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DisplayPort 2.0 Receiver Test
N5991DP2A
Use the Keysight N5991DP2A DisplayPort 2.0 Receiver Test Software to test, debug and characterize your DisplayPort Sink products maximizing the usage of your test instruments.
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100 Watt Dynamic Measurement DC Source, 20V, 5A
66332A
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections. The Keysight 66332A Dynamic Measurement dc Source provides dynamic measurement and analysis of voltage and current waveforms. It is ideal for testing digital wireless communications products/components because it not only provides the power for testing, but also performs the peak current measurements required to characterize the pulsed current demands of these products.
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LXI Microwave Matrix, 20GHz, Single 3x3, Terminated With Loop-Thru
60-751-133-C
The 60-751-133-C is a single 3x3 20GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Environmental Monitors
The tools and techniques designed to observe an environment, characterize its quality, and establish environmental parameters, for the purpose of accurately quantifying the impact an activity has on an environment.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Molecular Spectroscopy
Characterize advanced complex materials on any budget. Our comprehensive portfolio of analytical solutions has the ideal molecular spectroscopy instruments for any lab to measure UV, infrared, and fluorescence.*Higher accuracy, increased sensitivity*Sample size flexibility*Wide array of sampling techniques*Shorter sample setup time*Easy-to-use software providing expert results
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LXI Microwave Matrix, 10GHz, Single 8x4, Terminated With Loop-Thru
60-750-184-C
The 60-750-184-C is a single 8x4 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Power Analyzer
HMC8015
The R&S®HMC8015 Power analyzer is a compact tester for AC/DC load and standby current characterization that enables measurements without additional tools such as a computer or remote infrastructure. In addition to a numerical and graphical display with 26 key parameters, the instrument delivers performance and compliance protocols in line with IEC 62301, EN 50564 and EN 61000-3-2.
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Test Cells
Our test cells accurately characterize the dielectric properties of liquids and solid material.
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Dynamic Vapor Sorption Analyzer
IGAsorp
The IGAsorp is a fully automated compact benchtop DVS analyzer, for fast and accurate vapor sorption measurements using the dynamic flow technique for water and organic solvents. Measured vapor uptake isotherms and kinetics are used to characterize, test and evaluate materials in precisely defined environmental conditions.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-03
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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High Voltage Optically Isolated Probe, 350 MHz Bandwidth. Includes soft-carrying case.
DL03-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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HV-Test System for Capacitor Packages
The system is used to characterize the leakage currents of capacitor packages. LXinstruments implemented a project-specific PCBA for the required HV switching. The measurement technology consists of Keithley source meters and USB based devices. The DUT adaptation with safety technology was realized in cooperation with ATX.
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Phase Noise Analyzer and VCO Tester
FSWP
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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Multi-Fabric Switch
PEX431
Designed to enable the development of complex, scalable, high performance 3U VPX systems in today’s increasingly-connected military/aerospace world, the PEX431 is characterized by significant flexibility. The PEX431 Multi-Fabric Switch and XMC Carrier Card allow designers to build complex VPX systems with multiple single board computers and multiple I/O modules. PEX431 supports PCIe switching, GigE switching and the ability to host a XMC mezzanine.
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PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-01
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Dual Blackbody Wide FOV
Dual blackbody, all reflective background IR target projector is used to characterize WFOV IR sensor systems. It features a broadband, 3 to 14 micron range, reflective IR target technology for the most accurate and stable differential targets, controlled background radiance, a 5º FOV with 36º uniform background.
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PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Uncooled Microbolometer
384 x 288 FPA
Drawing on its extensive experience in microbolometric detector design, fabrication, and characterization, as well as in detector-to-ROIC (Read-Out Integrated Circuit) monolithic integration, INO is proud to offer its 384 x 288 pixel microbolometer FPA (Focal Plane Array) in short series.
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Multiplexer 2:1 With De-Emphasis 32 Gb/s
M8062A
R&D and test engineers who need to characterize serial interfaces of up to 32.0 Gb/s can use the M8061A 2:1 Multiplexer with optional de-emphasis to extend the rate of J-BERT M8020A and J-BERT N4903B pattern generator. For the most accurate receiver characterization results, the M8061A provides four calibrated de-emphasis taps, which can be extended to eight taps, built-in superposition of level interference and Clock/2 jitter injection. The M8061A is a 2-slot AXIe module that can be controlled via USB from the user interface of J-BERT M8020A as well as N4903B.
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COLOSUS
The COLOSUS line of electro-optical test systems from Santa Barbara Infrared Inc. and Labsphere Inc. include collimated optics, software and uniform sources for the optical characterization of sensors and cameras.
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ST Connectors
FY7
A straight tip or ST connector is characterized by its quick release bayonet style lock and spring loaded ferrule to hold the fiber. Most commonly used in network applications such as LANs, and Data Processing Networks, they are also found in Premise installations and Instrumentations applications. Horizontally mounted simplex and duplex adapters are available with metal or plastic housings.
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CD Measurement and Advanced Film Analysis
FilmTek CD
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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White Light Continuum Generator
JIBE
A powerful coherent light source. Due to its amazing wide spectral band, the white light continuum is being applied in different areas such as optical parametric amplification, optical metrology, optical coherence tomography, materials characterization, etc.
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Particle Size Analyzers
Particle systems can be complex, but measuring them doesn’t have to be! Anton Paar offers two different technologies to characterize particles from the nanometer to the millimeter range. The Litesizer series employs light-scattering technology to determine not only particle size, but also zeta potential, transmittance, molecular mass, and the refractive index of nano- and microparticles in liquid dispersions. The PSA series uses laser diffraction technology to measure the size of particles in both liquid dispersions and dry powders in the micro and millimeter range. Side by side they open up a wide range of possibilities for comprehensive particle characterization.
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MXG X-Series RF Vector Signal Generator, 9 kHz to 6 GHz
N5182B
Take your designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading ACPR & output powerTest wideband devices with factory-equalized 160 MHz RF bandwidthReduce the time spent on signal creation with Signal Studio software, including LTE, WLAN & GNSSLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
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PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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FT-NIR Analyzer
ASP400 series
The TALYS ASP400 series analyzer is designed to achieve monitoring and control of continuous processes. Its seamless installation enables real-time process monitoring, determination of stream properties or physical qualities, process characterization and early troubleshooting. This analyzer is suitable for a wide range of refinery process monitoring applications including naphtha conversion units such as catalytic reforming, isomerization, naphtha hydro-treating and steam-cracking as well as applications in HF alkylation, gasoline blending and LPG.
