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Power Supply, 300V, 17A, 5100W
N8761A
The Keysight N8761A is a 300V, 17A, 5100W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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SATA (Serial ATA)
Serial ATA (SATA) is a data transfer technology designed to move data to and from storage devices such as disk drives, ATAPI drives, host bus adapters (HBA), and port multipliers. SATA is a serialized enhancement and replacement to parallel IDE. Since SATA ratification in 2003 and its move to 6Gbps in 2008, Teledyne LeCroy has continued to support and innovate with its industry leading protocol analysis and traffic generation capabilities.
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Camera Link Translators
CLT-303
The CLT-303R and CLT-303L Camera Link Translators convert RS-422 & LVDS to Camera Link, enabling the use of cameras incorporating traditional RS-422 and LVDS parallel digital interfaces with Camera Link frame grabbers. The “R” and “L” versions support RS-422 and LVDS cameras, respectively. These Camera Link converters are extremely flexible and can convert a wide range of cameras from parallel digital output to Camera Link base configuration with up-to 24-bit data.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Load Cell & Microvolt Meter
A high-sensitivity 5-digit meter for use with load cells, strain gauges and microvolt input signals where high accuracy and stability are required. Load cell operation allows 4- or 6-wire hookup and display in engineering units, such as lbs, kg or psi. Built-in excitation for up to four 350-ohm load cells in parallel.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Full Wafer Contact Test System
Fox 1
Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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GPIB to Parallel Printer Interface
Model 4892B
* Adds a GPIB Interface to Printers with Centronics or IEEE-1284 parallel interfaces. See the compatible printer list. * Replaces obsolete printers and plotters with a current HPGL/PCL5 printer.* Prints and Plots from most Analyzers. * Large 256 kbyte buffer and high speed GPIB interface off-loads the instrument and reduces printing time.* No program changes required.* Rack mountable in 1 U high rack mount kit.* Includes universal VAC Power Adapter and printer cable.
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Confocal FLIM for Macroscopic Objects
DCS-120 Macro
*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Phasing Sticks
High voltage phasing rods enable phase comparisons to be made at the point of paralleling two circuits without the interposition of voltage transformers or secondary wiring circuits.
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PXI Resistor Module Quad 8 Bit With 16xSPDT Relays
40-291-121
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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6U VPX double-GPU Image & Video Processing Board
VP69701
LinkedHope Intelligent Technologies Co.,Ltd.
Based on AMD Radeon™ E8860, VP69701 is a VPX double-GPU image & video processing board mainly designed for applications of embedded image & video processing and GPGPU.On VP69701, there are 4 independent display outputs routed to front and 2 GPU. Each GPU of VP69701 is equipped with 2GB GDDR5 video memory, 768/48 GFLOPS single/double precision peak processing ability and 640 shader processing units. VP69701 is highly suitable for HD output (1920x1080), 4K output (3840x2160), high-performance parallel computing and other applications and fields.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Virtual Platform Simulation Acceleration
QuantumLeap
QuantumLeap is a parallel simulation performance accelerator that leverages a new synchronization algorithm to provide the fastest virtual platform software execution speed available. The execution performance of this new technology has been measured on average at 15 times faster than the nearest commercial solution using standard benchmarks.
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Digital Control Step Attenuator
Digital control attenuators with TTL parallel control offering fast switching speed and high attenuation accuracy
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Programmable DC Power Supply
KM-LPP-3030T
Kusam Electrical Industries Limited
KM-LPP-3030T provides a higher stability in terms of traditional Programmable DC Power Supply. KM-LPP-3030T, linear programmable DC Power Supply support USB PC-Link and two completely separate power outputs. With the various characteristics, KM-LPP-3030T is the best choice of power supplies for engineers. With the functions of the power supply of KM-LPP-3030T, it provides two completely separate power output which is able for series or parallel connection; other than the common power supplies on the market of positive / ground / negative output. In addition, KM-LPP-3030T supports low-voltage digital circuits, also it is able to switch voltage among 1.8V~5.0V. With its characteristics of stability and high - speed reaction, KM-LPP-3030T provides high quality at a very economical price.
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Analog/Linear Tester
Amoeba 4200
4200 is capable of running multiple test sites independently with a parallel efficiency of up to 85% for quad-site and octal-site testing.It comes with test development and production software suite, which makes the transition from test development and bench characterization to production seamlessly.
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Benchtop Unit for Universal Coating Thickness Measurement
FISCHERSCOPE MMS PC2
Multifaceted for coating thickness measurement and material testing. Universal multi-measuring system for parallel coating thickness measurement and material testing with up to eight measuring modules.
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1.3 MP Custom Lens NIR Camera Module (Monochrome)
e-CAM10_CU0130_MOD
The e-CAM10_CU0130_MOD is a 1.3 MP NIR Camera module (Monochrome) based on the Aptina / ON Semiconductor AR0130CS CMOS image sensor with S-mount lens holder attached to it. The AR0130 is a 1/3” Optical Form factor, Electronic Rolling Shutter CMOS sensor with enhanced sensitivity in the Near Infrared region and superior low light performance. The e-CAM10_CU0130_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM10_CU0130_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Low-Temperature Impact Device
DWC-1
This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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Signal Splitter
The Dynamic Signal Buffered Splitter protects sound and vibration sensor acquisitions from the unwanted effects of a parallel troubleshooting or diagnostic instruments. G Systems Dynamic Signal Buffered Splitter provides buffered and unbuffered outputs connected to the same signal input. Up to 16 sensors, typically accelerometers, proximity probes, microphones, and pressure transducers, may be connected to the 16 signal inputs.
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PMC-BiFIFO
The parallel Input and Output channels are highly programmable and fully independent. The standard interface offers Data, Clock and Strobe. The 32 RS485 channels are programmable as input or output allowing for a variety of implementations. The programmable output rates and RS422/485 compatability will interface to a multitude of systems.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Multiplexers (MUX)
WDM
It is highly desirable to reduce the number of cables required to communicate between spaces on Navy ships due to increased weight, cost and maintenance concerns. To reduce weight and expense, copper-based NTDS parallel and serial type cables can be converted to fiber optic and multiplexed using Wavelength Division Multiplexing (WDM) technology. WDM technology allows for multiple fiber optic wavelengths to be combined in a single fiber and then separated back to individual fibers at the distant end. Using Coarse WDM (CWDM) which utilizes wavelengths 20nm apart ranging from 1271 nm to 1611 nm, provides for up to 18 optical wavelengths to be combined into a single fiber. Optionally Dense WDM (DWDM) can be used allowing for up to 160 optical wavelengths.
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ESD LCD SURFACE RESISTIVITY METER (WITH 1 PAIR OF 5 POUND ELECTRODES)
The ESD LCD SURFACE RESISTIVITY METER provides everything necessary to test work surfaces using the procedure outlined in the EOS/ESD-S4.1 standard. This test kit makes testing surface resistance easy – simply place the weights attach the cables, switch to the correct voltage and press the button to read resistance directly on the meter. The meter incorporates parallel probes on the bottom of the unit which allows the user to make surface resistivity measurements. The parallel probes allow for quick and easy testing of a variety of surfaces and materials, without the use of the five pound electrodes
