Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Product
Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Product
Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Product
Force Transmitter
LKVE/i
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The PIAB LKVE electronic overload protection system consists of a force transmitter with amplifier and an electronic signal processing unit. The PIAB LKVE force transmitter is attached to a stationary line part. The rope is deflected via a slight angle between the two wheels and the clamping jaw. When loaded, the rope tends to straighten and applies a force which is transmitted to the load cell. The load cell in the PIAB LKVE delivers a signal proportional to the force on the load cell. The signal is amplified and is converted to 4-20mA. This standardized signal (4-20mA) allows distances between the force transmitter and the electronic unit to be 500 m.
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Product
High Power Temperature Forcing System
MaxTC G4
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NEW G4– MaxTC is our premium Temperature Forcing System product, specifically designed for industry needs as a result of customer´s feedback from the Flex-TC. Its powerful cooling force (90W @ -40°C), rapid transition rates (75°C /min) and remote control capabilities will provide solutions to all semiconductor testing needs. MaxTC is compact, ultra quiet (55 d BA) and fits into any laboratory. A premium product at amazing value.
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Product
Roll Force Measurement
Millmate
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ABB’s Millmate roll force system is the perfect choice for measuring roll force in both hot rolling and cold rolling mills, thereby achieving correct roll gap settings and force distribution.The system is proven to be exceptionally robust and resilient to high forces as well as aggressive mill agents. The load cells are calibration free, can withstand overloads up to 7 times the nominal force, and have an impressive life length. The load cells come in different sizes from 0.1MN up to 60MN.
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Product
Modular Infinity Microscope (MIM)
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Product
High Resolution Microscope for Multi-fiber Connector
D SCOPE MT
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The new D SCOPE MT microscope for MTP/MPO connectors is the fastest on the market. In the same measurement cycle, D Scope MT checks every optical fiber surface condition, and allows the operator to control the cleanliness of the connector endface and guideholes.
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Product
Closing Force Meter
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Maschinenbau Haldenwang GmbH & Co. KG.
Is used to conveniently and reliably determine the closing force of externally operated service doors and locking devices.
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Force Testing
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Force testing is a way of determining how an object will react when it is subjected to tensile or compressive loads
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Product
Force Sensors For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
The force sensors can be integrated easily and uncomplicatedly by the regular standard thread.
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Product
High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Mechanical Force Gauges
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Imada mechanical force gauges are highly accurate instruments used to test the quality, strength or functionality of component parts or products. Imada mechanical force gauges check both compression and tension (push or pull). Peak force can be captured using the peak indicator needle and the tare ring compensates for the weight of attachments. Imada force gauges are constructed with a heavy-duty metal case and all metal components to enable them to retain their calibration for years with proper care. These mechanical force gauges never need charging or batteries and are intrinsically safe in hazardous environments.
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Product
High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Product
Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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End Face Inspection Microscopes
D SCOPE EFI – D SCOPE EFI-C – D SCOPE EFI-C LWD
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The new D Scope EFI for MTP/MPO and multifibers field connectors is a cost effective microscope for inspecting fiber optic patchcords and cassettes.
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FOV Micro Measuring Microscope 4.0
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The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Product
3U CompactPCI Quad-Core Intel Atom® Processor Blade
cPCI-3620
Processor Blade
The ADLINK cPCI-3620 Series is a 3U CompactPCI® processor blade featuring a quad-core 4th generation Intel® Atom SOC and soldered DDR3L-1333 ECC memory up to 4GB.
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Product
Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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"Bay Trail" Atom Processor
XMC-120
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Curtiss-Wright Defense Solutions
The XMC-120 from Curtiss-Wright Defense Solutions is a small form factor and low power x86 single board computer (SBC). Designed for space-constrained size, weight and power (SWaP)- sensitive programs, the XMC-120 offers quad-core x86 processing performance with ultra low power and small sized footprint.
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Product
Intel Atom® Processor E3900 Family-Based Ultra Compact Embedded Platform
MXE-210 Series
Embedded Platform
ADLINK’s new Matrix MXE-210 series of ultra compact embedded platforms, based on the Intel Atom® x5-E3930/x7-E3950 Processor, delivers optimum I/O design for maximum connectivity.
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Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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Force Gauge
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The Centor range of digital force gauges offers force measurement solutions for every situation. From the simple Centor First II force gauge to the colorful Centor Easy II, we have a wide range of instruments designed for industrial and laboratory use.
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Scanning Probe Microscope
SPM-9700HT
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Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
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High Quality Digital Benchtop Microscope
D SCOPE
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This unique microscope combines high quality optics with a modern and ergonomic design ideally suited to fiber optic applications. Until the D Scope, most microscopes were suffering from poor illumination quality yielding variable and non-reproducible image quality even amongst scopes of the same kind.
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Product
15" Fanless Panel PC With Intel® Atom™ X6425E Processor
PPC-415 EHL
Panel PC
15" XGA TFT LCD with resistive (default) or projected capacitive (by request) touchscreenIntel® Atom™ x6425E quad-core, 2.0 GHz processorFanless, slim designSupports 1 x 2.5" SATA and 1 x M.2 B key slot for expansion1 x PCI/PCIe x1 expansion slotWide operating temperature range (-20 ~ 60 °C/-4 ~ 140 °F)Wide range DC support (9 ~ 32 VDC)1 x isolated RS-422/485 with automatic flow controlDual 2.5GBASE-T Ethernet supports Time-Sensitive Network (TSN) technology
