-
product
Hardware Platform
SmartScan 3D
SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
-
product
Pump Test System
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
-
product
Semiconductor Testing
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
-
product
Signal Generator Frequency Extenders
FES
These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
-
product
PXI Multiplexer Switch Module
PXI Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
-
product
Test Connector Components
Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
-
product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
-
product
Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
-
product
Plane Wave Converter
PWC200
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
-
product
Other Passive Probes
Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
-
product
Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
-
product
VPC Receiver Frame
ABex REC21-84TE-EXT
Robust and flexible interconnect solution for test fixtures. Designed for the use with ABex PXIe Rack 18 it provides support to equip all 21 slots with VPC interconnect modules. In addition, it offers 6 more slots on the bottom, below the ABex rack to feed through signals from external measurement devices.The interface uses the well-known Virginia Panel connectors with more than 20.000 guaranteed mating cycles. To build DUT specific test fixture, we also provide the corresponding ITA mounting frame (ITA = Interchangable Test Adapter).
-
product
Adjustable Multisite Rail System™
The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without affecting the thermal equilibrium of the system.
-
product
Multichannel Source Measurement Unit
AXS844x
Run tests simultaneously on 4 channels with up to 400 V. Carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for direct testing of high-voltage RGBW LEDs
-
product
Shield Boxes
Concentric Technology Solutions, Inc.
CTS can provide a customized integrated RF Shield Box or RF Enclosure Test Solution for manual or automatic testing at an off-the-shelf solution price. Many companies make RF Shield boxes, RF Enclosures or DUT fixtures, but only CTS bridges the gap by providing a complete integrated RF Shield Box or RF Enclosure testing solution for providing the RF shielding needed for repeatability within your budget and schedule.
-
product
DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
-
product
Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
-
product
±6 kV ANSI/ESDA/JEDEC 2-Pin HBM Tester
HBM-S1-B
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) 2-pin tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*Optionally available upgrade for all HPPI TLP-3010C, 4010C, 8010A, and 8010C hardware systems and software (upgrade on request)*Suppression of trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT voltage and DUT current sensor for real time voltage and current monitoring*Integrated DC test DUT switchIntegrated hardware 50 Ω trigger output for high speed digital oscilloscopesIntegrated overvoltage protection of voltage sense and DC test interfaces for oscilloscope and SMU protection during high voltage HBM testing*Fast and efficient HBM measurements including transient waveform data management using the HPPI TLP software*Compact size 145 mm x 82.5 mm x 44 mm
-
product
Optical Spectrum Analyzer Module
OSAPXIe
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
-
product
Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
-
product
Shock Testing
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
-
product
PXI/PXIe Source Measure Unit Family
PXS(e)840x
The PXS840x PXI SMU family is a high-speed, 4-quadrant source measure unit. Carry out measurements directly on the DUT with the integrated CMU and VMU.
-
product
Power Supplies And Loads
Power Supplies and Loads power devices under test (DUTs) such as RF power amplifiers and cellular handsets. The power supply takes in AC power and delivers DC voltage with a fixed polarity, either positive or negative, to its load.
-
product
Vibration Shakers
Vibration Shakers and Modal ExcitersFull range of modal and inertial shakers with integrated and easy-to-use amplifiers. Our permanent magnet shakers are compact, lightweight, and powerful general-purpose shakers that can be used for modal and vibration testing. They have a high DUT capacity despite their small sizes.
-
product
Exchangeable Cassette Kit for 6TL36 Faraday Chamber
AN134
Exchangeable plates for RF applications. (Use with RF Kit, P/N AN133)).DUT maximum dimensions: 340 x 350mm
-
product
DC Power Module, 35V, 1.5A, 50W
N6734B
The Keysight N6734B is a 52.5 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
-
product
Dial Strain Gauge
DRK8093
Shandong Drick Instruments Co., Ltd.
This stress (birefringence) sources are due to uneven cooling or external causes such as mechanical action, which directly affect the optical glass, glass products, quality transparent plastic products. Therefore, stress control is optical glass, glass products, plastic products, such as transparency in the production process extremely important part. The strain gauge can be qualitatively or quantitatively by observing stress to identify products (DUT) quality, are widely used in optical glass, glass, transparent plastics industry for fast, a lot of testing. In fact, it can not be solved by math the complex problems.
-
product
P-Series Single Channel Power Meter
N1911A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
-
product
PXI 8/16-Channel Isolated D/A Converter
M9185A
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
-
product
DSR Pattern Editor Software
M9192A
The Keysight M9192A DSR Pattern Editor Software adds additional advanced capability to the Keysight M9195A/B PXIe digital stimulus/response (PXI DSR) modules by providing a graphical user interface for the development system. M9195A/B error log files can be dragged-and-dropped into waveform editor which speeds up the debugging of tests; this gives immediate visibility of discrepancies between the expected state in the ATE patterns with that of the DUT.
