Silicon
atomic number 14 tetravalent metalloid chemical element.
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Switches-SP6T
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Thermal Neutron Detector
TN15
The TN15 high sensitivity thermal neutron detector utilizes a state-of-the-art silicon photomultiplier (SiPM) and offers world-leading specification in a compact form. The TN15 surpasses the performance of a 100mm long 13mm3 He tube at 4 atmospheres and does not need cooling but operates at room temperature.
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Spectroelectrochemical Flow Cell
SEC-2F
Using the spectroelectrochemical flow cell, it is possible to have a different optical path length changing the gasket. We offer, as an optional item, a silicon and Teflon gasket with a 100, 250 and 500 m of the thickness. SEC-2F Spectroelectrochemical flow cell was designed to fit perfectly in the SEC2000 Spectrometer, and it eliminated the use of the optical fiber to connect the Spectrometer to the SEC-2F. Even for another brand of the spectrometer, you can connect the SEC-2F using the collimating lens and optical fiber.
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Probe And Test Adaptors Set (13PCS)
3601B
Peaceful Thriving Enterprise Co Ltd
1. Extra thin test probe.2. Flexible silicone cable.3. For use in conjunction with test probe.4. Bi-color test leads for polarity indication.5. High quality testing and test accessories.
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Silicon Heavy-doped Pen Tester
HS-MPRT
Heavy doped testing, especially good for purchase the material.■ Not only sound alarm, but also Led light alarm , to guarantee sorting work accurately.■ adaptable for sorting little granular material, little broken IC Wafer and other little silicon material.■ Can set alarm ranges from 0.0 to 1.0Ω﹡㎝.
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Flying Probe Test Programming & Testing Services
Zero Defects International LLC
ZDI utilizes a Seica flying probe tester in order to provide test program development and testing services to customers in Silicon Valley and throughout North America. This is a very cost-effective solution for printed circuit assembly manufacturers who do not have in-house equipment of their own but have customers who require test services.
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Photometers & Colorimeters
Instrument Systems Optische Messtechnik GmbH
A photometer is used to measure the photometric quantities of illuminance (lx), luminous intensity (cd), luminous flux (lm), and luminance (cd/m²). The integral method and the fast response time of silicon photodiodes means that photometers can achieve an outstanding measuring speed. They are therefore ideal for performing fast goniophotometric measurements. We take great care in the development and production of photometer heads and use innovative amplifier technologies.
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High Temperature Axial Torsional Extensometers (1200 C or 1600 C)
Model 7650
Jinan Testing Equipment IE Corporation
Model 7650 extensometers are primarily used on round specimens tested in bi-axial test machines capable of simultaneous axial and torsional loading. All models are capable of bi-directional displacement in both axes and may be used for strain-controlled fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7650 models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to minimize crosstalk between axes and to provide high accuracy, high resolution measurements. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods with conical rod tips for specimen contact when testing to 1200℃(2200°F). Silicon carbide rods are used for the 1600℃ (2900°F) high temperature option.
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Automated Optical Inspection Solutions
Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system
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Digital Solutions
Digital ST60 Dual Thermopile (Preliminary)
A two channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. Each small active area size is 0.61mm x 0.61mm.
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Wideband True RMS AC Voltmeter
323
The Ballantine 323 True RMS analog ac voltmeter uses advanced true rms circuitry to achieve square law response from rugged, fast responding silicon diode detectors with no thermal lag and overload vulnerability inherent in thermocouple devices.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Probes
SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Microcontrollers (MCUs)
8-bit
An innovative 8-bit chip design provides a fully-integrated experience. Silicon Labs' 8-bit MCUs are ideal for IoT applications and beyond, delivering the industry's fastest speeds and lowest power.
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Fiber Optics
The use of fiber optics as light guidance allows great modularity and flexibility in the setup of an optical measurement system. Optical fibers can be made of many materials, such as plastic, glass, and silicates (SiO2). For high-quality fibre optics, as used in spectroscopic applications, synthetic fused silica (amorphous silicon dioxide) is used, which can be intentionally doped with trace elements to adjust the optical properties of the glass.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Light Meter
PLMT56
Light Meter Measures In LuxOver-Range IndicatorLong-Life Silicon Photo Diode InsideMeasurement Rate: 1.5 Times per SecondMax Range: 50,000 LuxAccuracy: +/- 5% Under 10000 Lux, +/- 10% Over 10000 LuxMax Resolution: 0.1 LuxDimensions: 7.40' H x 2.52' W x 0.96' DAccessories Included: 12V A23 Battery, Photo DetectorSold as : Unit
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Reference Cells For PIV-IV Systems
NREL calibrated cell used for calibration transfer.The Abet Technologies solar reference cell is a precision instrument for the determination of solar simulator irradiance levels. The sensor is a mono-crystalline silicon solar cell having an area of2x2cm(4cm).The back of the solar cell is attached to the device in such a way that a good heat transfer to the device housing is guaranteed. Below the solar cell a Pt100 RTD temperature sensor is mounted to allow monitoring of device temperature. The device is not shunted allowing the whole IV-curve to be measured. The solar cell is protected by a high quality fused silica window, assuring spectral sensitivity over a 320 -1100 nm range.
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Digital Solutions
Digital ST120 Dual Thermopile (Preliminary)
A two channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. Each small active area size is 1.2mm x 1.2mm.
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Surface & Volume Low Resistivity Meter for Conductive Materials
Loresta GP
The Loresta GX Meter is an intelligent, multi purpose low resistivity meter equipped with software that calculates resistivity correction factors. A variety of 4 pin probes are available for use with the Loresta GX. The instrument is typically used in Product Engineering, R&D, and Quality Control. Applications include measurement of conductive paint, conductive plastics, conductive rubber, conductive film, silicon wafers, antistatic materials, EMI shield materials, conductive fiber, conductive ceramics, etc.
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VIS-SWIR FPA's
Imaging electronic sensors sensitive in visible, near infrared, short wavelength infrared spectral bands that generate two dimensional electronic images have found mass applications in industry, defense, security, science, environmental protection, medicine etc. Imaging sensors sensitive only in VIS/NIR range are almost exclusively silicon chips manufactured using a series of technologies: CCD, CMOS. ICCD, EMCCD, EBAPS, sCMOS in color or monochromatic versions. Color VIS/NIR sensors are sensitive to light only in visible range when monochromatic VIS/NIR sensors are sensitive up to about 1000nm.
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Particle Metrology System
Archimedes
Archimedes is an innovative instrument which uses the technique of resonant mass measurement to detect and accurately size and count particles in the size range 50nm to 5um*. Archimedes can distinguish different species from their buoyant mass is particularly useful when characterizing proteinaceous aggregates from contaminating silicon oil in biopharmaceutical preparations, in distinguishing bubbles from lipid micelles and contaminants in ultrasound contrast agents or protein from fat in dairy products.
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Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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4-Probe Resistivity and Resistance Tester
HS-MPRT-5
t used for measuring resistivity of silicon rods and wafers, and sheet resistance of diffused layers, epitaxial layers, LTO conductive films and conductive rubbers, etc.
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Digitizers
2745 Family
The 2745 Digitizer is a 64-channel digital signal processor for radiation detectors available in VME64 (V2745), VME64X (VX2745), and Desktop (DT2745) form factor. It offers not only waveform digitization and recording but also Multi-Channel Analysis for nuclear spectroscopy using Silicon strip, segmented HPGe, Scintillation detector with PMTs, Wire Chambers, and others. The 2745 can perform pulse height measurements (PHA), constant fraction timing (CFD), charge integration (QDC) and pulse shape discrimination (PSD) independently for each of the 64 channels.
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Silicon-Microphone 8Ch Auto Test System
BK9015
Based on the BK3011 MEMS Mic Tester, the BK9015 is our fully automatic 8 channel MEMS (Silicon) mic sweep tester. Testing up to 8 DUT's simultaneously, the BK9015 can test 8 mics simultaneously and sort them according to passing grade and cause of failure! Because it uses a sweep test, it can check characteristics for the entire frequency range. Your data can be viewed in real time or stored so you can analyze problems or trends.
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High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Capacitor
Murata offers ceramic, polymer aluminum, single-layer microchip, variable, silicon, film, and various other types of capacitors.
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SiC MOSFETs
Bring the advantages of innovative wide bandgap materials (WBG) to your next design thanks to SiC MOSFETs. With an extended voltage range, from 650 to 2200 V, ST's silicon carbide MOSFETs offer one of the most advanced technology platforms featuring excellent switching performance combined with very low on-state resistance per area.
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SiC Diodes
ST’s silicon carbide diodes range from 600 to 1200 V – as single and dual diodes – and feature unbeatable reverse recovery characteristics and improved VF. Available in a wide variety of packages, from D²PAK to TO-247 and the insulated TO-220AB/AC, they offer great flexibility to designers looking for efficiency, robustness and fast time-to-market. ST’s SiC Schottky diodes show a significant power-loss reduction and are commonly used in hard-switching applications such as high-end-server and telecom power supplies, while also intended for solar inverters, motor drives and uninterruptible power supplies (UPS). ST’s automotive-grade 650 and 1200 V SiC diodes – AEC-Q101-qualified and PPAP capable – feature the lowest forward voltage drop (VF) on the market, for optimal efficiency in electric vehicle (EV) applications.
