Olympus Corp.
Manufacture and sales of precision machineries and instruments.
- 484-896-5000
- 2951 Ishikawa-machi
Hachioji-shi, Tokyo 192-8507
Japan
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Product
Micro Spectrophotometer
USPM-RU III
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The USPM-RU III is a reflectometer that provides highly accurate spectral reflectivity measurements of small, curved, and thin samples without interference from rear surface-reflected light. The curved surface of the lens can be measured from a minute spot as small as ø60 µm formed on the sample surface. This provides the ability to use a goniometer to examine even the curved side lenses or other optical component.
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Product
Process XRF Analyzer
X-STREAM
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The X-STREAM and X-STREAM: Glass are high-speed, automated sorting systems for automatic identification and sorting of material by chemical composition. Take metal, glass and mineral recycling to a new level of high speed, accuracy and profitability.
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Product
XRF and XRD Analyzers
Vanta
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The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership. With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.
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Product
Portable Flaw Detector
EPOCH 6LT
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Portable and easy to use, the EPOCH 6LT flaw detector is an ergonomic, rugged instrument that delivers user comfort and more uptime. Weighs just 1.95 pounds (890 g) with a grip-oriented weight distribution for one-handed operation with minimal wrist fatigue. Rotary knob and simple button design make it easy to use, even when wearing gloves. Engineered to IP65/67 and drop tested. Clear, bright screen for readable A-scans in any light. The EPOCH 6LT flaw detector’s workflow is simple and straightforward. Despite the instrument’s small size, it has the features and functions to meet the requirements of nearly any conventional ultrasonic inspection application.
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Product
Videoscopes, Borescopes
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Our remote visual inspection videoscopes systems are designed to meet the demands of the modern industrial inspection environment. They offer portable and intelligent remote imaging solutions with a host of advanced, yet intuitive features, making them ideal remote visual inspection instruments. A wider range of videoscope, fiberscopes and borescopes with various diameters and viewing options are available, making our videoscopes systems the most versatile inspection system suitable for a multitude of inspection requirements.
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Product
Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Product
Advanced Ultrasonic Thickness Gage
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The 45MG is an advanced ultrasonic thickness gage packed with standard measurement features and software options. This unique instrument is compatible with the complete range of Olympus dual element and single element thickness gage transducers.
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Product
Portable XRD System
TERRA
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The TERRA Mobile XRD System, a high performing, completely contained, battery operated, closed-beam portable XRD, provides full phase ID of major, minor and trace components with a qualitative XRF scan of elements Ca - U. Its unique, minimal sample prep technique and sample chamber allow for fast, in-field analysis.
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Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Product
Portable XRF Analyzer
X-5000
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The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
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Product
Scrap Handheld XRF Analyzer
DELTA
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DELTA Scrap Sorting Handheld XRF Analyzers provide reliable ID in 1-2 seconds for most alloy grades and pure metals. They are designed for durability to withstand the toughest processing environments. Get fast, reliable alloy sorting and analysis for a wide variety of ferrous and non-ferrous materials in seconds.
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Product
Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Product
Mining and Geochemistry Handheld XRF Analyzer
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DELTA Mining & Geochemistry Handheld XRF Analyzers provide immediate results to help determine the next course of action for the entire process - exploration, ore grade/process control, environmental sustainability. On-site detection of metals, minerals & contaminants. GPS-GIS-XRF for instant metal mapping, time, cost savings
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Product
3D Measuring Laser Microscope
LEXT OLS5000
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The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Product
Normal Incidence Shear Wave Transducers
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Single element normal incidence Shear Wave Transducers contact transducers introduce shear waves directly into the test piece without the use of refracted wave mode conversion. We recommend the use of our SWC shear wave couplant for general purpose testing.
Children
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Evident Scientific
Evident designs and manufactures a diverse range of life science and industrial products, including microscopes, digital pathology solutions, nondestructive testing flaw detectors, X-ray fluorescence analyzers, and video borescopes.
