems that increase operational speeds and accuracy while lowering the cost of ownership.
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Product
Fine Pitch Double Plunder Probe FP200D2901P012U014L037
1030191
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The Fine Pitch Double Plunger Probe FP200D2901P012U014L037 (item number 1030191) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP200D2901P012U014L037 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200D2901P012U014L037, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.3 mm / 12 mil, spring force 14 cN, continuous current 0.7 A.
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Product
Pogo Tower - Advantest T2000 FROG
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The Pogo Tower - Advantest T2000 FROG is an advanced interface solution designed specifically for semiconductor applications. This modular pogo pin system allows for customization by enabling users to add or remove pin modules based on their unique requirements. With a cutting-edge, modular design, the Pogo Tower supports application-specific configurations, providing flexibility in various environments.This innovative product supports a significant capacity with up to 1,024 signal pins and 512 utility pins, accommodating a wide array of testing and interfacing needs. Its top-load clamshell solution ensures ease of use, making it a preferred choice for professionals looking for reliability and efficiency in their semiconductor testing setups. The Pogo Tower is engineered with precision to meet stringent technical standards, making it a vital component in modern semiconductor applications.
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Product
High-Density Precision SMU (100 PA, 30 V)
PZ2130A
Source Measure Unit
The Keysight PZ2130A is a high-channel density precision source / measure unit (SMU) with 5 channels per module that saves space at a low cost per channel for a wide range of applications requiring numerous precision power supplies. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2130A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2130A suitable for noise sensitive applications such as quantum computing as well.
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High Current SMU 600/1200/2400 A
AXC85xx
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Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Semiconductor Testing Equipment
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We provide you with various inspection equipment mainly for the semiconductor post-production process. Also, "inspection boards", "measurement control" and "test applications" are available for you to meet your various needs.
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Signal Generators
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2, 4 and 8 Channel Arbitrary Waveform Generator and Pulse Pattern Generator solutions are ideal choice in automated test benches, for physics experiments, semiconductor tests, analog and digital debugging.
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Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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LXI High Voltage Matrix 2-pole 200x2
60-310-202
Matrix Switch Module
The 60-310 is a 2-pole Matrix Module available in 300x2, 200x2 and 100x2 formats. It is capable of cold switching 1000VDC and has a maximum carry current of 1A. It is designed for high voltage applications including circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
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Product
Probe Card Solutions
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Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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Product
Semiconductor
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You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
