-
product
Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
-
product
Sampling Systems And Accessories
Parker's selection of sampling systems and accessories features fuel-drip bunker samplers; mini-sample cylinder valves; ultral-seal constant pressure cylinders for gas or liquid applications; single-flow, dual-flow and hot-tap probes; spun end sample cylinders for sample transportation; heated-enclosure systems for use with natural gas samplers; and composite gas samplers, among other solutions.
-
-
product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74T80-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
-
product
Special Purpose Probes
6100 Series
Similar to a standard 10X scope probe except with BNC connections on both ends. With BNC connections on both ends, it provides a more stable connection when connecting to other equipment. This eliminates the use of a standard probe with a BNC adapter on the probe end that could come loose or break off the probe tip. The lead can be compensated to your scope with the trimmer tool included.
-
product
POF Ext Ø 1,5mm 600mm, from Light Probe to VPC ITA Contact (R)
YAV90CLR11
600mm Length. 1,5mm External diameter.
-
product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1I8-4
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25J-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
-
product
4.0mm Hazardous Live Parts Probe
CX-4.0
Shenzhen Chuangxin Instruments Co., Ltd.
Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin®. The rod is made of stainless steel.
-
product
High Voltage Non-Contact Current Probe
P02-0802
The TESCO High Voltage Non-Contact Current Probe (Catalog No. P02-802) was developed using current sensor technology. It is a two-piece, True RMS ammeter with a fiber optic link between the high voltage sensor and the readout at ground potential. The sensor is mounted on a hotstick and slipped over a high voltage line.
-
product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1L24-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
-
product
Surface & Volume Low Resistivity Meter for Conductive Materials
Loresta GP
The Loresta GX Meter is an intelligent, multi purpose low resistivity meter equipped with software that calculates resistivity correction factors. A variety of 4 pin probes are available for use with the Loresta GX. The instrument is typically used in Product Engineering, R&D, and Quality Control. Applications include measurement of conductive paint, conductive plastics, conductive rubber, conductive film, silicon wafers, antistatic materials, EMI shield materials, conductive fiber, conductive ceramics, etc.
-
product
NEXTest 7
PK-2030/2032/2033/2036/2037/2038
NEXTest 7 is an advanced and unique tester in the market. It's designed to check and troubleshoot the pin connections of Display port & HDMI prior to installation on equipment. By using advanced technology to verify the integrity (20 pins + shield) of both display port and HDMI cables, especially for HDTV installation and DIY termination in the field, solving your cable testing need, unlink all of the other testers verify 9 circuits only. It checks for opens, shorts, miswires and intermittent faults in all conductors plus shield continuity, most tester only test for opens. It displays cable map results of both TX (near end) and RX (far end) on the main unit, either on testing before or after installation cables. User can easily read and determine the actual 21 pins configuration on main unit. It employs both auto and manual scanning of 21 wires. Tone Generator mode transmits two selectable tones on each pin for use with Net Probe (PR-06P) optional, enables one to quickly locate a cable. It's capable of testing up to 8 cables and locations at one time. NEXTest 7 especially features a self-learning mode to memorize cable pin out for testing large quantity standard or custom cables for PASS/FAIL a snap, makes testing quick and more efficient.
-
product
Clamp Meters
Basic functions:AC current: 40/400/1000ADC current: 40/400/1000AAC voltage: 4/40/400/750VDC voltage: 400mV/4/40/400/1000VResistor: 400/4/40/400K/4/40MTemperature: -20 to +750°CFrequency: 10/100/1000Hz/10/100kHz/10MHzDuty cycle: 0.1 to 99.9%Capacitance: 5nF/50nF/500nF/5μF/50μF/200μFSpecial functions:Auto rangingNCVDiodeContinuity buzzerLow battery displayData holdRelative data holdAuto/manual range shiftZeroAuto power-offOverload protectionSampling frequency: 3 times/sMaximum display: 3999Maximum open distance of clamp mouth: 55mmGeneral characteristics:Color: iron gray and orangeNet weight: approximately 274gLCD size: 46 x 32mmSize: 245 x 90 x 33mmPower: 1 x 9V and 6F22Packing content:CartonHandheld bagEnglish manualTesting leadBatteryTemperature probe
-
product
Digital Pocket Psychrometer
DTH35
UEi Test & Measurement Instruments
Digital pocket psychrometer with probe cover that can be used as an extension
-
product
Auto Load 4 Moving Probe Tester
AL Series F4H4033AL
Medium and High Volume Production Model with Auto Loader. Max. Test Area 15.7 x 13" (400x330mm). Max. Transferable Panel Size 16.5 x 13.4" (420x340mm). Number of Probes 2 Upper, 2 Under. in. Pad Pitch *4 0.00236" (60µm). Min. Pad Size *5 0.00118" (30µm).
-
product
1 GHz 60 V Common Mode Differential Probe
DL10-HCM
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
-
product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
-
product
Wireless Inspection Cameras
General offers three wireless inspection cameras whose probes can be disconnected from the grip and monitor. They are the DCS18HPART (with a 6mm/0.23 in. diameter articulating probe), the DCS1800HP (with a 5.5mm/0.22 in. diameter non-articulating probe), and the DCS500 (with a 9mm/0.35 in. diameter probe and a 5 in. diagonal color LCD). Wireless inspection cameras offer operating flexibility because the user can use both hands to manipulate the probe.
-
product
Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
-
product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Pile Thickness Tester
TF640
TESTEX Testing Equipment Systems Ltd.
The gauge is positioned on the carpet and six loaded needles penetrate the pile until they make contact with the denser backing. The pile surface is located by a flat probe. The pile thickness can then be read directly from the digital gauge.
-
product
Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
-
product
Logic Analyzers
A Keysight logic analyzer helps you minimize project risk by providing the most reliable, accurate measurements and the most complete view of system behavior. This comprehensive family of logic analyzer offers the measurement capabilities, probing, logic analyzer application support and analysis tools to meet your toughest digital debug needs.
-
product
Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72T38-6
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
-
product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25J-16
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
product
Custom Probe
When your application demands a unique set of physical attributes, Everett Charles Technologies’ team is ready to provide a custom solution. ECT has been providing custom spring probes for over 50 years. By leveraging this vast experience ECT can effectively work with you to understand your requirements and translate them into a targeted solution.
-
product
Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30U
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
