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Product
Bit Error Rate Tester
100G NRZ BERT
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The C-BERT 2810-4 is a complete bit error rate tester dedicated for 100G Ethernet applications. The four independent channels enable an actual operating environment with traffic on all lanes. The simultaneous testing of 4 channels is much faster than testing each channel individually saving time and money. The BERT eye scan reveals low-probability events and shows the true performance of the DUT to aid troubleshooting. The high RF port density eliminates long cable length which degrades the signal at 25 Gb/s. The OS independent GUI is easy to install and enable remote control from everywhere. The complete and compact C-BERT is a powerful and cost efficient test solution for 100G Ethernet.C-BERT MI-PE2810-4 Product sheet_rev05.
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Product
iSocketTM - High Power DUT - HTOL System
8000 Series
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iSocketTM Technology Open Rack-Room Temperature (RTBI) non chamber design High Power DUT Capability – 0-65W Individual DUT Temperature Measurement & Control DUT Monitoring with Auto shut down 28 BIB capacity – 14 trays 2 BIB’s per tray Multi DUT type HTOL Testing Remote System & HTOL Monitoring – Customer access via VPN
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Product
PXIe-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
780587-15
Signal Module
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Product
Multisite Testing – Rail System
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Mechanical system allowing the flexibility of multi-site testing with adjustable site to site spacing The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without effecting the thermal equilibrium of the system.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
Signal Conditioning With SLSC
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Switch Load and Signal Conditioning standardizes the "last mile" between the measuring device and the device under test (DUT) in hardware and software. SLSC is a modular extension for data acquisition products such as PXI and CompactRIO.
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Product
LED Burn-In Test
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Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Milli-OHM Meter
MR-30
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*Double LCD Display*300,000 counts resolution*Measurement Range: 30mΩ~3MΩ*0.05% accuracy*20 Standard User setting memory sets*Sorting function and Relative percentage function*PASS/FAIL test result alarm*Computer Remote Manual and Auto Scan function*Manual and Auto Channel select*Sampling Rate: 30 sample/sec*High Resolution Temperature compensation and measurement*DUT Four-wire method*USB interface
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
High Flexibility VNA Cables
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Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required. The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.855mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.
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Product
Transformer Turns Ratio Meter
TTRM 102
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SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage selection offers high accuracy in measurement.Both the instrument have in-built TFT display with touch screen and thermal printer. The user friendly, simple instrument makes the testing more easy. With the touch keypad it is possible to enter required DUT information.The ratio results are displayed with % error. Internal non-volatile memory gives the provision of storing test results.Further data can be downloaded to PC or copied to memory stick through USB port provided.
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Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
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High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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Product
Spring Probes
Spring Probe
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Product
Efficient All-In-One Test Solution for Low-Cost IoT Devices
KT RFCT 2400
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The low price point creates a cost effective means for testing wireless communication units, while generating a favorable cost to performance ratio.The calibrated RF test system has a small footprint, integrating seamlessly into test system infrastructures via a single Ethernet connection. GPIOs control the DUT and peripherals. The test system enables communication interfaces like SPI, I2C, UART and CAN. Simple Go/No-Go tests can be performed in parallel. The KT-RFCT 2400A features a 70 MHz to 6 GHz frequency range and includes non-signaling and signaling connections. Bluetooth signaling standards are supported up to 4.1 as well as BT-LE. WIFI signaling standards supported are a, b, g, n and ac.The KT-RFCT 2400A is the perfect test system for a wide range of applications, such as Bluetooth, Infotainment, Keyless Entry, Tire Pressure Measurement, GPS and WIFI.
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Product
Solar Array Simulator
G5.SAS
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The G5.SAS series are unidirectional sources. It was developed specifically for testing inverters and simulating solar arrays and is suitable for use in laboratories and on test benches. The modular and finely graded G5.SAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies feature especially low capacitance values in the output filter stage and switchable earth leakage resistors for adaptation to the insulation measurement of the DUT.
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Product
Network Analyzer Cables
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specialized, high-performance RF coaxial cables used to connect a Vector Network Analyzer to a Device Under Test (DUT).
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Dial Strain Gauge
DRK8093
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Shandong Drick Instruments Co., Ltd.
This stress (birefringence) sources are due to uneven cooling or external causes such as mechanical action, which directly affect the optical glass, glass products, quality transparent plastic products. Therefore, stress control is optical glass, glass products, plastic products, such as transparency in the production process extremely important part. The strain gauge can be qualitatively or quantitatively by observing stress to identify products (DUT) quality, are widely used in optical glass, glass, transparent plastics industry for fast, a lot of testing. In fact, it can not be solved by math the complex problems.
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Product
Scanner Box for STW Series
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The aim of these scanner boxes is to allow multiple DUTs to be tested either concurrently or in sequence using the STW-9900/9800 safety testers. The scanner boxes are particularly well suited for multi-point safety testing as well for volume testing on factory floors.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Adjustable Multisite Rail System™
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The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without affecting the thermal equilibrium of the system.
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Product
Test Connector Components
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Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Vibration Unit Tester
BK2020B
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We developed the BK2020B as an upgrade to our BK2020 to test the electrical specifications (RPM, current, drop pulse, start up voltage) of your cylindrical or coin type vibration units. You can also test vibration level, noise, isolation resistance, and the DC resistance. The DUT power supply and all measurement components are self contained, so external devices aren't needed and the tester uses DSP, making it capable of fast, highly accurate and reliable measurements. The BK2020B is very versatile. It can be set up as a stand alone machine, or used with a PC and software for access to more information, and to save the data for analysis. Either version is great on the product line but you may also use it for QA, QC and development.
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Product
Stator Testing System for EV Motor
EVT531
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Shanghai Dean Electrical Co., Ltd
To meet the standard test projects requirement of the international companiesTo control and analysis the programs will reduce the human careless and misjudgmentEasy to edit environment and easy to learnIt can test multiple sets of DUTs simultaneouslyWhen there are several DUTs are tested, it could identify the undesirable sets individuallyThe Impulse/Surge with waveform comparison is a non-destructive analysisPolarity testMaximum saved files will be up to 100 setsIt provides the password functionSpeeding test could save time and improve efficiencyChinese and English pages can be arbitrarily switched
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Product
Switch Cables
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Connect to the PXI-2585 PXI Multiplexer Switch Module or PXI-2586 PXI Relay Module. You can use this cable to facilitate signal routing between instruments and devices-under-test (DUT).
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Product
AC Ground Bond Tester
446
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Our 446 model is a 4-in-1 tester with AC Hipot, DC Hipot, Insulation Resistance, and Ground Bond capabilities. This tester features a simple design and easy-to-use interface, reducing setup time and increasing production-line throughput for your application. The 446 is equipped with multiple memories and an optional USB port for remote BUS communication so you can quickly perform tests on a variety of DUTs from the front panel or with a PC. Add to user safety by equipping your tester with Personal Protective Equipment (PPE) via the built-in safety interlock.
