Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Sensor Products: Weld Force Gage
90061
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Model 90061 is a self-contained, portable measurement system which allows auditing of the pinch force generated between the electrodes of resistance spot welders. Resistance welding uses a pair of electrodes to clamp two base metals firmly together prior to and during application of electrical current. Poorly clamped parts result in a defective joint. A correctly clamped assembly aids in reducing the resistance in the joint and allows the current flow to properly heat the base metals to weld the part.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Force Balanced Accelerometer
PA-23, PA-23BH, S-230
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The Geotech Model S-230 is a high resolution, 1-component, force balanced accelerometer capable of meeting the noise and stability requirements of the most demanding seismic studies. It features a very wide frequency response (DC to 90 Hz) and an internal calibration coil. Three S-230 accelerometers are packaged as a borehole 3-component unit (Model PA-23BH) and as a surface 3-component unit (Model PA-23). PA-23BH can be submerged up to 100 m depth.
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Compact Hydraulic Vibrator Force Simulator
JF Series
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The JF Series Force Simulator was developed with the emphasis on light weight, compact size and ease-of-use as a general-purpose, compact jack for the Servopulser system. Testing systems installed with the Force Simulator can easily perform endurance, fatigue and simulation tests on small structural members and various other structural members, which helps improve the logical design and reliability of products.
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Product
Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Microscope Software
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Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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Force Sensors
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The Force Sensors segment includes a broad line of load cells and force measurement transducers that are offered as precision sensors for industrial and commercial use. Typical applications for force sensors are in medical devices (such as hospital beds and medication dosing), agricultural equipment (for precision force measurement), and construction machinery (for tipping and overload protection). These sensors use our foil technology products, which serve as sensing elements and components within each unit. Further integration of our load cells technology is also offered as part of our weighing module products, which provide customers with a complete sensor assembly that may be used within a wide variety of digital transducers.
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Coercive Force Meter
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The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Product
Push Pull Force Gauge Meter
NK-10
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Shenzhen Chuangxin Instruments Co., Ltd.
*This push pull force gauge Easy to be operated and can be installed with all kinds of test stands and clamps.*Peak holding function and continuous.*One year free maintenance.*Compact and artistic packing, easy to transit and stock.*Two kind of unit dual show at the same time,*don't need unit conversion. *NK Series: Newton and Kilogram dual unit; *NLB Series: Newton and Pound dual unit; *ALB: Pound and Kilogram dual unit.*Needle indicates, easy to read, high accuracy.
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Force Measurement
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Using state-of-the-art technology, ABB provides purpose built solutions for your force and dimension measurement needs, making it possible for your production output to accurately match the most varying and demanding requirements.
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Force Tensiometer
K100
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Our universal Force Tensiometer – K100 performs high-precision, automatic and reliable measurements of surface tension and interfacial tension, critical micelle concentration CMC and contact angle on solids, fibers and powders. With high-quality components and a uniquely wide range of methods, the instrument carries out many tasks in the field of surfactant analysis and wetting measurement for your quality assurance or research.
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Digital Video Inspection Microscope
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Contamination is the first reason for troubleshooting optical networks. Proactive inspection and cleaning of fibre connectors can prevent poor signal performance, damage to equipment, and network downtime. DIAMOND’s Video Microscope Kit contains all necessary tools for proper inspection and cleaning of the connector’s front-faces to help ensure optimal connector performance.
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Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Standard Flexiforce Sensors for Force Measurement
FlexiForce
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FlexiForce force sensors are ultra-thin and flexible printed circuits, which can be easily integrated into force measurement applications. These sensors are available for purchase in our online store.
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Axial Force And Torsion Testing Machine
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Evaluation Testing That Approximates Operating Conditions of Materials and Parts - Loading methods similar to actual usage - Allows simultaneous application of axial and torsional loads to samples
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Quartz ICP® Force Rings
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Ring-style sensor configurations measure dynamic compression. Tension measurements are also possible if the unit has been installed with proper pre-load. The through-hole mounting supports platform, integrated link, and support style installations using either a through-bolt or the supplied stud.
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Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Force Displacement Testers
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Force displacement testing measures how much force is required to displace or deform a specific component or material. It’s an important aspect of quality control in manufacturing as well as material science. It’s necessary to help ensure products are made to the proper standards and to verify the properties of certain materials. Imada provides a range of force displacement testers that provide precise and accurate measurements, with numerous features to help technicians complete testing as quickly and effectively as possible.
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Atomic Absorption Spectroscopy Consumables
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Since the atomic absorption spectrophotometer was first launched in 1968, Shimadzu Corporation has remained at the forefront of the world inorganic analysis industry. Shimadzu still maintains an overwhelming market share with highly-regarded products that are selected as the market standard throughout the world. The extensive product range incorporates fully automatic general-purpose systems, a simple and low-cost AA instrument, and a dedicated soil and plant analyzer. They all share great ease-of-use, high functionality, and excellent reliability. Choose Shimadzu to dramatically enhance the productivity and reliability of your laboratory. Shimadzu products will meet all your demands.
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Intel Atom® Processor-Based Ultra Compact Embedded Platform
MXE-200 Series
Embedded Platform
ADLINK's new Matrix MXE-200 series Ultra Compact Embedded Platform, based on the Intel Atom® SoC processor E3845/E3826, With superior-class construction meeting a wide variety of specific industrial needs, the MXE-200 series offers the most reliable Ultra Compact Embedded Platform for use in harsh environments, compliant with industrial grade EMI/EMS (EN61000-6-4,61000-6-2), protecting customer assets and reducing TCO. Opposing conventional correlations between size and computing power, the MXE-200 series features large-scale performance in an ultra-compact package.
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Tactile Pressure and Force Measurement
I-Scan® System
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This versatile tactile pressure measurement system is tailor-made by choosing from over 200 pressure sensors to meet your specific application requirements.
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Inverted Microscope Platform
Axio Observer
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In life sciences research you come up against new challenges every day. That’s why you want a flexible microscope system that can be tailored to your needs. ZEISS Axio Observer is your inverse platform for demanding multimodal imaging of living and fixed specimens. Combine Axio Observer with a wealth of technologies and refine it to support your experiments precisely.
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High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
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Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Microscope Cameras From ZEISS
Axiocam Family
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In contrast to digital cameras for photography or industrial inspection, many aspects of the microscope cameras are optimized to meet specific requirements of applications in science, research and documentation. As each application has very specific requirements, there is a wide range of different digital camera models to choose from. Different pixel sizes, for example, regulate camera sensitivity and spatial resolution. Lower pixel count enables higher frame rates and larger sensors offer better coverage of the field of view.
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Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Precise Temperature Forcing System
TA-5000A Series
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The ThermalAir TA-5000 Series of temperature forcing systems bring precise thermal testing capabilities directly to your test application, exactly localizing to where thermal conditioning temperature cycling is required. ThermalAir TA-5000 temperature systems provide flexible thermal test solutions for an array of products and technologies.
