Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Product
COM Express basic Type 7 with Intel Atom processor
COMe-bDV7
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The COM Express module COMe-bDV7 based on the Intel Atom processor C3000 series extends Kontron's product family of server-grade COM platforms. The COMe-bDV7 as an entry level platform is as a complementary product to the high performance class COMe-bBD7 equipped with the Intel Xeon processor D-1500 series. The COMe-bDV7 module features scalable CPU performance with up to 16 cores.
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Product
Microscope Cameras
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High-performance USB microscope cameras with the latest SONY global and rolling-shutter sensors and advanced feature sets such as external trigger and readout functions.
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Product
Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Product
High-Resolution Scanning Probe Microscope
SPM-8100FM
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The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Product
Peel Back Force Tester
PBFT
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Precisely measure the peel back force of carrier tape to verify your packaging systems are within specification. Results can be printed and stored with the outgoing product.
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Product
Force Sensors
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HBK Force Sensors and Force Transducers with strain gauge or piezo technology measure static and dynamic tensile and compressive loads up to 20 MN - with virtually no displacement.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type L, Ø1.50mm, 305gf
K100-L150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style L, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Prbobe For PCB, K100 Series 100 Mil Pitch, Receptacle With Wire Wrap Pin
KR100-WP
Spring Probe
K100 Series, Pitch 100mil, Receptacle, with wire wrap pin. Brass with gold finish.
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Product
Quartz Impact Force Sensors
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Impact-style sensors are specifically designed for impact force measurements. The sensor is typically mounted in a free-standing manner with the installed impact cap directed toward the oncoming object with which it will collide.
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Product
CVAF – Cold Vapor Atomic Fluorescence
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Cold Vapor Atomic Fluorescence (CVAF) is a powerful technique based on detecting fluorescence light emitted by the sample. Below the principle of the technique is explained in a nutshell.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 305gf
K100-Q080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 155gf
K100-C150155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Product
Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Product
Force Calibration
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Trescal provides full Force Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Force Calibration services can be delivered at your site or at our lab. Accreditations for our force calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Product
Laser Scanning FLIM Microscopes
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DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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Product
COM Express R3.1 Type 6 Compact Size Module With X7000RE And X7000C Intel® Atom® Processors (Amston Lake)
cExpress-ASL
Computer on Module
The cExpress-ASL is a COM Express® COM.0 R3.1 Type 6 Compact size module featuring up to 8 core, 64-bit real-time-capable (with Intel TCC and TSN support) Intel® Atom™ x7000RE and x7000C processors (formerly “Amston Lake”). The cExpress-ASL combined with soldered-down memory and extreme temperature option, is specifically engineered for customers who need entry-level computing with real-time prowess, a balanced cost structure, and extended product life support for ruggedized edge solutions running 24/7.
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Product
"Bay Trail" Atom Processor
XMC-120
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Curtiss-Wright Defense Solutions
The XMC-120 from Curtiss-Wright Defense Solutions is a small form factor and low power x86 single board computer (SBC). Designed for space-constrained size, weight and power (SWaP)- sensitive programs, the XMC-120 offers quad-core x86 processing performance with ultra low power and small sized footprint.
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Product
3U CompactPCI Quad-Core Intel Atom® Processor X Series Blade
cPCI-3630
Processor Blade
The ADLINK cPCI-3630 Series is a 3U CompactPCI® 2.0 processor blade featuring the 64-bit Intel Atom® Processor X Series SoC (formerly Apollo Lake I) and soldered DDR3L-1600 MHz ECC memory up to 8GB.
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Product
Intel® Processor N Series And Atom® X Series Expandable, Cost-Efficient Modular Industrial Computers
MXC-330
Industrial Computer
Intel® latest ADL-N cost-performance embedded Fanless system, DDR5 SO-DIMM, various IO interface for different industrial applications, including Isolation COM port & DIO, 4x GbE LAN, M.2 expansion slot for general application.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 305gf
K100-C150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Product
Force Measurement & Torque Measurement Test Stands
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Mark-10 offers the industry's most extensive line of manual force measurement and torque measurement test stands. Test stands are useful in eliminating variability inherent in hand testing and can help to automate test processes. A wide range of capacities, loading methods, and configurations are available. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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Product
Force Sensors
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Here at Flintec, our force sensor range provides solutions that integrate effectively into a wide variety of industrial applications. They include customized load pins, extensometers, torque sensors and a range of miniature force sensors.
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Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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Product
High Force DMA
DMA 3200
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The DMA 3200 combines decades of cutting-edge fatigue and world-leading Dynamic Mechanical Analysis technologies into a unique and highly versatile testing platform. The patented, frictionless Electroforce® motor technology, superior mechanical design, efficient environmental control, and wide variety of clamping systems deliver superior data accuracy for the broadest range of applications.
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Product
Intel Atom® Processor E3900 Family-Based Ultra Compact Embedded Platform
MXE-210 Series
Embedded Platform
ADLINK’s new Matrix MXE-210 series of ultra compact embedded platforms, based on the Intel Atom® x5-E3930/x7-E3950 Processor, delivers optimum I/O design for maximum connectivity.
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Product
Upright Light Microscopes
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Get the publication-quality imaging and customizable upright microscope solution you need for your Life Science research with Leica Microsystems. These powerful imaging systems feature constant color, natural light illumination, superior optics, and configurable options to provide high contrast, brilliant images for your cutting-edge biological research.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 230gf
K100-C150230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 155gf
K100-Q080155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 155gf, Steel with Gold Plating.
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Product
Inverted Raman Microscope
XploRA INV
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The XploRA INV inverted Raman microscope combines the automation features and small footprint of the standard XploRA™ Raman microscope with the unique sampling capabilities of an inverted microscope, especially important for demanding biological applications.
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Product
Force Sensors
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General purpose force sensors are offered in either stud or axial mounted configurations. They are internally pre-loaded and can be used for dynamic compression, tension, and impact force measurements. Tapped mounting holes on both ends of the radial connector style support link, platform, integrated link, and free-standing installations. The axial mounted type offers protection of the electrical connector and sensor cable from potential damage during drop testing and in free-standing installations. Supplied impact caps facilitate impact and drop force measurements.
