Fine Pitch
Fine Pitch Probes range from 0.25 mm to 0.50 mm pitch. They are suitable for sockets and contactors with high pin count.
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Product
Fine Pitch Probes (> 500 Μm) FP680D0101S036L085L245
1035969
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The FP680D0101S036L085L245 is a fine pitch probe specifically designed for applications requiring high precision in contact testing, with a pitch of 0.80 mm (31 mils). This double plunger probe features an exceptional temperature tolerance ranging from -45°C to +100°C, making it suitable for a variety of environments and applications. With its robust design and specifications, the FP-D family of probes ensures reliability and accuracy, essential for today's advanced technology testing requirements.
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Product
Probe Pins
Cobra-Series
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Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
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Product
Fine Pitch Double Plunger Probe FP380D2901P025U023L032
1127921
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The Fine Pitch Double Plunger Probe FP380D2901P025U023L032 (item number 1127921) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP380D2901P025U023L032 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D2901P025U023L032, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D2901P025U023L032 includes pitch 0.5 mm / 20 mil, spring force 23 cN, continuous current 1.4 A.
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Product
Fine Pitch Probes (300µm - 500µm) H480LI
1001689
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The Fine Pitch Probes H480LI are designed for precision applications requiring a pitch of 300µm to 500µm. With a robust mechanical configuration, these probes feature a stranded wire connection type, ensuring reliability in flux-proof environments. The total length of each probe is 16.00 mm, complemented by a press ring diameter of 0.71 mm and an outer diameter of just 0.66 mm. The collar height stands at 0.30 mm, making them suitable for tight spaces and intricate assemblies.
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Fine Pitch Spring Probes
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For MARATHON series, we have ultra-fine spring probes with high quality for small lot order and in short lead time. We have product range from probe outer diameter 0.11mm.
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Product
Fine Pitch Probes (< 300µm) FP200DF7111P020U015L045
1030202
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The Fine Pitch Probes (FP200DF7111P020U015L045) are designed for precision applications requiring a compact design with exceptional performance capabilities. These double plunger probes come with a pitch measurement of just 0.30 mm (12 mil), making them ideal for high-density electrical interconnections. They operate efficiently within a wide temperature range from -45°C to +120°C, ensuring reliability under varied environmental conditions. The continuous current capacity of 0.70 A and typical contact resistance of only 500 mOhm highlight their robust electrical performance, making them an excellent choice for demanding applications in the electronics sector.
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Product
Fine Pitch Probes (> 500 Μm) FP580D2929B030R050L059NM
1016641
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The Fine Pitch Probes FP580D2929B030R050L059NM, with order code 1016641, are expertly engineered for precision applications in soldering and electronics testing, accommodating pitches greater than 500 µm. These double plunger probes belong to the FP-D family and are designed to operate effectively across a temperature range of -45°C to +100°C. The probes optimize performance with a continuous current rating of 3.50 A and a typical contact resistance of just 50.00 mOhm, ensuring reliable electrical connections with minimal resistance loss during use.
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Product
Fine Pitch Double Plunger Probe FP300D2901B016G019L032
1023004
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The Fine Pitch Double Plunger Probe FP300D2901B016G019L032 (item number 1023004) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP300D2901B016G019L032 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2901B016G019L032, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP300D2901B016G019L032 includes pitch 0.4 mm / 16 mil, spring force 19 cN, continuous current 1.4 A.
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Product
FP510D0101S036L050L243
1005083
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The FP510D0101S036L050L243, designated with order code 1005083, is a high-performance Double Plunger Probe that excels in precision applications requiring substantial reliability. Designed within the FP-D family, this probe features a fine pitch of 0.70 mm (28 mil), making it a suitable choice for intricate electronic testing scenarios. It operates effectively within a temperature range of -45°C to +100°C, accommodating diverse operational environments while maintaining exceptional performance.
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Product
Fine Pitch Probes FP510D1111S036L050L243
1043602
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The FP510D1111S036L050L243 Fine Pitch Probes are designed to meet high precision requirements for applications requiring fine pitch probing. This model features a double plunger design that ensures reliable contact with a pitch of 0.70 mm (28 mil). With a temperature tolerance ranging from -45°C to +100°C, these probes are engineered for versatility in demanding environments. The enhanced performance of the FP510D series is exemplified in its continuous current capacity of 1.00 A and low contact resistance of 70 mOhm, making them suitable for high-frequency applications where minimal signal loss is critical.
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Product
Fine Pitch Probes (> 500 Μm) FP580D2929B030G040L059
1001490
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The Fine Pitch Probes FP580D2929B030G040L059 are specifically designed for precision applications requiring high reliability and accuracy. This model, particularly suited for environments with stringent temperature requirements, operates efficiently in a range from -45°C to +100°C. Its double plunger design and a pitch of 0.75 mm (30 mil) make it ideal for testing applications where space is at a premium and precision is critical. With a typical contact resistance of only 50 mOhms and a continuous current rating of 3.50 A, these probes deliver excellent performance under demanding conditions.
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Product
Fine Pitch Probe (> 500 Μm) FP580D2903B030G060L059HS1
1025408
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The Fine Pitch Probes model FP580D2903B030G060L059HS1 is a double plunger probe designed specifically for high-precision applications. This model features a pitch of 0.75 mm (30 mil) and operates effectively within a temperature range of -45°C to +200°C, making it suitable for challenging environments. The unique HS1 designation indicates an additional layer of functionality, providing users with enhanced performance characteristics, particularly in high-density interconnect applications.
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Step Probes (F732SP) F73211B0083G300SP
1000934
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The Step Probes (F732SP) F73211B0083G300SP are engineered for precision applications, boasting a fine pitch of 2.54 mm (100 mil) suitable for various testing environments. With an operational temperature range of -45°C to +100°C, these probes hold up against extreme conditions while maintaining reliability and functionality. The Step Probes are designed to endure continuous current up to 5.00 A with a typical contact resistance of just 20 mOhm, ensuring efficient electrical conductivity and minimal thermal loss during operation.
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Fine Pitch Probes (< 300µm) FP280D0301B013G015L057
1031136
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The Fine Pitch Probes (FP280D0301B013G015L057) are engineered for precision in high-density applications. With a fine pitch of 0.35 mm (14 mil), these double plunger probes ensure exceptional electrical connectivity across various electronic components. They operate effectively within a temperature range of -45°C to +150°C, making them suitable for diverse environmental conditions.
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Switch Probes (Normally Open (NO)) F88617K500U350SM
1004292
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The Switch Probes F88617K500U350SM, identified by the MPN 1004292, is an exemplary addition to the F886-NO family of basic contact probes, designed to meet rigorous standards in precision and reliability. This probe features a finely calibrated pitch of 3.50 mm, enabling it to operate effectively within a temperature range of -45°C to +100°C. The unique design incorporates a preload of 130 cN and a spring force of 350 cN, ensuring that it responds with the necessary sensitivity while maintaining durability across various applications.
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Basic Contact Probes (100 Mil) F10021B090G200H
1032056
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The Basic Contact Probes (100 mil) model F10021B090G200H, with order code 1032056, is designed for precision in critical applications. These probes are capable of operating under extreme temperature ranges from -45°C to +200°C, making them ideal for various industrial environments. With a fine pitch of 2.54 mm (100 mil), they provide reliable connectivity with minimal space requirements. The Beryllium copper plunger, plated in gold, ensures excellent conductivity, while the bronze barrel also features a gold plating for improved durability and performance.
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Basic Contact Probe F05079B050P100HP
1169713
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The Basic Contact Probe, model F05079B050P100HP, is engineered for precision and reliability in electronic applications. It is capable of withstanding temperatures ranging from -45°C to +80°C, making it suitable for a variety of environments. The probe features a fine pitch of 1.27 mm, ensuring accurate connections in compact designs. With a robust mechanical design, the probe incorporates a preload of 70 cN and a maximum travel of 6.40 mm, delivering precise actuation in various operational scenarios.
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Product
Fine Pitch Probe H380DR
1004049
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The H380DR is a specialized fine pitch probe designed for precise applications, particularly in high-density circuits and fine pitch testing. With a pitch of 300µm - 500µm (0.50 mm / 20 mil), it caters to modern electronic requirements that demand accuracy and reliability. This probe boasts a total length of 9.95 mm and utilizes a flux-proof connection type, ensuring secure and consistent performance in varied testing environments.
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Product
H480CR
1001688
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The H480CR Fine Pitch Probes are meticulously designed for precision applications requiring a range of 300µm to 500µm. With a pitch of 0.90 mm (35 mil), the H480CR offers a robust crimp connection type, ensuring reliable and securely fastened connections that are resistant to flux. This makes it an ideal choice for intricate electronic assembly and testing tasks, where accuracy and reliability are paramount.
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Product
Double Plunger Probe FP650D0301B035G030L057
1131068
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The FP650D0301B035G030L057 is a precision Double Plunger Probe from the FP-D family, designed for applications requiring exceptional accuracy and reliability. With a fine pitch of 0.80 mm (31 mil), this probe excels in environments demanding exacting standards. Its operational temperature range spans from -45°C to +150°C, making it suitable for diverse applications under varying thermal conditions. Crafted from high-quality materials such as beryllium copper for the plunger and bronze for the barrel, this probe is engineered for longevity and durability, enhanced by a gold plating that ensures superior conductivity and resistance to corrosion.
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Product
FP680D1616S036L085L245
1118519
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The Fine Pitch Probes FP680D1616S036L085L245 are engineered for precision and reliability, designed to meet the demands of high-performance applications. With a pitch of only 0.80 mm (31 mil), these double plunger probes are well-suited for connecting with fine pitch devices, ensuring optimal performance in a variety of electronic test applications. The capability to operate at extreme temperatures ranging from -45°C to +100°C makes them versatile for different operational requirements.
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Test Contactor/WLCSP Probe Head
ACE
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ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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FP200D0301B010G017L037
1023002
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The FP200D0301B010G017L037 is a premium fine pitch probe designed for applications requiring exceptional precision with pitches below 300µm. This double plunger probe, part of the FP-D family, is engineered to elevate your testing processes by maintaining efficiency even in harsh conditions, with an operational temperature range from -45°C to +120°C. Ideal for high-frequency applications, it can handle up to 30 GHz, making it suitable for advanced electronic testing scenarios where reliability and accuracy are paramount.
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Product
Fine Pitch Probes H510DR
1005349
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The H510DR Fine Pitch Probes are designed for high precision applications where accurate connectivity is critical. With a pitch of 0.70 mm (or 28 mil), these probes cater to technologies demanding close contact and reliable performance. They are particularly ideal for situations involving finely pitched circuitry, allowing for seamless integration in compact electronic devices. The H510DR stands out for its robust mechanical specifications, ensuring longevity and reliability under various conditions.
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Basic Threaded Probes (F731) F73111B065G100
1001424
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The Basic Threaded Probes (F731) F73111B065G100, identified with order code 1001424, are engineered for precision and reliability in various electrical applications. Designed with a basic contact probe structure, these probes feature a fine pitch of 2.40 mm (94 mil), allowing for compact and efficient configurations. With an operational temperature range of -45°C to +100°C, these probes perform reliably under extreme conditions, making them suitable for both harsh and standard environments.
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Fine Pitch Probe FP580D0303B030G060L059
1043612
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The FP580D0303B030G060L059 is an advanced fine pitch probe designed for precision applications requiring high reliability. With a pitch of just 0.75 mm (30 mil), this double plunger probe is engineered to function effectively within a temperature range of -45°C to +100°C, making it versatile for various operational environments. The probe is particularly suited for applications demanding a continuous current of up to 3.50 A while maintaining a low typical contact resistance of 50 mOhm, ensuring efficient electrical connectivity and minimal signal loss.
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FP570D0301B030G030L057
1128177
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The FP570D0301B030G030L057 is an advanced double plunger probe designed for precision applications in environments where fine pitch probing is required. This model belongs to the FP-D family and showcases an impressive pitch of 0.80 mm (31 mil), making it suitable for tasks that demand high accuracy and reliability. The operating temperature range of -45°C to +150°C ensures that it performs optimally across various conditions, making it a versatile choice for engineers and technicians alike.
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Fine Pitch Probe FP210D0303B010G016L057
1031798
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The FP210D0303B010G016L057 Fine Pitch Probe is designed for precision applications requiring contacts narrower than 300µm. This double plunger probe belongs to the FP-D family, ensuring high-performance connections that are essential for microelectronic testing and other high-density applications. With a pitch of 0.30mm (12 mil), the probe maintains excellent functionality across a wide temperature range, from -45°C to +120°C, making it suitable for various testing environments.
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Fine Pitch Probes (300µm - 500µm) FP420S18B025G040L198
1029861
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The Fine Pitch Probes (300µm - 500µm) FP420S18B025G040L198 are versatile contact probes designed for precision with a basic contact probe design. Optimally functioning within a temperature range of -45°C to +100°C, these probes address the critical needs of various applications with their reliable performance. They feature a pitch of 0.60 mm (25 mil), making them suitable for tighter pitches required in modern electronic devices. With a continuous current capacity of 2.00 A and a typical contact resistance of just 150 mOhm, these probes ensure minimal loss in electrical performance, making them ideal for high-performance environments.
