Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
-
Product
Coercive Force Meter
-
The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
-
Product
Full Bridge Thin Beam Force Sensors
TBS SERIES
-
The TBS Series thin beam force sensors many different parameters found in medical instrumentation, home appliances, process control, robotics, and automotive are exceptionally suited for small load measurements. They are designed to measure and many other high volume applications. A specially developed integrated strain gage includes all balancing, compensating and conductive elements and is laminated to the beam to provide excellent stability and reliability.
-
Product
Economical Load and Force Measurement
ELF
-
Tekscan's ELF force and load measurement system matches the market's need for an inexpensive load and force measurement system with Tekscan's ability to deliver innovative load and force measurement solutions. The system consists of data acquisition hardware, software, and FlexiForce B201 sensors.
-
Product
Force Sensors For Push Direction
-
INELTA Sensorsysteme GmbH & Co. KG
Inelta Force Sensors operate with foil strain gauges (DMS)
-
Product
Temperature Controlled Microscope Stages
-
Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
-
Product
Stereoscopic Zoom Microscope Automation
SZ-2000
-
Applied Scientific Instrumentation
Based on ASI's proven DC servo motor technology, the SZ-2000 automates stereo zoom microscopes. The unit can be configured for motorized focus only, motorized focus with automated zoom control, or motorized focus with automated zoom control and an automated XY translation stage. The Z axis focus resolution varies slightly depending upon the model of the microscope, with 0.8 microns being the smallest step size available on a Nikon SMZ800.
-
Product
Quartz Charge Force Rings
-
Ring-style sensor configurations measure dynamic compression. Tension measurements are also possible if the unit has been installed with proper pre-load.
-
Product
TP D2x/msd, 3U cPCI with an Intel® Atom™ Processor
TP D2x/msd
-
TP D2x/msd is a 3U cPCI PC-compatible low power, high functionality, 3U CompactPCI board supporting the Intel Atom™ processor E3800 product family with 4 Gbytes of DDR3L ECC DRAM.
-
Product
Desktop Fluorescence Microscope
Nanoimager
-
The complete package for super-resolution microscopy
-
Product
Forced Air Cooled RF Coaxial Loads
86700 Series
-
The 86700 Series Forced Air Cooled RF Coaxial Loads are capable of dissipating up to 75 kW of CW RF power from DC Hz to 240 MHz with a VSWR of 1.15:1 or less. With this low reflection coefficient the loads are very useful for tuning transmitters.
-
Product
Scanning Electron Microscopes
SEM
-
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
-
Product
Push Pull Force Gauge Meter
NK-10
-
Shenzhen Chuangxin Instruments Co., Ltd.
*This push pull force gauge Easy to be operated and can be installed with all kinds of test stands and clamps.*Peak holding function and continuous.*One year free maintenance.*Compact and artistic packing, easy to transit and stock.*Two kind of unit dual show at the same time,*don't need unit conversion. *NK Series: Newton and Kilogram dual unit; *NLB Series: Newton and Pound dual unit; *ALB: Pound and Kilogram dual unit.*Needle indicates, easy to read, high accuracy.
-
Product
Scanning Electron Microscope
Verios G4 XHR SEM
-
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
-
Product
Compact Hydraulic Vibrator Force Simulator
JF Series
-
The JF Series Force Simulator was developed with the emphasis on light weight, compact size and ease-of-use as a general-purpose, compact jack for the Servopulser system. Testing systems installed with the Force Simulator can easily perform endurance, fatigue and simulation tests on small structural members and various other structural members, which helps improve the logical design and reliability of products.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for TEM
-
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
-
Product
Acoustic Microscope
AMI D9650
-
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
-
Product
Microscope Spectrophotometer
508 PV
-
The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
-
Product
Microscopic Four-Point Probes
M4PP
-
CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
-
Product
Custom Microscopes and Optical Systems
OpenStand
-
Whether developing new automation techniques and software or developing new imaging methods, you can quickly find that you need a microscope system tailored to your application and business needs. Prior Scientific has developed OpenStand® to offer a working platform to build OEM solutions and one-off customizations with excellent value for money and reduced development time.
-
Product
Stereo Microscopes
-
Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
-
Product
Wafer Cathodoluminescence Microscope
Säntis 300
-
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
-
Product
Laser Scanning Microscopes
-
A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
-
Product
Force Tensiometer
K20
-
Our Force Tensiometer – K20 is a robust, semi-automatic instrument for the precise measurement of surface tension and interfacial tension. Using the ring and plate method as the main tensiometric methods, it produces reliable measurements for the routine quality assurance of your surfactant solutions and interfacial processes.
-
Product
Scanning Near Field Optical Microscope
SNOM
-
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
-
Product
Electromagnetic Force Fatigue And Endurance Testing System
EMT Series
-
High-speed repeated load tests can be carried out with a maximum velocity of 2 m/s, and maximum stroke of ±50 mm, using clean and quiet electromagnetic force as the driving power, without the use of oil. The test space is large so environmental tests can also be carried out using the constant temperature tank (option).
-
Product
Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
-
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
-
Product
Clamping Force Tester
KRD102
-
KRD102 series clamping force tester is an indispensable test method for improving products into high-quality fields. It is suitable for research, development, quality control and manufacturing of electronics, electromechanical, optoelectronic, automotive, toy, packaging and other industries. It can simulate the situation that the goods in the container are clamped when they are transported from the container to the warehouse. Whether the goods are damaged due to the clamping, so as to evaluate the anti- clamping ability of the packaging.
-
Product
Force Transducers
-
Metra Mess- und Frequenztechnik in Radebeul e.K.
Piezoelectric force transducers are suited for the measurement of tensile and compression force.
-
Product
Sapphire 3D Microscope
WDI-2000
-
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
-
Product
Force Tensiometers
Sigma 702
-
The Sigma 702 is a standalone force tensiometer that provides accurate surface and interfacial tension measurements (Platinum Du Noüy ring, Platinum Wilhelmy Plate), manual determination of Critical Micelle Concentration (CMC) and density measurements. The open design and convenient control keyboard operations make these instruments easy to use without the need for an external computer.
