Fine Pitch
Fine Pitch Probes range from 0.25 mm to 0.50 mm pitch. They are suitable for sockets and contactors with high pin count.
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Product
Fine Pitch Connector Test
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C.C.P. Contact Probes Co., LTD.
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.
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Product
Fine Pitch Probe FP380D0301B025P023L032
1151224
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The FP380D0301B025P023L032 is a cutting-edge Double Plunger Probe engineered for flexible applications, ensuring high performance across a diverse range of operational conditions. With a remarkable temperature tolerance ranging from -45°C to +120°C, this probe is ideal for environments that demand reliable and precise measurements. Its innovative design allows for adaptability, making it a valuable component in various industrial solutions.
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Product
Fine Pitch Probe FP210D0303B010G016L057
1031798
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The FP210D0303B010G016L057 Fine Pitch Probe is designed for precision applications requiring contacts narrower than 300µm. This double plunger probe belongs to the FP-D family, ensuring high-performance connections that are essential for microelectronic testing and other high-density applications. With a pitch of 0.30mm (12 mil), the probe maintains excellent functionality across a wide temperature range, from -45°C to +120°C, making it suitable for various testing environments.
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Product
Fine Pitch Probes (< 300µm) FP200DF7111P020U015L045
1030202
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The Fine Pitch Probes (FP200DF7111P020U015L045) are designed for precision applications requiring a compact design with exceptional performance capabilities. These double plunger probes come with a pitch measurement of just 0.30 mm (12 mil), making them ideal for high-density electrical interconnections. They operate efficiently within a wide temperature range from -45°C to +120°C, ensuring reliability under varied environmental conditions. The continuous current capacity of 0.70 A and typical contact resistance of only 500 mOhm highlight their robust electrical performance, making them an excellent choice for demanding applications in the electronics sector.
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Fine Pitch Probes (< 300µm) FP280D0301B013G015L057
1031136
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The Fine Pitch Probes (FP280D0301B013G015L057) are engineered for precision in high-density applications. With a fine pitch of 0.35 mm (14 mil), these double plunger probes ensure exceptional electrical connectivity across various electronic components. They operate effectively within a temperature range of -45°C to +150°C, making them suitable for diverse environmental conditions.
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Product
Fine Pitch Probe FP380D2903P022U024L057
1127686
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The FP380D2903P022U024L057 fine pitch probe is designed for precision applications, accommodating pitches between 300µm to 500µm with exceptional reliability. This probe, falling under the FP-D family, is engineered to endure harsh environments, featuring an operational temperature range of -45°C to +150°C. Its double plunger design ensures consistent contact, making it suitable for high-frequency applications up to 16.7GHz while maintaining a low contact resistance of just 120mOhm.
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Fine Pitch Probes (300µm - 500µm) FP380D2901P019U030L087
1024574
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The Fine Pitch Probes (300µm - 500µm) FP380D2901P019U030L087 are precision devices designed for high-performance applications, ensuring reliable electrical connections in tight spaces. These double plunger probes feature a pitch of just 0.50 mm (20 mil), making them ideal for advanced circuitry while withstanding a wide temperature range from -45°C to +150°C. The efficient design accommodates continuous currents of up to 2.10 A with a typical contact resistance of only 120 mOhm, providing excellent conductivity for high-frequency operations, boasting a frequency capability of 6.10 GHz.
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Fine Pitch Double Plunder Probe FP200D2901P012U014L037
1030191
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The Fine Pitch Double Plunger Probe FP200D2901P012U014L037 (item number 1030191) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP200D2901P012U014L037 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP200D2901P012U014L037, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.3 mm / 12 mil, spring force 14 cN, continuous current 0.7 A.
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Product
Fine Pitch Stencil Printer
MC110
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MC110 SMT stencil printer offers quick and easy setup via tooling hole or edge mounting for both single and double-sided boards. Exceptional build quality, with a heavy-duty cast aluminum base, ensures stability and repeatability.
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Fine Pitch Probes (< 300µm) FP260D2901B014G025L072
1023128
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The Fine Pitch Probes (FP260D2901B014G025L072) are designed for high precision applications with a double plunger configuration, accommodating pitches as tight as 0.35 mm or 14 mils. With a temperature range of -45°C to +120°C, these probes maintain performance under extreme conditions. The robust construction features beryllium copper for the plunger material, complemented by gold plating which ensures excellent conductivity and durability. Additionally, the barrel is made of nickel with gold plating, further enhancing the longevity of the product in demanding environments.
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Product
Fine Pitch Double Plunger Probe FP380D2901P025U023L032
1127921
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The Fine Pitch Double Plunger Probe FP380D2901P025U023L032 (item number 1127921) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP380D2901P025U023L032 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP380D2901P025U023L032, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP380D2901P025U023L032 includes pitch 0.5 mm / 20 mil, spring force 23 cN, continuous current 1.4 A.
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Product
Fine Pitch Probes (< 300µm) FP260D0301B014G025L072
1023003
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The Fine Pitch Probes (FP260D0301B014G025L072) are designed for precision and reliability in various electronic applications. This specific model features a double plunger probe design that allows for a pitch of 0.35 mm, making it suitable for ultra-fine pitch connections in dense electronic configurations. It operates effectively within a temperature range from -45°C to +150°C, ensuring stability across environments. The robust construction includes beryllium copper for the plunger material and incorporates gold plating, enhancing conductivity and durability.
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Fine Pitch Probes (300µm - 500µm) FP300D0301B016G019L032
1023111
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The Fine Pitch Probes FP300D0301B016G019L032 are engineered for precision and reliability in diverse applications, featuring a double plunger design that ensures optimal performance in high-density environments. With a pitch of 0.40 mm (or 16 mil), these probes are capable of operating within a temperature range of -45°C to +120°C, making them suitable for a variety of operational conditions. Their mechanical structure includes a preload of 7.00 cN and a spring force of 19.00 cN, allowing for fine adjustments and reliable connections. The nominal travel is measured at 0.45 mm, with a maximum travel capability of up to 0.58 mm, ensuring flexibility in application setups.
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Product
Fine Pitch Double Plunger Probe FP300D2901P015U025L057H
1024430
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The Fine Pitch Double Plunger Probe FP300D2901P015U025L057H (item number 1024430) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP300D2901P015U025L057H at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2901P015U025L057H, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.4 mm / 16 mil, spring force 25 cN, continuous current 1.4 A. As an H version, FP300D2901P015U025L057H extends the operating range to high-temperature applications up to 200 °C.
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Fine Pitch Probes (300µm - 500µm) FP380D0301B025G023L032
1127923
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The Fine Pitch Probes (300µm - 500µm) FP380D0301B025G023L032, also known by the order code 1127923, are engineered with precision for high performance in various electronic testing applications. Featuring a double plunger probe design from the FP-D family, these probes are designed to meet rigorous standards for accuracy and reliability. With a pitch of 0.50 mm (20 mil), they offer superior electrical connectivity and durability, functioning optimally across a temperature range of -45°C to +120°C. The probes maintain a continuous current of 1.40 A with a typical contact resistance of 100 mOhm, achieving peak frequency performance at 29.30 GHz.
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Fine Pitch Probes H510DR
1005349
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The H510DR Fine Pitch Probes are designed for high precision applications where accurate connectivity is critical. With a pitch of 0.70 mm (or 28 mil), these probes cater to technologies demanding close contact and reliable performance. They are particularly ideal for situations involving finely pitched circuitry, allowing for seamless integration in compact electronic devices. The H510DR stands out for its robust mechanical specifications, ensuring longevity and reliability under various conditions.
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Fine Pitch Probes (300µm - 500µm) FP350D2901B021G020L076
1114002
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The Fine Pitch Probes (300µm - 500µm) model FP350D2901B021G020L076 is designed for precision applications requiring high reliability and performance in the soldering process. With an advanced double plunger design, these probes demonstrate exceptional durability and efficiency, suited for working with pitch sizes as small as 0.50 mm. The temperature range of -45°C to +150°C ensures versatility across various environments, making these probes critical for both industrial and lab settings.
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Fine Pitch Probes (< 300µm) FP280D2903P016U020L086
1030449
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The Fine Pitch Probes (FP280D2903P016U020L086) are specifically designed for applications requiring precision and reliability at extremely small pitches. With a pitch dimension of 0.35 mm (14 mil), these double plunger probes are effective in environments operating within temperatures ranging from -45°C to +150°C. Their construction includes high-grade materials ensuring durability while maintaining optimal performance across various electrical specifications. The continuous current rating of 1.10 A and a typical contact resistance of 180 mOhm allow these probes to function efficiently, even at high frequencies up to 7.40 GHz, making them suitable for high-speed electronic applications.
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Fine Pitch Probes (> 500 Μm) FP580D2929B030G060L058NM
1028445
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The Fine Pitch Probes FP580D2929B030G060L058NM represent a sophisticated solution for precision applications requiring meticulous electrical connectivity. Designed with a double plunger probe configuration, these probes excel in environments demanding reliability and durability. Operating effectively across a broad temperature range from -45°C to +150°C, they maintain optimal performance even under extreme conditions. The unique design philosophy emphasizes both functionality and accuracy, making these probes an essential tool for advanced testing and assembly tasks.
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Product
Narrow (Fine) Pitch Connectors
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Panasonic Industrial Devices Sales Company of America
Panasonic’s industry leading “tough contact” design provides customers with the reliability that is required when developing the latest computer or wearable device. Our Narrow (Fine) Pitch Connectors line-up includes both Board-to-Board and Board-to-FPC options. Backed by our staff of technical engineers, Panasonic offers a full “hands on” solution from designing-in assistance to manufacturing. Discover how Panasonic Narrow Pitch Connectors can elevate your applications.
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Fine Pitch & Interface Solutions
1147211
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Fine Pitch & Interface Solutions by FEINMETALL represent the pinnacle of reliability and precision in electronic component testing. With a focus on fine pitch probes available in various pitch sizes from 0.11 mm to over 0.50 mm, these solutions cater to a wide range of applications. The experience gained over more than 60 years in test engineering ensures that FEINMETALL constantly meets the high demands of the high-tech industry, providing tailored solutions for board tests, wire harness checks, and high-current applications.
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Fine Pitch Probes (> 500 Μm) FP580D2929B030G040L059
1001490
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The Fine Pitch Probes FP580D2929B030G040L059 are specifically designed for precision applications requiring high reliability and accuracy. This model, particularly suited for environments with stringent temperature requirements, operates efficiently in a range from -45°C to +100°C. Its double plunger design and a pitch of 0.75 mm (30 mil) make it ideal for testing applications where space is at a premium and precision is critical. With a typical contact resistance of only 50 mOhms and a continuous current rating of 3.50 A, these probes deliver excellent performance under demanding conditions.
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Fine Pitch Probes (> 500 Μm) FP580D6565B030G060L059H
1024449
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Introducing the Fine Pitch Probes FP580D6565B030G060L059H, designed specifically for precision electronic applications with a compact double plunger mechanism. These probes are engineered to deliver exceptional reliability and accuracy in a variety of environmental conditions, ranging from -45°C to +200°C. With a pitch of 0.75 mm (30 mil), they cater to advanced design needs in high-density circuit boards, ensuring optimal contact under various load conditions.
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Fine Pitch Probe (> 500 Μm) FP580D2903B030G060L059HS1
1025408
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The Fine Pitch Probes model FP580D2903B030G060L059HS1 is a double plunger probe designed specifically for high-precision applications. This model features a pitch of 0.75 mm (30 mil) and operates effectively within a temperature range of -45°C to +200°C, making it suitable for challenging environments. The unique HS1 designation indicates an additional layer of functionality, providing users with enhanced performance characteristics, particularly in high-density interconnect applications.
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Fine Pitch Probes (< 300µm) FP280D0301P013U030L057
1030726
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The Fine Pitch Probes (Model: FP280D0301P013U030L057) are specially designed for high precision applications, boasting a double plunger probe design that ensures reliable performance. With a pitch of just 0.35 mm (14 mil), these probes are optimized for use in environments ranging from -45°C to +120°C, making them versatile for various operational requirements. Their advanced engineering provides notable stability in contact resistance, typically measuring at 100 mOhm, even at a continuous current of 1.5 A, proving essential for maintaining signal integrity in demanding conditions.
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Fine Pitch Test Probes
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Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Fine Pitch Probes (< 300µm) FP210D2903B010G011L057
1024774
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The Fine Pitch Probes FP210D2903B010G011L057 are specially designed for applications requiring precision and reliability in fine pitch testing. With a pitch of 0.30mm (12 mil), these double plunger probes are capable of withstanding a wide temperature range from -45°C to +120°C, making them suitable for various environments and conditions. Their innovative design features two distinct tip styles, allowing for versatile applications across different electronic components and circuit designs.
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Product
Fine Pitch Probes (300µm - 500µm) FP300D0301B015G030L057
1023125
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The Fine Pitch Probes (300µm - 500µm) FP300D0301B015G030L057 is an advanced double plunger probe designed for precision applications that require high performance and reliability. Engineered within the FP-D family, these probes feature a pitch measurement of 0.40 mm (16 mil), ensuring compatibility with fine pitch circuits. With a robust operational temperature range from -45°C to +120°C, these probes are capable of withstanding extreme conditions, making them ideal for various environments in electronic testing and production.
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Fine Pitch Probe FP520DF2911B045P042L058
1142380
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The FP520DF2911B045P042L058 Fine Pitch Probe is engineered specifically for high-performance applications in electronic testing. This model features a double plunger design that not only enhances reliability but also ensures consistent contact at pitches as fine as 0.75 mm. Operating within a temperature range of -45°C to +150°C, it is suitable for a broad spectrum of testing environments, making it an excellent choice for advanced electronic measurement tasks.
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Fine Pitch Probes (300µm - 500µm) FP300D2929B015G035L066
1051670
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The Fine Pitch Probes (300µm - 500µm) FP300D2929B015G035L066 are designed for precision applications requiring high reliability and performance. This double plunger probe is part of the FP-D family, characterized by a pitch of 0.40 mm (16 mil). It is engineered to deliver a typical contact resistance of just 100 mOhm, ensuring low resistance and high signal integrity during electrical testing. Notably, the design features a reliable preload of 6.00 cN and a spring force of 35.00 cN, providing optimal contact pressure for effective operation.
