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DUT Prototype Board
DPB8800
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
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Flex Test Fixtures
FTFs are test fixtures which are dedicated for testing flex-based components and assemblies such as displays, touch panels and more. A weak spot in a typical functional test system is the method to connect DUT flexible cable to a circuit board where the simple method of attaching the flex directly with an ZIF or LIF connector fails.
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Test/Debug Bench Station
No. of Tahoe Drivers: 1 (1:1 Driver/BIB ratio)No. of Voltages available per BIB Slot: (16 (PS1…PS16)Same Dynamic Stimuli, DUT Monitoring and Sierra™ Software as the system.
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High Current SMU 1000 A
AXC7583
Generate extremely short, fully regulated current pulses from 300 µs up to 1000 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.ven Bauteilen.
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Safety Testers
Safety testers (also named hi-pot tester/hipot tester/hipot test) are designed to ensure safe operation of DUTs under various operating conditions and environment.
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3U CPCI 32-bit Test Extender
Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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High Flexibility VNA Cables
Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required. The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.855mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Electrical Safety Testers- Hipots
Safety testers (also named hi-pot tester/hipot tester/hipot test) are designed to ensure safe operation of DUTs under various operating conditions and environment.GW Instek’s GPT-9900/GPT-9800/9600 series safety testers(hipot test) provide safe and quick measurement tools for AC/DC withstanding voltage tests, insulation resistance tests, and AC ground bond tests. Those tests are required by many international safety regulations such as CE, UL, VDE, and etc. We also have leakage current tester, GLC-9000, which supports all the major leakage current test standards for medical and general electronic equipment.
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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Production Line Acoustic Test Chamber
PLATC
The Production Line Acoustic Test Chamber from GRAS is designed for quick and qualified acoustic test of cell phones, tablet PCs, Bluetooth speaker systems etc., including frequency response, THD, Rub & Buzz and microphone test using optional sound source. The chamber has a number of connections for injecting test and control signals to the test object (DUT).Benefits include:Repeatable testing and reliable dataEasy open/close for quick and safe change of DUTFlexible test jig for easy adjustment to new DUTFlexible microphone mounting for both front/backside speakers as well as edge-mounted speakersHigh quality, high sensitive 1/4” CCP measurementmicrophone included (G.R.A.S. 46BL)Individually calibrated frequency response** Compared to reference measurement in anechoic room
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PXI RF Multiplexer Switch Module
PXI RF Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI RF Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
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High Current SMU 600/1200/2400 A
AXC85xx
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
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High Current SMU Family 250 A
AXC757x
Generate extremely short, fully regulated current pulses from 300 µs up to 250 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Multi-DUT Mobile & IoT Test System
IQxstream-M
Its ultra-compact design and flexible architecture makes it highly suitable for high volume manufacturing of smartphones, tablets and cellular IoT modules.
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MIPI Receiver Test Solution
M8085A
The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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Cryogenic 4K Probe Cards
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Multi-Channel Attenuation Control Unit (4-channels), DC to 6 GHz, 0 to 121 dB, 1 dB Step
J7204A
The J7204A is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 6 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204A reduces cost of ownership and provide the best measurement accuracy.
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Precision Capacitance Meter
TH2638A
Changzhou Tonghui Electronic Co., Ltd.
TH2638 series is a new precision capacitance meter with higher test frequency. With small size and portable appearance, it is convenient for use on the shelves. With basic accuracy of ±0.07%, loss accuracy of 0.0005, test frequency up to 1MHz, 4.3-inch LCD screen, selectable Chinese-English operation interface, TH2638 series is easy to operate and provide fast and reliable test for ceramic capacitor production. Also, it can test all kinds of capacitors from low value to high value. The results of testing one capacitor for several times are quite stable and accurate, even for lower value capacitors. The tester is compatible with SCPI command set, and configured with manipulator and scanner interface, the scanner interface can scan the open/short/ load error calibration in each channel, 256 channels at most. In low frequency, there is signal level compensation function. When the impedance is very small, the internal resistance in signal source and test cable will cause the voltage on terminal of DUT lower than the set range, then this function will adjust the level to the set range.
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Hand-In Type Electromagnetic Anechoic Box (Shield Box)
MY3720
Suitable for weak electric field resistance test, out-of-service test or digital forensics for smart phone, tablet terminal or mobile PC ! !DUT can be operated directly with bare hands while placing it in the box and looking at the inside from the shield window.
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Milli-OHM Meter
MR-30
*Double LCD Display*300,000 counts resolution*Measurement Range: 30mΩ~3MΩ*0.05% accuracy*20 Standard User setting memory sets*Sorting function and Relative percentage function*PASS/FAIL test result alarm*Computer Remote Manual and Auto Scan function*Manual and Auto Channel select*Sampling Rate: 30 sample/sec*High Resolution Temperature compensation and measurement*DUT Four-wire method*USB interface
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Phase Noise Analyzers
Holzworth Instrumentation, Inc.
Holzworth's Real Time Phase Noise Analyzers are each designed to provide data faster than any other system, while maintaining data accuracy and repeatibilty. There is no guess work as to whether results are valid to the DUT or if there are unwanted variations or contributions coming from the measurement system itself.
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Pulse Pattern Generator, 3.35 GHz, single channel
81133A
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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HIGH FREQUENCY DC BIAS
6565 SERIES
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Noise Receiver Modules And Noise Switching Modules
MT7553 Series
Noise Parameters are the non-50Ω extensions of Noise Figure, and are an important modeling and model validation tool to understand how a device-undertest’s performance changes as a function of source impedance. Noise Parameter measurements are typically performedusing a Vector Network Analyzer (VNA) to measure the S-Parameters of the DUT, and a Noise Analyzer (either Noise Figure Analyzer NFA or Spectrum Analyzer SA) to measure the noise power of the DUT. Noise parameters are calculated from a combination of knownsource impedances, S-parameters and noise powers.
