Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
Metallurgical Microscope
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Offering you a complete choice of products which include dg classic trinocular metallurgical microscope, dg victory trinocular metallurgical microscope, dmi classic trinocular metallurgical microscope, dmi excel binocular metallurgical microscope, dmi optima trinocular metallurgical microscope and dmi prime trinocular metallurgical microscope.
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Product
Clock And Trigger Synchronization Board With Atomic Clock
CLKSYNC-PCI-AC
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CLKSYNC-PCI-AC is a clock and trigger distribution board designed to provide up to eight synchronous clock and trigger outputs. The CLKSYNC-PCI-AC is designed for use with multi-channel, ADC and DAC systems where precise clock and trigger synchronization are required.
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Product
Force Sensors In S-form For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
With very small space requirement and high breaking force made from tempered stainless steel, suitable for measuring medium to high forces. Easy integration and mounting by threaded bores.
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Product
Explosion-Proof DIN-Rail Gateway With Intel® Atom® E3845
UNO-1372GH
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UL listed for Hazardous Locations: Class I, Division 2Intel® Atom E3845 1.91GHz processor with 4GB DDR3L memoryDual power inputsDigital I/O with isolation protection for sensing and controllingAmazon AWS IoT Greengrass certified
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Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Product
Intel Atom® Embedded Controller
AMAX-5570 V2
Embedded Controller
Optimized BIOS & Embedded OS for 1ms real-time control (Windows & Linux)Achieves 32-axis motion control with 500 μs EtherCAT cycle time under LinuxOPC UA and Modbus TCP/RTU as IT connectivity enabled by CODESYSEtherCAT, PROFINET, Ethernet I/P, and CANopen are OT connectivity feature enabled by CODESYSIntel Atom® quad-core x6414RE processorSystem I/O with 2 x GbE, 2 x USB, 2 x Isolated CAN 2.0, 2 x Isolated COM, 1 x HDMI1 x M.2 B-Key (USB3.0 / SATA) expansionAMAX-5000 EtherCAT Slice I/O expansion
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Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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Acoustic Microscope
AMI D9650
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Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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Product
Universal SOIC ZIF (Zero-Insertion-Force) Test Socket
Series 547
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Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Product
Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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3U CompactPCI Quad-Core Intel Atom® Processor Blade
cPCI-3620
Processor Blade
The ADLINK cPCI-3620 Series is a 3U CompactPCI® processor blade featuring a quad-core 4th generation Intel® Atom SOC and soldered DDR3L-1333 ECC memory up to 4GB.
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Intel® Atom™ E3845 Processor-Based Fanless Embedded Computer
MXE-1400 Series
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ADLINK's new Matrix MXE-1400 series of rugged quad-core fanless computers, feature the latest generation of Intel® Atom™ E3845 processors, delivering outstanding performance with minimum power consumption.
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High Quality Digital Benchtop Microscope
D SCOPE
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This unique microscope combines high quality optics with a modern and ergonomic design ideally suited to fiber optic applications. Until the D Scope, most microscopes were suffering from poor illumination quality yielding variable and non-reproducible image quality even amongst scopes of the same kind.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Load Cells & Force Transducers
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BLH and Nobel Weighing Systems offer a wide variety of load cells and force transducers, ranging from the unique KIS load cell and weigh module to the VPG transducers range of products. Our many years of experience, our state-of-the-art instruments, and the exceptionally broad range of components that go into our systems allow us to deliver high-quality solutions tailored to your needs.
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3D Measuring Laser Microscope
LEXT OLS5000
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The OLS5000 laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that's four times faster than our previous model delivers a significant boost to productivity. Measure samples that are up to 210 mm tall. Capture the shape of any surface. Total magnification: 54x - 17,280x
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Product
Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Force Measurement
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Using state-of-the-art technology, ABB provides purpose built solutions for your force and dimension measurement needs, making it possible for your production output to accurately match the most varying and demanding requirements.
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Fluorescence Microscopes
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PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Force Gauge
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Tension & compression capability .* 5000 g, wide capacity, highresolution, high accuracy, highrepeatability.* 3 kind display unit, g/oz/Newton.* Separate sensor.* Peak hold ( Max. load ) measurement.* Positive or reverse display direction.* Hand held & stand mounting.* Microprocessor circuit & exclusiveload cell transducer.
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Inverted Microscopes
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ACCU-SCOPE inverted microscopes deliver excellent ergonomics, top quality optics, crisp images and configurability to meet your needs. The “workhorse of the tissue culture lab,” the inverted microscope is found in practically all tissue culture rooms and is used to observe cells in culture for their health and growing condition. Living cell cultures are essential to the discovery of cellular processes, providing scientists insight into mechanisms of disease that can be used for identifying new therapeutics. ACCU-SCOPE inverted microscopes are commonly equipped with phase contrast components for the observation of living cells in culture without the need for staining. Other available contrast methods may include brightfield, fluorescence, emboss, differential interference (“DIC”) and modulation.
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Product
Intel® Atom™/Celeron® Processor COM Express® Mini Module
SOM-7567
Computer-on-Module
COM R.2.1 Type 10 Mini Module, Intel® Atom™/Celeron® processor for Intelligent systems. Onboard DDR3L and SSD, 4.75 ~ 20 V wide-voltage input support.
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Force Gauges
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SHIMPO offers a range of digital and mechanical force gauges to suite every application from low capacities (0.5 lbs) to high capacities (1,000 lbs). Our gauge's features range from simple, no output models to highly sophisticated units that provide memory, statistics and data output. Our gauges are known for their strong construction and highly accurate measurements.
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TP D2x/msd, 3U cPCI with an Intel® Atom™ Processor
TP D2x/msd
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TP D2x/msd is a 3U cPCI PC-compatible low power, high functionality, 3U CompactPCI board supporting the Intel Atom™ processor E3800 product family with 4 Gbytes of DDR3L ECC DRAM.
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Force
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Force instruments are used to measure, apply, or regulate force accurately to prevent damage, improve performance, and ensure safety.
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Digital Push And Pull Force Gauge
HG-2-1000
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Shenzhen Chuangxin Instruments Co., Ltd.
Digital push and pull force gauge is a universal portable force device, testing push and pull load. It is small, light, easy to take, multi-function, high precision. Applicable for all products doing push and pull load test, insert and pull out force test, destroy test, etc. It also can be combined with the machine and clamp to make up a small tester for different purposes.
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Atomic Clocks
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Society has become dependent on atomic time. Atomic clocks underpin our financial transactions, communications services and broadcast services, but they are expensive to produce and maintain.Quantum technology brings a new generation of clocks which are smaller, more accurate and cost effective, and as a result this is driving an evolution of new time-critical products and services.
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Product
ELECTRIC BRAKE FORCE METER WITH DYNAMIC LOAD SIMULATION AND CIRCUIT TESTING
MDTT9107
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*Tests truck-side brake controller output and all towing-lighting functions without a trailer*Displays real-time brake controller output gain and timing*Quickly troubleshoots electrical circuits and ground condition*For use with aftermarket and integrated brake controllers*Microprocessor controlled; simulates trailer brake loads*25' cable allows one-man, in-cab testing of brake controller and all truck-side tow circuits*Use to verify that the vehicle’s adaptive (speed/load sensitive) brake-controller output is functioning properly
