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Power Supply, 100 V, 50 A, 5000 W
N8759A
The Keysight N8759A power supply is a single output power supply in a small 2U package that offers essential features to fit your budget. The N8759A power cable offers flexible AC input options, analog / resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage.
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Digital Step Attenuators
Ranatec’s digital step attenuators covers all mobile frequency bands and gives a calibrated attenuation range of more than 90 dB in steps of 0.25 dB. All Ranatec digital attenuators are built as modules and offers both serial and parallel control logic.
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Power Supply, 80 V, 65 A, 5,200 W
N8758A
Keysight basic DC power supplies offer essential features for a tight budget. The Keysight N8758A is an 80 V, 65 A, 5,200 W, single-output power supply in a small 2U package. It offers flexible AC input options, analog / resistance control of output voltage and current, and parallel and series connection of multiple supplies to achieve more output current or voltage.
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Validation Testers
M Series
The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
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Real-Time Clock (RTC) ICs
ST offers a wide portfolio of real-time clock (RTC) ICs with parallel or serial interface, including ultra-low-power devices and the world’s smallest package with embedded crystal. Our devices offer many value-added features such as supervisory functions that include alarm, battery switchover, and reset as well as special features with time stamp, anti-tamper for secure applications and an integrated audio section.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Antenna Test Chamber for Automotive Radar
ATS1500C
The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Semiconductor
Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
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Integrating Spheres
Integrating spheres are used especially for measuring divergent light sources such as LEDs. The light is introduced through the input port, then reflected many times by the highly reflective interior of the sphere until it illuminates the inner surface uniformly. A detector samples a small fraction of this light to measure the total power input. Ophir integrating spheres have a highly reflective diffuse white coating for measurements independent of beam size, position and divergence. There are several sphere sizes, apertures and wavelength regions available. The large IS6 series has 2 configurations for measuring divergent or parallel beams.
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High-Throughput Film Frame Handler
MCT FH-1200
FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).
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Parallel Seam Sealers
It is an equipment to hermetically seal the packages, such as the crystal and SAW devices, optical devices, sensors, MEMS, etc., by seam welding. Hermetic sealing can be accomplished in both N2 and vacuum environment. Furthermore, we are offering a variety of products for research and development and production applications.
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Closed-Loop Servohydraulic Test Bench Control System
Closed-loop servohydraulic test bench control system is based on digital devices of ZETSENSOR series with CAN interface. This system has fast response characteristics, high precision, and compact dimensions. The system enables comprehensive control of the servo drive in automated mode in compliance with the set test parameters such as pressure (force), displacement, along with the parallel control of other system parameters such as temperature, pressure, filter plugging, oil pressure, etc.
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Analog Backplanes
MSXB 030
Analog Backplanes provide expansion slots to accommodate compatible analog external boards. Analog Backplanes are passive, and connect all signals in each of the expansion slots in parallel. All expansion slots are identical
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FLIM Upgrades for Olympus
FV1000
*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excitation by bh ps Diode Lasers*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Detection Wavelength Range from 360 nm to 900 nm*Excitation by Ti:Sa Laser, OPO, or by bh ps Diode Lasers*Systems for Multiphoton FLIM and Confocal FLIM*Systems are Modular: More FLIM Channels can be Added
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Resister Blackjack
Resistor blackjack is like regular blackjack but better! Your goal is to assemble a single resistance from several resistors that is as close to 21k while not being over.Unlike regular blackjack, the resistors can be combined in series and in parallel, giving the game a whole new dimension. Plus, resistors have tolerances so achieving a mathematical 21k doesn't guarantee a win.
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Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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HPERC VITA 75 COTS Computers
Sealed Extreme Rugged COTS computing platform in a tiny VITA 75 footprint, ideal for ground, air, and sea deployments. Based on Intel® Core™ i7 or Xeon® processors and optional GPGPU parallel processing engine. Easily configured application-ready platform for fast integration of custom rugged embedded applications. A wide array of fast IO provided on uniquely-keyed MIL-DTL-38999 connectors.
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DUAL-IN-LINE (DIL/DIP) SERIES 97 - 98
Pickering’s dual-in-line (DIP/DIL) reed relays are through-hole electronic components that enclose two parallel rows of connection pins on the standard DIL spacing with switching capability up to 2 Amps, 50 Watts. The reed relays come with 5, 12 or 24 V coils with or without internal diode. Many standard build options are available on request, or we can fully customise the parts to suit your exact specifications.It is often possible to replace TTL ICs with their equivalent CMOS ones and replace standard DIL relays with Pickering Series 98, to obtain the benefits of CMOS without any circuit or PCB redesign.
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Multi-Axis Laser Interferometer
The award-winning XD Laser is a multidimensional laser measurement system that simultaneously measures all 21 degrees of freedom including linear, angular, straightness and roll errors for rapid machine tool error assessment. Measurements Include:- Rotational accuracy- Geometric error- Angular error- Flatness- Squareness- Parallelism
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Testing of Compressors and Compressors
Automatic production test bench for semi-hermetic refrigeration compressors on 2 parallel assembly lines with 3 test stations each and central database.
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Capacitors - Binary Chip
Macom Technology Solutions Holdings Inc.
MACOM’s BOO and BSP Series Capacitors are designed to facilitate bread-boarding or to use where a trimming capability is required. These devices feature the same dielectric layer and bonding surfaces as our 9000 and 9100 Series chip capacitors. By connecting the pads in parallel, the capacitance values are additive, so many combinations are possible.
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TTEEnd System A664 Pro
The TTEEnd System A664 Pro board brings the full power of Deterministic Ethernet communication technology to aerospace certifiable hardware. The TTEEnd System A664 Pro card supports three standard traffic classes: Ethernet (IEEE 802.3), rate-constrained (ARINC 664 part 7) and time-triggered (SAE AS6802) traffic in parallel on one physical infrastructure. It offers redundancy management, as well as an IP/UDP profiled communication layer fully implemented in hardware. The card is designed for safety-critical applications and fully complies with DAL A levels of RTCA DO-254 and DO-178C.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Low cost Device Programmer for PC/Parallel
ChipMax
ChipMax is a cost-effective, high quality industrial-grade device programmer with parallel-port interface that is suitable for most programming needs without using any extraneous personal family modules.
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Electronic Loads
Series EL
The EL Series is a line of modular aircooled, DC electronic loads used to test power sources such as batteries, power supplies, generators, chargers, fuel cells, etc.Power ratings start at 1KW; standard models have maximum test capabilities of 50, 200, 400 and 600 volts. High current and power operation are achieved via parallel connection in a master/slave configuration. Individual modules are capable of up to 5KW and 800 amperes.
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Universal Pylon Tester
MS 1121
Portable test equipment to check the electrical functionalities of pylons by simulating various store types in aircraft. This system is able to simulate the functionalities of different PIBs (IB/MB/CF, OB & Laser). The system provides facility to test two Pylons in parallel. The tester provides aircraft specific AC &DC voltages and facility to inject discrete inputs for checking output(s) viz firing voltages, fusing voltages. The system provides four channels of RS422 and Two channels of 1553B communication. Portable unit with caster wheels with all required hardware, power supplies, instruments, connectors and laptop housed in it.
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Pulse Modulator IM-20
*Wide Frequency Range: 10 MHz...20 GHz*High Pause Power Mitigation: ≥ 70 dB*Signal Radio Impulse < 10 ns*Parallel Data Input*Input/Output Modulator Ports
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ETX
The ETX modules (114 x 95 mm) are very compact and highly integrated SBCs that integrate core CPU and memory functionality, standard personal computer (PC) peripheral function such as graphics, USB, serial and parallel ports, keyboard/mouse, Ethernet, IDE, PCI, and ISA buses. All ETX modules have a standardized form factor and a standardized connector layout.
