Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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ATOM Handler
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The ATOM-IC Handler is a benchtop handler designed for use on engineering test floors and in development operations. Its innovative design allows for maximum flexibility and minimum cost and maintenance.
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Force Testing
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Force testing is a way of determining how an object will react when it is subjected to tensile or compressive loads
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Intel Atom® Processor-Based Fanless Open Frame Touch Panel PC
SP2-EHL Series
Panel PC
- High power efficiency with Intel Atom® x6000E series processors (formerly Elkhart Lake)- 7"/10.1"/15.6"/21.5" PCAP touch screen- Wide input voltage range 9-36V DC- Full customization for fast integration with all form factors, kiosks, and all-in-one panel PC applications- Extensive I/O and function expansion through board-to-board connectors (Function Modules)- Simple cabling with optional Power Over Ethernet (60W)- Supports up to 3 displays, including integrated panel, DisplayPort, and USB Type C (Optional)- Pre-compliance EMC testing and high ESD tolerance
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Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer
QuickTrace M‑7600
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The QuickTrace® M-7600 Cold Vapor Atomic Absorption (CVAA) Mercury Analyzer easily achieves the ultra-trace mercury detection limit of <0.5 ng/L. The QuickTrace® M-7600 is ideal for ultra-trace to sub-mg/L mercury quantitation. The M-7600 is designed for routine and research use in a variety of settings, including environmental laboratories, industry, and research institutes, for virtually any aqueous acidified sample.
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Breaking Force Tester
ZDY-02
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ZDY-02 Breaking Force Tester is applied for break force test of the ampoule, lipstick, lip cream and other materials.
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Your Automated Microscope For Live Cell Imaging
ZEISS Celldiscoverer 7
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Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
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The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Digital Microscope Accessories
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Variety of extra accessories , such as macro lenses, remote control consoles, illuminations, image/video capture, software, stands and stages are available for Inspectis digital microscopes.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 155gf
K100-C150155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Industrial Microscope for Materials Science & Industrial Applications
BX53M
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Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
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Intel® Atom™ E3825 & Celeron® N2930 Pico-ITX SBC, DDR3L, 18/24-Bit LVDS, VGA, DP/HDMI, 1 GbE, Full-Size Mini PCIe, 4 USB, 2 COM, SMBus, I2C, MSATA & MIOe
MIO-3260
Single Board Computer
Embedded Intel® Atom™ E3825 & Celeron® N2930 up to Quad-Core processor design, DDR3L 1333MHz support up to 8GBIntel Gen 7 DirectX®11.1 support, Dual Independent display: 18/24bit LVDS, VGA, DP/HDMIFlexible design using integrated multiple I/O: MIOe to approach vertical applications & keep domain knowhowIntel GbE support, Rich I/O interface with 2 COM, 1 SATA, 4 USB 2.0, GPIO,SMBus, I2C, and MIOe expansion interfaceSupports iManager, SUSI APIs, WISE-DeviceOn and Edge AI Suite
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SMARC Short Size Module, Intel® Atom® X7000 Series (Amston Lake) Processors
LEC-ASL
Computer on Module
The ADLINK LEC-ASL is a SMARC module that supports 2/4/8 cores Intel® Atom® x7000RE (x7211RE, x7213RE, x7433RE, x7835RE) and x7000C (x7203C, x7405C, x7809C) Processors (formerly Amston Lake) with integrated Intel® UHD graphics and high-speed interfaces. LEC-ASL modules support up 16GB LPDDR5 memory, up to 256GB eMMC storage (build option) and are also available with rugged operating temperature range and low power envelope, making them a perfect match for mission critical fanless edge computing applications that run 24/7.
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Coercive Force Meter
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The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Force Sensor Elements
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The STL Force Sensing Tension Links are a series of unique force sensors. The Tension Links utilize the internal strain gage process sucessfully and are used in bolts, load pins and flat load cells. The sensing element consists of a strain gage bridge circuit internally installed in a small hole along the longitudinal axis. This unique arrangement provides a most effective means for the protective sealing of the internal electronics while minimizing the adverse effects of extraneous torsion and bending loads.
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Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Intel Atom® Processor E3900 Family-Based Ultra Compact Embedded Platform
MXE-210 Series
Embedded Platform
ADLINK’s new Matrix MXE-210 series of ultra compact embedded platforms, based on the Intel Atom® x5-E3930/x7-E3950 Processor, delivers optimum I/O design for maximum connectivity.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
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The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 155gf
K100-G150155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Stereo and Zoom Microscopes
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Generate three-dimensional and laterally precise images. With Stereo Microscope you observe large samples such as leafs and tissues or inspect rough material surfaces. Upgrade your microscope flexibly with different digital cameras and benefit from various types of illumination techniques.
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Measuring Microscopes, Image Processing
Milling & Drilling
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Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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COM Express Type 10 Mini Module With Intel® Atom™ E3800 Family
CEM846
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The CEM846 COM Express type 10 Mini module is powered by the Intel® Atom™ processor E3800 family (codename: Bay Trail) with Intel® HD graphics (Gen 7with 4EU) engine. The CEM846 addresses the need for modular and small form factor computing platform that provides flexibility and scalability, and aimed at operating in an extended range of temperature. The computer on module is only 84mm x 55 mm form factor which supports onboard 4 GB DDR3L memory, wide voltage, rich I/O, and four lanes of PCle interfaces. From all these features together, the Intel® Atom™-based COM Express type 10 CPU module can be widely applied to IIoT (Industrial Internet of Things), medical, transportation, security, military, portable device and many more.
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Atomic Spectroscopy Software
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The range of Agilent atomic spectroscopy software, available with and without compliance solutions, includes SpectrAA, MP Expert, ICP Expert and ICP-MS MassHunter software.
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Thermal Microscope Stage For Petri Dish
TS-4SMP
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With our TS-4SMP Thermal Stage for Petri Dish, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C. The collar on the stage is designed to accommodate a 35mm 'Nunc' petri dish. The collar may also be removed for use with slides.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 230gf
K100-I126230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 230gf, Steel with Gold Plating.
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Rugged Conduction Cooled 3U CompactPCI Processor Blade with Quad-Core Intel® Atom™ Processor
CT-3620
Processor Blade
The ADLINK CT-3620 Series is a Rugged Conduction-Cooled 3U CompactPCI processor blade in single-slot (4HP) width form factor featuring a quad-core Intel® Atom™ SoC and soldered DDR3L-1333 ECC memory up to 4GB. Graphics is integrated graphics on the CPU and storage is provided by an onboard 32GB SSD. Rear IO signals include 2x GbE, 1x USB 2.0, VGA, 2x COM, and 1x SATA 3Gb/s, providing for expansion with an optional Rear Transition Module (RTM).
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type D, Ø0.80mm, 230gf
K100-D080230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style D, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Force Sensors
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HBK Force Sensors and Force Transducers with strain gauge or piezo technology measure static and dynamic tensile and compressive loads up to 20 MN - with virtually no displacement.
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Intel® Atom™ E3900 & Pentium® / Celeron® Processor COM-Express Mini Module
SOM-7569
Computer-on-Module
COM R.2.1 Type 10 Mini Module, Intel® Atom™ E3900 & Pentium® / Celeron® Processor, Max 8GB DDR3L onboard memory (support ECC, E3900 SKU only).
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Ultra-Compact, Fanless, Low-Power Edge Computing Platform Powered By Intel® Processor N Series Or Atom® Processor X Series
MXE-230 Series
Industrial Computer
The MXE-230 Series computers, powered by the Intel® Processor N Series or Atom® Processor X Series, deliver low power consumption at just 12W. With an ultra-compact size of 165 x 120 x 62 mm (1.2L), they are ideal for space-constrained environments. The system supports up to 16GB DDR5 4800MHz memory, operates in temperatures from -20°C to 60°C, and offers two independent 4K 60fps display outputs. It also includes multiple I/O expansion options, such as M.2 and adaptive function modules, along with built-in TPM 2.0 for enhanced security.
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FOV Micro Measuring Microscope 4.0
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The new ultra-compact digital micro measuring microscope from Opto is the perfect tool for on-site measurements in production.
