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Product
DUT Prototype Board
DPB8800
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The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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Product
DUT Matrix 32 DUT Matrix Channels
40-530-021
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The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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Product
CMX RF Port Extender
CMX-Z25
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Complex devices under test (DUT) come with additional antenna ports to support low, mid and high bands - and advanced MIMO schemes such as 4x4 MIMO. The R&S®CMX-Z25 is the solution: Up to 16 DUT ports can be supported with just 4 ports from R&S®CMX500. So even prototypes of 5G smartphones, tablets, laptops or industrial modules with an extended number of antenna ports can now be connected to a single R&S®CMX500. Together with the scalable CMX architecture any 5G and 5G Advanced mobile device can now be tested in one go - without recabling or 3GPP band combo limitations.
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Product
Load Simulator
Simulator
The load system is intended for testing satellite power supply systems; due to the integration with a solar array simulator and a battery simulator, it can perform validation and commissioning of satellite power supplies. The system is equipped with regenerative electronic loads and customer-specific high-power switching matrices for routing the DUT channels to the relevant loads. The individual voltages and currents for each channel can be read back via a Keysight Technologies switch mainframe.The system is equipped with high electrical power; its loads are capable of feeding the energy back into the power grid.
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Product
PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
Programmable Power Supply
The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
High-Performance Autoranging DC Power Module, 50V, 10A, 100W
N6752A
Power Module
The Keysight N6752A is a 100 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Product
Scienlab Measurement And Control Module
SL1066B
Communications Module
The Measurement and Control Module SL1066B is a rack-mount measuring and control module that provides adjustable voltage outputs for BMS and DUT power supply and floating relay contacts to simulate e.g. vehicle specific terminals 15, 30 and 31.
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Product
Wireless Measurement System for ETSI & FCC Devices for ISM Bands
TS8997
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The R&S®OSP-B157W8 PLUS 7.5 GHz module with up to eight channels is the core of the system and uses a printed RF switch board in solid-state relay (SSR) architecture. It allows flexible operation of the connected DUT (up to eight ports) for power measurements, signal conditioning via the integrated attenuators, couplers and combiners, RF switching to the measuring instruments in combination with the R&S®OSP-B157WX up to 40 GHz and is controlled by R&S®WMS32 software.
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Product
Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Product
Drive Controller Function Test
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Graphical Waveform Editor and Instrument
PI-PAT
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Much more than just a visualization tool, PI-PAT is a full-fledged graphical waveform editor that allows you to spend more time testing and less time programming. PI-PAT doesn't require any programming experience or complicated syntax. Just draw or type patterns directly into the pattern window. Move a clock edge by dragging it. Adjust integration times by entering a single number. Change the output to your DUT by clicking the Update button. You'll never have to wrangle DSP or FPGA code with PI-PAT.
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Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7205B
Attenuator
The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.
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Product
Bidirectional DC Power Supply + Regenerative Load
62000D
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Chroma Systems Solutions, Inc.
Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.
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Product
Semiconductor Memory Tester
T5851
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Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
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Product
Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
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The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Safety Tester
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Designed to ensure safe operation of DUTs under various operating conditions and environment.
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Product
PXIe-4154, 2-Channel, 8 V, 3 A PXI Programmable Power Supply
781155-01
Programmable Power Supply
2-Channel, 8 V, ±3 A PXI Programmable Power Supply—The PXIe‑4154 is a specialized programmable power supply for battery simulation. It is designed to simulate a lithium‑ion battery cell’s transient speed, output resistance, and 2‑quadrant operation (source/sink). Critical to many RF and wireless applications, the simulator’s fast transient response time allows it to rapidly respond to changes in load current with minimal voltage dip, which makes the PXIe‑4154 ideal for powering devices under test (DUTs) such as RF power amplifiers, cellular handsets, and a variety of other mobile devices. To model the behavior of a battery more accurately, you can use the onboard programmable output resistance to simulate a battery’s internal resistance. For quiescent and standby current measurements, the PXIe‑4154 features integrated current measurement.
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Product
SNR Noise Generator
CNG-EbNo
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The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.
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Product
Sound Harmonics and Current Analyzer
H74050100
Audio Analyzer
This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.
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Product
TVAC CalPod, 20 GHz
85532B
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CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button, and without removing the DUT or re-connecting standards. Very useful in thermal-vacuum chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the testing to perform a normal re-calibration.
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Product
DC Power Module, 8 V, 6.25 A, 50 W
N6732B
Power Module
The Keysight N6732B 50 W basic DC power module provides programmable voltage and current, as well as measurement and protection features at a very economical price. Use this module to power your DUT or ATE system resources, such as fixture control.
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Product
PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
Programmable Power Supply
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Product
Low-Leakage Cables For SMU
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Low-Leakage Cable For SMU helps you connect the GND, LO, and LO SENSE terminals of a PXIe-4135 PXI Source Measure Unit (SMU) together, and the flying lead cable helps you daisy-chain multiple PXIe-4135 SMUs together. Daisy-chaining the PXIe-4135 SMUs allows the modules to share a common LO and reduces the number of SMU LO cables that need to be connected to the interface board or device under test (DUT).
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Other Passive Probes
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Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
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Product
High-Performance Autoranging DC Power Module, 20V, 50A, 500W
N6755A
Power Module
The Keysight N6755A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Product
Precision Low-Loss Multiplexers
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Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.
